{"id":6191,"date":"2020-05-12T15:59:48","date_gmt":"2020-05-12T15:59:48","guid":{"rendered":"https:\/\/staging.asminternational.org\/edfas\/asylum-research-scanning-capacitance-microscopy-accessory-maps-dopant-concentration\/"},"modified":"2023-02-23T21:30:20","modified_gmt":"2023-02-23T21:30:20","slug":"asylum-research-scanning-capacitance-microscopy-accessory-maps-dopant-concentration","status":"publish","type":"post","link":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/40487295\/NEWS\/","title":{"rendered":"Asylum Research scanning capacitance microscopy accessory maps dopant amounts"},"content":{"rendered":"<p style=\"margin-bottom:.0001pt\"><span style=\"line-height:normal\">Oxford Instruments Asylum Research, Santa Barbara, Calif., has released a new scanning capacitance microscopy (SCM) accessory for its Cypher and Jupiter XR atomic force microscopes. <\/span><\/p>\n<p style=\"margin-bottom:.0001pt\">&nbsp;<\/p>\n<p style=\"margin-bottom:.0001pt\"><span style=\"line-height:normal\">SCM is a powerful imaging technique that can map electric charge carrier locations, types (p-type vs. n-type), and relative dopant concentration in semiconductors and other samples. The newly designed Asylum Research SCM module offers significantly higher performance and capability than those that have been available for the last 20+ years. <\/span><\/p>\n<p style=\"margin-bottom:.0001pt\">&nbsp;<\/p>\n<p style=\"margin-bottom:.0001pt\"><span style=\"line-height:normal\">Unlike those previous designs, it can measure not only differential capacitance (dC\/dV), but also capacitance, which is linearly correlated with dopant levels. It can also image &gt;20\u00d7 faster, producing high-quality datasets in as little as ten seconds. Higher sensitivity improves spatial resolution and allows it to be used on a wider range of materials, including metals, insulators, and materials that do not form a native oxide layer.<\/span><\/p>\n<p style=\"margin-bottom:.0001pt\">&nbsp;<\/p>\n<p style=\"margin-bottom:.0001pt\"><span style=\"line-height:normal\">\u201cScanning capacitance microscopy has been something of misnomer until now because conventional SCM can only measure differential capacitance (dC\/dV) and not actual capacitance,\u201d commented Dominic Paszkeicz, Director of Product at Oxford Instruments Asylum Research. \u201cAsylum\u2019s new SCM module changes that, directly mapping capacitance and making it simpler for users to interpret the results.\u201d<\/span><\/p>\n<p style=\"margin-bottom:.0001pt\">&nbsp;<\/p>\n<p style=\"margin-bottom:.0001pt\"><span style=\"line-height:normal\">Asylum Research AFMs are widely used across many different academic research and industrial applications. The Cypher AFM product line features the world\u2019s fastest and highest resolution small-sample AFMs. The Jupiter XR is a large-sample AFM that can accommodate samples up to 200 millimeters in diameter and scan sizes up to 100 microns, while still delivering ultra-high resolution and higher throughput, with typical images requiring less than one minute to acquire.<\/span><\/p>\n<p style=\"margin-bottom:.0001pt\">&nbsp;<\/p>\n<p><a href=\"https:\/\/afm.oxinst.com\/SCM\">https:\/\/afm.oxinst.com\/SC<\/a><\/p>\n","protected":false},"excerpt":{"rendered":"<p>Oxford Instruments Asylum Research, Santa Barbara, Calif., has released a new scanning capacitance microscopy (SCM) accessory for its Cypher and Jupiter XR atomic force microscopes.<\/p>\n","protected":false},"author":63103,"featured_media":0,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[434,438,435,436,1],"tags":[],"class_list":["post-6191","post","type-post","status-publish","format-standard","hentry","category-electronics","category-nanotechnology","category-news","category-news-articles","category-uncategorized"],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.9 - 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