{"id":6320,"date":"2018-05-24T07:21:07","date_gmt":"2018-05-24T07:21:07","guid":{"rendered":"https:\/\/staging.asminternational.org\/edfas\/zeiss-zen-connect-software-for-microscopes-enables-imaging-all-dimensions-of-a-sample\/"},"modified":"2023-02-23T21:31:22","modified_gmt":"2023-02-23T21:31:22","slug":"zeiss-zen-connect-software-for-microscopes-enables-imaging-all-dimensions-of-a-sample","status":"publish","type":"post","link":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/34524430\/NEWS\/","title":{"rendered":"Zeiss Zen Connect software for microscopes enables imaging all dimensions of a sample"},"content":{"rendered":"

Carl Zeiss, Germany, introduces Zen Connect, new software modules with enhanced imaging technology that is especially useful for structural analysis. The proven Zeiss Zen software combines numerous functions for day-to-day work with microscopes. <\/span><\/span>The Zeiss Zen Connect module enhances research by introducing three new features: <\/span><\/span>Intuitive data management, simplified sample workflows, and unlimited navigation<\/span><\/span><\/p>\n

The software ensures that users focus on the data rather than on the acquisition method. They initiate a workflow with any microscope, analyze a full sample on a large scale, and identify the specific areas of interest with the automatic overlay and relocation algorithm. Moreover, it uniquely enables its users to analyze data in a wider context, connecting large field of view images with the highest resolution details. They benefit from project based data storage and effortless image labeling which enables better control over the data structure in complex experiment set-ups.<\/span><\/span><\/p>\n

Zeiss Zen Connect is available for the company\u2019s full range of optical, confocal, X-ray, electron, and ion microscopes. It is especially recommended for correlation of Zeiss LSM 800 and Zeiss GeminiSEM; but is also compatible with most light and electron microscopes from Zeiss. It is offered on a 60-day free trial basis, which can be obtained online from the Zeiss Microscopy webpage. <\/span><\/span><\/p>\n

http:\/\/blogs.zeiss.com\/microscopy\/news\/en\/zeiss-zen-connect\/<\/a> <\/span><\/span><\/p>\n","protected":false},"excerpt":{"rendered":"

Carl Zeiss, Germany, introduces Zen Connect, new software modules with enhanced imaging technology that is especially useful for structural analysis.<\/p>\n","protected":false},"author":63103,"featured_media":0,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[435,436,1],"tags":[],"class_list":["post-6320","post","type-post","status-publish","format-standard","hentry","category-news","category-news-articles","category-uncategorized"],"yoast_head":"\nZeiss Zen Connect software for microscopes enables imaging all dimensions of a sample - Electronic Device Failure Analysis Society<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/34524430\/NEWS\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Zeiss Zen Connect software for microscopes enables imaging all dimensions of a sample - 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