{"id":7340,"date":"2023-10-20T08:53:03","date_gmt":"2023-10-20T03:23:03","guid":{"rendered":"https:\/\/staging.asminternational.org\/edfas\/eles-and-proteantecs-partner-to-enhance-reliability-testing-with-deep-data-analytics\/"},"modified":"2023-10-20T03:23:11","modified_gmt":"2023-10-20T03:23:11","slug":"eles-and-proteantecs-partner-to-enhance-reliability-testing-with-deep-data-analytics","status":"publish","type":"post","link":"https:\/\/www.asminternational.org\/edfas\/eles-and-proteantecs-partner-to-enhance-reliability-testing-with-deep-data-analytics\/","title":{"rendered":"ELES and proteanTecs partner to enhance reliability testing with deep data analytics"},"content":{"rendered":"<p>ProteanTecs, Israel, a global leader of deep data analytics for advanced electronics, and ELES, Italy, a worldwide provider of semiconductor device reliability testing solutions, announced their partnership for safety and mission-critical applications. The collaboration combines proteanTecs\u2019 Health and Performance Monitoring solutions with ELES\u2019 Design for Reliability methodology and advanced reliability test platforms.<\/p>\n<p>Reliability testing procedures are based on stress iterations, but are mostly limited to pass\/fail conclusions and critical effects can be missed. Modern mission-critical applications, such as automotive and cloud computing, require going beyond traditional IC testing methods to assure lifetime reliability, resilience and safety.<\/p>\n<p>The proteanTecs and ELES collaboration enables an innovative approach that adds parametric measurements during the stress test in order to accurately and precisely monitor the real degradation effects. Additional applications include smart selection of the test material, dynamic stress level calibration to match the required mission profile, early identification of outliers, and the ability to quickly root cause once a failure is observed. Customers gain improved confidence in their reliability and mission profiles, saving significant time and cost.<\/p>\n<p>\u201cOur strategic cooperation with proteanTecs enhances our Design for Reliability Test process, by enabling a smarter, more effective qualification flow that addresses the increasing performance and reliability needs of advanced electronics,\u201d said Antonio Zaffarami, president of ELES. \u201cELES\u2019 Reliability Embedded Test Engineering methodologies\u2014empowered by proteanTecs deep data analytics\u2014allows our clients to identify and remove device weaknesses and to manufacture more reliable devices, achieving higher production yields and shortening their time to market. Enter the era of manufacturing with zero scraps!\u201d<\/p>\n<p>\u201cIt is privilege to partner with ELES, a recognized leader in semiconductor reliability solutions, to enhance and innovate the device qualification and test domains for our joint customers,\u201d said Uzi Baruch, chief strategy officer at proteanTecs. \u201cBy providing parametric visibility based on chip telemetry, we offer Quality and Reliability engineers increased confidence, enabling both novel measurement techniques and predictability in reliability testing. Together, we look forward to taking the industry one step further towards seamless visibility.\u201d<\/p>\n<p>&nbsp;<\/p>\n<p>Image &#8211; <em>ELES and proteanTecs announce their partnership to enhance reliability testing with deep data analytics. Courtesy of: Business Wire.<\/em><\/p>\n<p>&nbsp;<\/p>\n<p>For more information:<\/p>\n<p>ELES S.p.A.<\/p>\n<p><a href=\"https:\/\/www.eles.com\/\">https:\/\/www.eles.com\/<\/a><\/p>\n<p>&nbsp;<\/p>\n<p>proteanTecs<\/p>\n<p><a href=\"http:\/\/www.proteanTecs.com\">www.proteanTecs.com<\/a><\/p>\n<p>&nbsp;<\/p>\n","protected":false},"excerpt":{"rendered":"<p>ProteanTecs, Israel, a global leader of deep data analytics for advanced electronics, and ELES, Italy, a worldwide provider of semiconductor device reliability testing solutions, announced their partnership for safety and mission-critical applications. <\/p>\n","protected":false},"author":63081,"featured_media":7341,"comment_status":"closed","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[434,501,435,436,488,469],"tags":[],"class_list":["post-7340","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-electronics","category-electronics-and-microelectronics","category-news","category-news-articles","category-process-and-quality-control","category-properties-and-performance"],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.9 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>ELES and proteanTecs partner to enhance reliability testing with deep data analytics - Electronic Device Failure Analysis Society<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.asminternational.org\/edfas\/eles-and-proteantecs-partner-to-enhance-reliability-testing-with-deep-data-analytics\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"ELES and proteanTecs partner to enhance reliability testing with deep data analytics - Electronic Device Failure Analysis Society\" \/>\n<meta property=\"og:description\" content=\"ProteanTecs, Israel, a global leader of deep data analytics for advanced electronics, and ELES, Italy, a worldwide provider of semiconductor device reliability testing solutions, announced their partnership for safety and mission-critical applications.\" \/>\n<meta property=\"og:url\" content=\"https:\/\/www.asminternational.org\/edfas\/eles-and-proteantecs-partner-to-enhance-reliability-testing-with-deep-data-analytics\/\" \/>\n<meta property=\"og:site_name\" content=\"Electronic Device Failure Analysis Society\" \/>\n<meta property=\"article:published_time\" content=\"2023-10-20T03:23:03+00:00\" \/>\n<meta property=\"article:modified_time\" content=\"2023-10-20T03:23:11+00:00\" \/>\n<meta property=\"og:image\" content=\"https:\/\/www.asminternational.org\/app\/uploads\/sites\/41\/2023\/10\/EDFAS__102623__ELES__250.jpg\" \/>\n\t<meta property=\"og:image:width\" content=\"250\" \/>\n\t<meta property=\"og:image:height\" content=\"131\" \/>\n\t<meta property=\"og:image:type\" content=\"image\/jpeg\" \/>\n<meta name=\"author\" content=\"Steven Gasparis\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"Written by\" \/>\n\t<meta name=\"twitter:data1\" content=\"Steven Gasparis\" \/>\n\t<meta name=\"twitter:label2\" content=\"Est. reading time\" \/>\n\t<meta name=\"twitter:data2\" content=\"2 minutes\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\\\/\\\/schema.org\",\"@graph\":[{\"@type\":\"Article\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/eles-and-proteantecs-partner-to-enhance-reliability-testing-with-deep-data-analytics\\\/#article\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/eles-and-proteantecs-partner-to-enhance-reliability-testing-with-deep-data-analytics\\\/\"},\"author\":{\"name\":\"Steven Gasparis\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#\\\/schema\\\/person\\\/bfe45c658c45c81940fb969dd76cf9d3\"},\"headline\":\"ELES and proteanTecs partner to enhance reliability testing with deep data analytics\",\"datePublished\":\"2023-10-20T03:23:03+00:00\",\"dateModified\":\"2023-10-20T03:23:11+00:00\",\"mainEntityOfPage\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/eles-and-proteantecs-partner-to-enhance-reliability-testing-with-deep-data-analytics\\\/\"},\"wordCount\":384,\"publisher\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#organization\"},\"image\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/eles-and-proteantecs-partner-to-enhance-reliability-testing-with-deep-data-analytics\\\/#primaryimage\"},\"thumbnailUrl\":\"https:\\\/\\\/www.asminternational.org\\\/app\\\/uploads\\\/sites\\\/41\\\/2023\\\/10\\\/EDFAS__102623__ELES__250.jpg\",\"articleSection\":[\"Electronics\",\"Electronics and Microelectronics\",\"news\",\"News Articles\",\"Process and Quality Control\",\"Properties and Performance\"],\"inLanguage\":\"en-US\"},{\"@type\":\"WebPage\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/eles-and-proteantecs-partner-to-enhance-reliability-testing-with-deep-data-analytics\\\/\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/eles-and-proteantecs-partner-to-enhance-reliability-testing-with-deep-data-analytics\\\/\",\"name\":\"ELES and proteanTecs partner to enhance reliability testing with deep data analytics - Electronic Device Failure Analysis Society\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#website\"},\"primaryImageOfPage\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/eles-and-proteantecs-partner-to-enhance-reliability-testing-with-deep-data-analytics\\\/#primaryimage\"},\"image\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/eles-and-proteantecs-partner-to-enhance-reliability-testing-with-deep-data-analytics\\\/#primaryimage\"},\"thumbnailUrl\":\"https:\\\/\\\/www.asminternational.org\\\/app\\\/uploads\\\/sites\\\/41\\\/2023\\\/10\\\/EDFAS__102623__ELES__250.jpg\",\"datePublished\":\"2023-10-20T03:23:03+00:00\",\"dateModified\":\"2023-10-20T03:23:11+00:00\",\"breadcrumb\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/eles-and-proteantecs-partner-to-enhance-reliability-testing-with-deep-data-analytics\\\/#breadcrumb\"},\"inLanguage\":\"en-US\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/eles-and-proteantecs-partner-to-enhance-reliability-testing-with-deep-data-analytics\\\/\"]}]},{\"@type\":\"ImageObject\",\"inLanguage\":\"en-US\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/eles-and-proteantecs-partner-to-enhance-reliability-testing-with-deep-data-analytics\\\/#primaryimage\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/app\\\/uploads\\\/sites\\\/41\\\/2023\\\/10\\\/EDFAS__102623__ELES__250.jpg\",\"contentUrl\":\"https:\\\/\\\/www.asminternational.org\\\/app\\\/uploads\\\/sites\\\/41\\\/2023\\\/10\\\/EDFAS__102623__ELES__250.jpg\",\"width\":250,\"height\":131},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/eles-and-proteantecs-partner-to-enhance-reliability-testing-with-deep-data-analytics\\\/#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Home\",\"item\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"ELES and proteanTecs partner to enhance reliability testing with deep data analytics\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#website\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/\",\"name\":\"Electronic Device Failure Analysis Society\",\"description\":\"Electronic Device Failure Analysis Society\",\"publisher\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#organization\"},\"potentialAction\":[{\"@type\":\"SearchAction\",\"target\":{\"@type\":\"EntryPoint\",\"urlTemplate\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/?s={search_term_string}\"},\"query-input\":{\"@type\":\"PropertyValueSpecification\",\"valueRequired\":true,\"valueName\":\"search_term_string\"}}],\"inLanguage\":\"en-US\"},{\"@type\":\"Organization\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#organization\",\"name\":\"Electronic Device Failure Analysis Society\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/\",\"logo\":{\"@type\":\"ImageObject\",\"inLanguage\":\"en-US\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#\\\/schema\\\/logo\\\/image\\\/\",\"url\":\"https:\\\/\\\/cdn-prd-main.asm-media.cloud\\\/uploads\\\/sites\\\/41\\\/2022\\\/10\\\/layout_set_logo.png\",\"contentUrl\":\"https:\\\/\\\/cdn-prd-main.asm-media.cloud\\\/uploads\\\/sites\\\/41\\\/2022\\\/10\\\/layout_set_logo.png\",\"width\":360,\"height\":95,\"caption\":\"Electronic Device Failure Analysis Society\"},\"image\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#\\\/schema\\\/logo\\\/image\\\/\"}},{\"@type\":\"Person\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#\\\/schema\\\/person\\\/bfe45c658c45c81940fb969dd76cf9d3\",\"name\":\"Steven Gasparis\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/author\\\/asteven\\\/\"}]}<\/script>\n<!-- \/ Yoast SEO plugin. -->","yoast_head_json":{"title":"ELES and proteanTecs partner to enhance reliability testing with deep data analytics - Electronic Device Failure Analysis Society","robots":{"index":"index","follow":"follow","max-snippet":"max-snippet:-1","max-image-preview":"max-image-preview:large","max-video-preview":"max-video-preview:-1"},"canonical":"https:\/\/www.asminternational.org\/edfas\/eles-and-proteantecs-partner-to-enhance-reliability-testing-with-deep-data-analytics\/","og_locale":"en_US","og_type":"article","og_title":"ELES and proteanTecs partner to enhance reliability testing with deep data analytics - Electronic Device Failure Analysis Society","og_description":"ProteanTecs, Israel, a global leader of deep data analytics for advanced electronics, and ELES, Italy, a worldwide provider of semiconductor device reliability testing solutions, announced their partnership for safety and mission-critical applications.","og_url":"https:\/\/www.asminternational.org\/edfas\/eles-and-proteantecs-partner-to-enhance-reliability-testing-with-deep-data-analytics\/","og_site_name":"Electronic Device Failure Analysis Society","article_published_time":"2023-10-20T03:23:03+00:00","article_modified_time":"2023-10-20T03:23:11+00:00","og_image":[{"width":250,"height":131,"url":"https:\/\/www.asminternational.org\/app\/uploads\/sites\/41\/2023\/10\/EDFAS__102623__ELES__250.jpg","type":"image\/jpeg"}],"author":"Steven Gasparis","twitter_card":"summary_large_image","twitter_misc":{"Written by":"Steven Gasparis","Est. reading time":"2 minutes"},"schema":{"@context":"https:\/\/schema.org","@graph":[{"@type":"Article","@id":"https:\/\/www.asminternational.org\/edfas\/eles-and-proteantecs-partner-to-enhance-reliability-testing-with-deep-data-analytics\/#article","isPartOf":{"@id":"https:\/\/www.asminternational.org\/edfas\/eles-and-proteantecs-partner-to-enhance-reliability-testing-with-deep-data-analytics\/"},"author":{"name":"Steven Gasparis","@id":"https:\/\/www.asminternational.org\/edfas\/#\/schema\/person\/bfe45c658c45c81940fb969dd76cf9d3"},"headline":"ELES and proteanTecs partner to enhance reliability testing with deep data analytics","datePublished":"2023-10-20T03:23:03+00:00","dateModified":"2023-10-20T03:23:11+00:00","mainEntityOfPage":{"@id":"https:\/\/www.asminternational.org\/edfas\/eles-and-proteantecs-partner-to-enhance-reliability-testing-with-deep-data-analytics\/"},"wordCount":384,"publisher":{"@id":"https:\/\/www.asminternational.org\/edfas\/#organization"},"image":{"@id":"https:\/\/www.asminternational.org\/edfas\/eles-and-proteantecs-partner-to-enhance-reliability-testing-with-deep-data-analytics\/#primaryimage"},"thumbnailUrl":"https:\/\/www.asminternational.org\/app\/uploads\/sites\/41\/2023\/10\/EDFAS__102623__ELES__250.jpg","articleSection":["Electronics","Electronics and Microelectronics","news","News Articles","Process and Quality Control","Properties and Performance"],"inLanguage":"en-US"},{"@type":"WebPage","@id":"https:\/\/www.asminternational.org\/edfas\/eles-and-proteantecs-partner-to-enhance-reliability-testing-with-deep-data-analytics\/","url":"https:\/\/www.asminternational.org\/edfas\/eles-and-proteantecs-partner-to-enhance-reliability-testing-with-deep-data-analytics\/","name":"ELES and proteanTecs partner to enhance reliability testing with deep data analytics - Electronic Device Failure Analysis Society","isPartOf":{"@id":"https:\/\/www.asminternational.org\/edfas\/#website"},"primaryImageOfPage":{"@id":"https:\/\/www.asminternational.org\/edfas\/eles-and-proteantecs-partner-to-enhance-reliability-testing-with-deep-data-analytics\/#primaryimage"},"image":{"@id":"https:\/\/www.asminternational.org\/edfas\/eles-and-proteantecs-partner-to-enhance-reliability-testing-with-deep-data-analytics\/#primaryimage"},"thumbnailUrl":"https:\/\/www.asminternational.org\/app\/uploads\/sites\/41\/2023\/10\/EDFAS__102623__ELES__250.jpg","datePublished":"2023-10-20T03:23:03+00:00","dateModified":"2023-10-20T03:23:11+00:00","breadcrumb":{"@id":"https:\/\/www.asminternational.org\/edfas\/eles-and-proteantecs-partner-to-enhance-reliability-testing-with-deep-data-analytics\/#breadcrumb"},"inLanguage":"en-US","potentialAction":[{"@type":"ReadAction","target":["https:\/\/www.asminternational.org\/edfas\/eles-and-proteantecs-partner-to-enhance-reliability-testing-with-deep-data-analytics\/"]}]},{"@type":"ImageObject","inLanguage":"en-US","@id":"https:\/\/www.asminternational.org\/edfas\/eles-and-proteantecs-partner-to-enhance-reliability-testing-with-deep-data-analytics\/#primaryimage","url":"https:\/\/www.asminternational.org\/app\/uploads\/sites\/41\/2023\/10\/EDFAS__102623__ELES__250.jpg","contentUrl":"https:\/\/www.asminternational.org\/app\/uploads\/sites\/41\/2023\/10\/EDFAS__102623__ELES__250.jpg","width":250,"height":131},{"@type":"BreadcrumbList","@id":"https:\/\/www.asminternational.org\/edfas\/eles-and-proteantecs-partner-to-enhance-reliability-testing-with-deep-data-analytics\/#breadcrumb","itemListElement":[{"@type":"ListItem","position":1,"name":"Home","item":"https:\/\/www.asminternational.org\/edfas\/"},{"@type":"ListItem","position":2,"name":"ELES and proteanTecs partner to enhance reliability testing with deep data analytics"}]},{"@type":"WebSite","@id":"https:\/\/www.asminternational.org\/edfas\/#website","url":"https:\/\/www.asminternational.org\/edfas\/","name":"Electronic Device Failure Analysis Society","description":"Electronic Device Failure Analysis Society","publisher":{"@id":"https:\/\/www.asminternational.org\/edfas\/#organization"},"potentialAction":[{"@type":"SearchAction","target":{"@type":"EntryPoint","urlTemplate":"https:\/\/www.asminternational.org\/edfas\/?s={search_term_string}"},"query-input":{"@type":"PropertyValueSpecification","valueRequired":true,"valueName":"search_term_string"}}],"inLanguage":"en-US"},{"@type":"Organization","@id":"https:\/\/www.asminternational.org\/edfas\/#organization","name":"Electronic Device Failure Analysis Society","url":"https:\/\/www.asminternational.org\/edfas\/","logo":{"@type":"ImageObject","inLanguage":"en-US","@id":"https:\/\/www.asminternational.org\/edfas\/#\/schema\/logo\/image\/","url":"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2022\/10\/layout_set_logo.png","contentUrl":"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2022\/10\/layout_set_logo.png","width":360,"height":95,"caption":"Electronic Device Failure Analysis Society"},"image":{"@id":"https:\/\/www.asminternational.org\/edfas\/#\/schema\/logo\/image\/"}},{"@type":"Person","@id":"https:\/\/www.asminternational.org\/edfas\/#\/schema\/person\/bfe45c658c45c81940fb969dd76cf9d3","name":"Steven Gasparis","url":"https:\/\/www.asminternational.org\/edfas\/author\/asteven\/"}]}},"acf":[],"_links":{"self":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/posts\/7340","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/users\/63081"}],"replies":[{"embeddable":true,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/comments?post=7340"}],"version-history":[{"count":0,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/posts\/7340\/revisions"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/media\/7341"}],"wp:attachment":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/media?parent=7340"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/categories?post=7340"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/tags?post=7340"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}