{"id":7921,"date":"2024-01-18T18:49:19","date_gmt":"2024-01-18T23:49:19","guid":{"rendered":"https:\/\/staging.asminternational.org\/edfas\/gatan-introduces-the-monarc-pro-t-system-for-cathodoluminescence-imaging\/"},"modified":"2024-01-18T23:50:22","modified_gmt":"2024-01-18T23:50:22","slug":"gatan-introduces-the-monarc-pro-t-system-for-cathodoluminescence-imaging","status":"publish","type":"post","link":"https:\/\/www.asminternational.org\/edfas\/gatan-introduces-the-monarc-pro-t-system-for-cathodoluminescence-imaging\/","title":{"rendered":"Gatan introduces the Monarc Pro T system for cathodoluminescence imaging"},"content":{"rendered":"<p>AMETEK Gatan, Inc., Pleasanton, Calif., a global leader focused on enhancing and extending the operation and productivity of electron microscopes, launched Monarc Pro T system that reveals structural, optical, and electric properties of materials at the nanosale by enabling optically-coupled experiments in transmission electron microscopes (TEM).<\/p>\n<p>Monarc Pro T supports cathodoluminescence (CL) specimen analysis within the TEM. Using a proprietary optical design for outstanding light collection, Monarc Pro T delivers the sharpest CL images and spectra for electron microscopy. This technology also facilitates the investigation of photoactivated catalytic reactions permitting in-situ illumination of a sample across a wide range of wavelengths in almost any TEM.<\/p>\n<p>\u201cFor many years, researchers have been unable to probe the active areas of many photonic devices due to the lack of a characterization technique that reveals optical properties at a spatial resolution smaller than the feature size,\u201d says Dr. David Stowe, senior product manager, Gatan. \u201cBy integrating a fiber-coupled optical system into a cryogenic TEM holder, we provide 10 \u2013 100x better spatial resolution that enables researchers to understand optical properties of the quantum world directly.\u201d<\/p>\n<p>\u201cWhile Gatan technologies, such as the K3 IS camera, have been key in driving the expansion of in-situ analysis, we now extend our reach by adding the ability to convert any TEM into an optically-coupled microscope to allow researchers to view the phase change of a specimen in real-time under illumination,\u201d commented Narayan Vishwanathan, vice president and business unit manager of AMETEK Electron Microscopy Technologies. \u201cExpanding researcher\u2019s capabilities for in-situ analysis capabilities cements Gatan\u2019s place at the forefront of in-situ microscopy and expands the addressed market to include photoactivated catalysis.\u201d<\/p>\n<p>&nbsp;<\/p>\n<p>For more information:<\/p>\n<p>AMETEK Gatan<\/p>\n<p><a href=\"https:\/\/www.gatan.com\/\">https:\/\/www.gatan.com\/<\/a><\/p>\n<p>&nbsp;<\/p>\n","protected":false},"excerpt":{"rendered":"<p>AMETEK Gatan, Inc., Pleasanton, Calif., a global leader focused on enhancing and extending the operation and productivity of electron microscopes, launched Monarc Pro T system that reveals structural, optical, and electric properties of materials at the nanosale by enabling optically-coupled experiments in transmission electron microscopes.<\/p>\n","protected":false},"author":63245,"featured_media":7924,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[510,437,435,436,470,455,608],"tags":[],"class_list":["post-7921","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-materials-characterization","category-materials-testing-and-evaluation","category-news","category-news-articles","category-testing-and-characterization","category-tests-and-diagnostics","category-transmission-electron-microscopy"],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.9 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>Gatan introduces the Monarc Pro T system for cathodoluminescence imaging - Electronic Device Failure Analysis Society<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.asminternational.org\/edfas\/gatan-introduces-the-monarc-pro-t-system-for-cathodoluminescence-imaging\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Gatan introduces the Monarc Pro T system for cathodoluminescence imaging - Electronic Device Failure Analysis Society\" \/>\n<meta property=\"og:description\" content=\"AMETEK Gatan, Inc., Pleasanton, Calif., a global leader focused on enhancing and extending the operation and productivity of electron microscopes, launched Monarc Pro T system that reveals structural, optical, and electric properties of materials at the nanosale by enabling optically-coupled experiments in transmission electron microscopes.\" \/>\n<meta property=\"og:url\" content=\"https:\/\/www.asminternational.org\/edfas\/gatan-introduces-the-monarc-pro-t-system-for-cathodoluminescence-imaging\/\" \/>\n<meta property=\"og:site_name\" content=\"Electronic Device Failure Analysis Society\" \/>\n<meta property=\"article:published_time\" content=\"2024-01-18T23:49:19+00:00\" \/>\n<meta property=\"article:modified_time\" content=\"2024-01-18T23:50:22+00:00\" \/>\n<meta property=\"og:image\" content=\"https:\/\/www.asminternational.org\/app\/uploads\/sites\/41\/2024\/01\/EDFAS__012524__Gatan__250-1.jpg\" \/>\n\t<meta property=\"og:image:width\" content=\"250\" \/>\n\t<meta property=\"og:image:height\" content=\"140\" \/>\n\t<meta property=\"og:image:type\" content=\"image\/jpeg\" \/>\n<meta name=\"author\" content=\"Debbie Sniderman\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"Written by\" \/>\n\t<meta name=\"twitter:data1\" content=\"Debbie Sniderman\" \/>\n\t<meta name=\"twitter:label2\" content=\"Est. reading time\" \/>\n\t<meta name=\"twitter:data2\" content=\"2 minutes\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\\\/\\\/schema.org\",\"@graph\":[{\"@type\":\"Article\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/gatan-introduces-the-monarc-pro-t-system-for-cathodoluminescence-imaging\\\/#article\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/gatan-introduces-the-monarc-pro-t-system-for-cathodoluminescence-imaging\\\/\"},\"author\":{\"name\":\"Debbie Sniderman\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#\\\/schema\\\/person\\\/135b2d8ac98a363d0bd9ec033a2904ad\"},\"headline\":\"Gatan introduces the Monarc Pro T system for cathodoluminescence imaging\",\"datePublished\":\"2024-01-18T23:49:19+00:00\",\"dateModified\":\"2024-01-18T23:50:22+00:00\",\"mainEntityOfPage\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/gatan-introduces-the-monarc-pro-t-system-for-cathodoluminescence-imaging\\\/\"},\"wordCount\":292,\"publisher\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#organization\"},\"image\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/gatan-introduces-the-monarc-pro-t-system-for-cathodoluminescence-imaging\\\/#primaryimage\"},\"thumbnailUrl\":\"https:\\\/\\\/cdn-prd-main.asm-media.cloud\\\/uploads\\\/sites\\\/41\\\/2024\\\/01\\\/EDFAS__012524__Gatan__250-1.jpg\",\"articleSection\":[\"materials characterization\",\"Materials Testing and Evaluation\",\"news\",\"News Articles\",\"Testing and Characterization\",\"Tests and Diagnostics\",\"Transmission Electron Microscopy\"],\"inLanguage\":\"en-US\"},{\"@type\":\"WebPage\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/gatan-introduces-the-monarc-pro-t-system-for-cathodoluminescence-imaging\\\/\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/gatan-introduces-the-monarc-pro-t-system-for-cathodoluminescence-imaging\\\/\",\"name\":\"Gatan introduces the Monarc Pro T system for cathodoluminescence imaging - Electronic Device Failure Analysis Society\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#website\"},\"primaryImageOfPage\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/gatan-introduces-the-monarc-pro-t-system-for-cathodoluminescence-imaging\\\/#primaryimage\"},\"image\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/gatan-introduces-the-monarc-pro-t-system-for-cathodoluminescence-imaging\\\/#primaryimage\"},\"thumbnailUrl\":\"https:\\\/\\\/cdn-prd-main.asm-media.cloud\\\/uploads\\\/sites\\\/41\\\/2024\\\/01\\\/EDFAS__012524__Gatan__250-1.jpg\",\"datePublished\":\"2024-01-18T23:49:19+00:00\",\"dateModified\":\"2024-01-18T23:50:22+00:00\",\"breadcrumb\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/gatan-introduces-the-monarc-pro-t-system-for-cathodoluminescence-imaging\\\/#breadcrumb\"},\"inLanguage\":\"en-US\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/gatan-introduces-the-monarc-pro-t-system-for-cathodoluminescence-imaging\\\/\"]}]},{\"@type\":\"ImageObject\",\"inLanguage\":\"en-US\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/gatan-introduces-the-monarc-pro-t-system-for-cathodoluminescence-imaging\\\/#primaryimage\",\"url\":\"https:\\\/\\\/cdn-prd-main.asm-media.cloud\\\/uploads\\\/sites\\\/41\\\/2024\\\/01\\\/EDFAS__012524__Gatan__250-1.jpg\",\"contentUrl\":\"https:\\\/\\\/cdn-prd-main.asm-media.cloud\\\/uploads\\\/sites\\\/41\\\/2024\\\/01\\\/EDFAS__012524__Gatan__250-1.jpg\",\"width\":250,\"height\":140},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/gatan-introduces-the-monarc-pro-t-system-for-cathodoluminescence-imaging\\\/#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Home\",\"item\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"Gatan introduces the Monarc Pro T system for cathodoluminescence imaging\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#website\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/\",\"name\":\"Electronic Device Failure Analysis Society\",\"description\":\"Electronic Device Failure Analysis Society\",\"publisher\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#organization\"},\"potentialAction\":[{\"@type\":\"SearchAction\",\"target\":{\"@type\":\"EntryPoint\",\"urlTemplate\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/?s={search_term_string}\"},\"query-input\":{\"@type\":\"PropertyValueSpecification\",\"valueRequired\":true,\"valueName\":\"search_term_string\"}}],\"inLanguage\":\"en-US\"},{\"@type\":\"Organization\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#organization\",\"name\":\"Electronic Device Failure Analysis Society\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/\",\"logo\":{\"@type\":\"ImageObject\",\"inLanguage\":\"en-US\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#\\\/schema\\\/logo\\\/image\\\/\",\"url\":\"https:\\\/\\\/cdn-prd-main.asm-media.cloud\\\/uploads\\\/sites\\\/41\\\/2022\\\/10\\\/layout_set_logo.png\",\"contentUrl\":\"https:\\\/\\\/cdn-prd-main.asm-media.cloud\\\/uploads\\\/sites\\\/41\\\/2022\\\/10\\\/layout_set_logo.png\",\"width\":360,\"height\":95,\"caption\":\"Electronic Device Failure Analysis Society\"},\"image\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#\\\/schema\\\/logo\\\/image\\\/\"}},{\"@type\":\"Person\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#\\\/schema\\\/person\\\/135b2d8ac98a363d0bd9ec033a2904ad\",\"name\":\"Debbie Sniderman\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/author\\\/dsniderman\\\/\"}]}<\/script>\n<!-- \/ Yoast SEO plugin. -->","yoast_head_json":{"title":"Gatan introduces the Monarc Pro T system for cathodoluminescence imaging - Electronic Device Failure Analysis Society","robots":{"index":"index","follow":"follow","max-snippet":"max-snippet:-1","max-image-preview":"max-image-preview:large","max-video-preview":"max-video-preview:-1"},"canonical":"https:\/\/www.asminternational.org\/edfas\/gatan-introduces-the-monarc-pro-t-system-for-cathodoluminescence-imaging\/","og_locale":"en_US","og_type":"article","og_title":"Gatan introduces the Monarc Pro T system for cathodoluminescence imaging - Electronic Device Failure Analysis Society","og_description":"AMETEK Gatan, Inc., Pleasanton, Calif., a global leader focused on enhancing and extending the operation and productivity of electron microscopes, launched Monarc Pro T system that reveals structural, optical, and electric properties of materials at the nanosale by enabling optically-coupled experiments in transmission electron microscopes.","og_url":"https:\/\/www.asminternational.org\/edfas\/gatan-introduces-the-monarc-pro-t-system-for-cathodoluminescence-imaging\/","og_site_name":"Electronic Device Failure Analysis Society","article_published_time":"2024-01-18T23:49:19+00:00","article_modified_time":"2024-01-18T23:50:22+00:00","og_image":[{"width":250,"height":140,"url":"https:\/\/www.asminternational.org\/app\/uploads\/sites\/41\/2024\/01\/EDFAS__012524__Gatan__250-1.jpg","type":"image\/jpeg"}],"author":"Debbie Sniderman","twitter_card":"summary_large_image","twitter_misc":{"Written by":"Debbie Sniderman","Est. reading time":"2 minutes"},"schema":{"@context":"https:\/\/schema.org","@graph":[{"@type":"Article","@id":"https:\/\/www.asminternational.org\/edfas\/gatan-introduces-the-monarc-pro-t-system-for-cathodoluminescence-imaging\/#article","isPartOf":{"@id":"https:\/\/www.asminternational.org\/edfas\/gatan-introduces-the-monarc-pro-t-system-for-cathodoluminescence-imaging\/"},"author":{"name":"Debbie Sniderman","@id":"https:\/\/www.asminternational.org\/edfas\/#\/schema\/person\/135b2d8ac98a363d0bd9ec033a2904ad"},"headline":"Gatan introduces the Monarc Pro T system for cathodoluminescence imaging","datePublished":"2024-01-18T23:49:19+00:00","dateModified":"2024-01-18T23:50:22+00:00","mainEntityOfPage":{"@id":"https:\/\/www.asminternational.org\/edfas\/gatan-introduces-the-monarc-pro-t-system-for-cathodoluminescence-imaging\/"},"wordCount":292,"publisher":{"@id":"https:\/\/www.asminternational.org\/edfas\/#organization"},"image":{"@id":"https:\/\/www.asminternational.org\/edfas\/gatan-introduces-the-monarc-pro-t-system-for-cathodoluminescence-imaging\/#primaryimage"},"thumbnailUrl":"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2024\/01\/EDFAS__012524__Gatan__250-1.jpg","articleSection":["materials characterization","Materials Testing and Evaluation","news","News Articles","Testing and Characterization","Tests and Diagnostics","Transmission Electron Microscopy"],"inLanguage":"en-US"},{"@type":"WebPage","@id":"https:\/\/www.asminternational.org\/edfas\/gatan-introduces-the-monarc-pro-t-system-for-cathodoluminescence-imaging\/","url":"https:\/\/www.asminternational.org\/edfas\/gatan-introduces-the-monarc-pro-t-system-for-cathodoluminescence-imaging\/","name":"Gatan introduces the Monarc Pro T system for cathodoluminescence imaging - Electronic Device Failure Analysis Society","isPartOf":{"@id":"https:\/\/www.asminternational.org\/edfas\/#website"},"primaryImageOfPage":{"@id":"https:\/\/www.asminternational.org\/edfas\/gatan-introduces-the-monarc-pro-t-system-for-cathodoluminescence-imaging\/#primaryimage"},"image":{"@id":"https:\/\/www.asminternational.org\/edfas\/gatan-introduces-the-monarc-pro-t-system-for-cathodoluminescence-imaging\/#primaryimage"},"thumbnailUrl":"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2024\/01\/EDFAS__012524__Gatan__250-1.jpg","datePublished":"2024-01-18T23:49:19+00:00","dateModified":"2024-01-18T23:50:22+00:00","breadcrumb":{"@id":"https:\/\/www.asminternational.org\/edfas\/gatan-introduces-the-monarc-pro-t-system-for-cathodoluminescence-imaging\/#breadcrumb"},"inLanguage":"en-US","potentialAction":[{"@type":"ReadAction","target":["https:\/\/www.asminternational.org\/edfas\/gatan-introduces-the-monarc-pro-t-system-for-cathodoluminescence-imaging\/"]}]},{"@type":"ImageObject","inLanguage":"en-US","@id":"https:\/\/www.asminternational.org\/edfas\/gatan-introduces-the-monarc-pro-t-system-for-cathodoluminescence-imaging\/#primaryimage","url":"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2024\/01\/EDFAS__012524__Gatan__250-1.jpg","contentUrl":"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2024\/01\/EDFAS__012524__Gatan__250-1.jpg","width":250,"height":140},{"@type":"BreadcrumbList","@id":"https:\/\/www.asminternational.org\/edfas\/gatan-introduces-the-monarc-pro-t-system-for-cathodoluminescence-imaging\/#breadcrumb","itemListElement":[{"@type":"ListItem","position":1,"name":"Home","item":"https:\/\/www.asminternational.org\/edfas\/"},{"@type":"ListItem","position":2,"name":"Gatan introduces the Monarc Pro T system for cathodoluminescence imaging"}]},{"@type":"WebSite","@id":"https:\/\/www.asminternational.org\/edfas\/#website","url":"https:\/\/www.asminternational.org\/edfas\/","name":"Electronic Device Failure Analysis Society","description":"Electronic Device Failure Analysis Society","publisher":{"@id":"https:\/\/www.asminternational.org\/edfas\/#organization"},"potentialAction":[{"@type":"SearchAction","target":{"@type":"EntryPoint","urlTemplate":"https:\/\/www.asminternational.org\/edfas\/?s={search_term_string}"},"query-input":{"@type":"PropertyValueSpecification","valueRequired":true,"valueName":"search_term_string"}}],"inLanguage":"en-US"},{"@type":"Organization","@id":"https:\/\/www.asminternational.org\/edfas\/#organization","name":"Electronic Device Failure Analysis Society","url":"https:\/\/www.asminternational.org\/edfas\/","logo":{"@type":"ImageObject","inLanguage":"en-US","@id":"https:\/\/www.asminternational.org\/edfas\/#\/schema\/logo\/image\/","url":"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2022\/10\/layout_set_logo.png","contentUrl":"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2022\/10\/layout_set_logo.png","width":360,"height":95,"caption":"Electronic Device Failure Analysis Society"},"image":{"@id":"https:\/\/www.asminternational.org\/edfas\/#\/schema\/logo\/image\/"}},{"@type":"Person","@id":"https:\/\/www.asminternational.org\/edfas\/#\/schema\/person\/135b2d8ac98a363d0bd9ec033a2904ad","name":"Debbie Sniderman","url":"https:\/\/www.asminternational.org\/edfas\/author\/dsniderman\/"}]}},"acf":[],"_links":{"self":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/posts\/7921","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/users\/63245"}],"replies":[{"embeddable":true,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/comments?post=7921"}],"version-history":[{"count":0,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/posts\/7921\/revisions"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/media\/7924"}],"wp:attachment":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/media?parent=7921"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/categories?post=7921"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/tags?post=7921"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}