{"id":8240,"date":"2024-09-19T23:42:50","date_gmt":"2024-09-20T03:42:50","guid":{"rendered":"https:\/\/staging.asminternational.org\/edfas\/bruker-introduces-next-generation-benchtop-stylus-profilometer\/"},"modified":"2024-09-20T03:44:05","modified_gmt":"2024-09-20T03:44:05","slug":"bruker-introduces-next-generation-benchtop-stylus-profilometer","status":"publish","type":"post","link":"https:\/\/www.asminternational.org\/edfas\/bruker-introduces-next-generation-benchtop-stylus-profilometer\/","title":{"rendered":"Bruker introduces next generation benchtop stylus profilometer"},"content":{"rendered":"<p>Bruker Corporation, Billerica, Mass., released the Dektak Pro stylus profilometer, the next-generation profiler in the industry-leading Dektak product line. Incorporating over 55 years of innovation, the new benchtop system provides an expanded measurement area up to 200 mm of full-sample access for semiconductor applications, as well as a shortened time to results with improved user experience and measurement accuracy. Dektak Pro incorporates advancements that solidify the brand as the world\u2019s most advanced stylus profiler, positioning it to address R&amp;D, process development, and QA\/QC present and future needs across a host of industrial and research markets.<\/p>\n<p>\u201cWe have a long history with Dektak tools, and they have been providing the automated and reliable step profiling for our MEMS fab that we rely on,\u201d said Dr. Nithi Atthi, fab manager at Thai Microelectronics Center (TMEC). \u201cThe new system\u2019s technological advancements promise even more measurement capabilities to meet our increasingly stringent high aspect ratio microstructures for MEMS metrology requirements.\u201d<\/p>\n<p>\u201cThe name Dektak has become synonymous with stylus profiling, and for good reason. Hundreds of Dektak systems are installed around the world every year, proving an enduring need for this technology,\u201d added Samuel Lesko, senior director and general manager of Bruker\u2019s Tribology, Stylus and Optical Metrology Business. \u201cWith Dektak Pro, we have taken the next step in measurement capability and ease of operation while maintaining the value and reliability that Dektak is so well known for, and I really look forward to seeing the many ways our customers will use the system in the years to come.\u201d<\/p>\n<p>&nbsp;<\/p>\n<p>For more information:<\/p>\n<p>Bruker<\/p>\n<p><a href=\"http:\/\/www.bruker.com\">www.bruker.com<\/a><\/p>\n<p>&nbsp;<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Bruker Corporation, Billerica, Mass., released the Dektak Pro stylus profilometer, the next-generation profiler in the industry-leading Dektak product line, expanding measurement area and accuracy for critical analyses.<\/p>\n","protected":false},"author":63245,"featured_media":8243,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[509,595,441,437,606,517,435,436,618,470],"tags":[],"class_list":["post-8240","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-inspection","category-laboratory-tests","category-materials-properties-and-performance","category-materials-testing-and-evaluation","category-mechanical-probing","category-microelectronic-failure-analysis","category-news","category-news-articles","category-nondestructive-testing","category-testing-and-characterization"],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.9 - 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