{"id":8467,"date":"2024-11-14T20:35:51","date_gmt":"2024-11-15T01:35:51","guid":{"rendered":"https:\/\/staging.asminternational.org\/edfas\/litescope-receives-prestigious-rd-100-award\/"},"modified":"2024-12-06T22:26:34","modified_gmt":"2024-12-06T22:26:34","slug":"litescope-receives-prestigious-rd-100-award","status":"publish","type":"post","link":"https:\/\/www.asminternational.org\/edfas\/litescope-receives-prestigious-rd-100-award\/","title":{"rendered":"LiteScope receives prestigious R&amp;D 100 Award"},"content":{"rendered":"<p>NenoVision, Czech Republic, a leading innovator in advanced microscopy solutions, has been honored with the esteemed R&amp;D 100 Award in the Analytical\/Test category. This recognition underscores NenoVision&#8217;s commitment to pushing the boundaries of scientific innovation and excellence in the field of in-situ correlative microscopy.<\/p>\n<p>For over 60 years, the R&amp;D 100 Awards have celebrated groundbreaking technologies and innovations across various industries. Winning in the Analytical\/Test category highlights the significant impact of NenoVision&#8217;s AFM-in-SEM LiteScope technology, which has revolutionized how researchers and industry professionals analyze and understand complex materials at nanoscale.<\/p>\n<p>NenoVision&#8217;s AFM-in-SEM LiteScope is a unique tool for multimodal in-situ correlative sample analysis, offering a combination of Atomic Force Microscopy (AFM) integrated within a Scanning Electron Microscope (SEM). This innovative approach allows for simultaneous observation and measurement, facilitating a deeper understanding of material behaviors and characteristics that were previously challenging to achieve.<\/p>\n<p>Umberto Celano, Nanoelectronics Metrology &amp; Failure Analysis Lab group leader and associate professor at Arizona State University, remarked on the LiteScope&#8217;s capabilities: \u201cThe LiteScope 2.5 by NenoVision represents a groundbreaking technology that deserves recognition by the R&amp;D 100 Awards. Its advanced capabilities and seamless integration have significantly enhanced our research capabilities, setting a new standard for future innovations in the field of nanoelectronics.\u201d<\/p>\n<p>\u201cWe are thrilled to receive this prestigious recognition,\u201d said Jan Neuman, CEO of NenoVision. \u201cThe R&amp;D 100 Award is a testament to our team&#8217;s dedication and hard work. This award motivates us to continue innovating and delivering cutting-edge solutions that drive scientific discovery and industrial progress.\u201d<\/p>\n<p>NenoVision looks forward to continuing its mission of enabling scientific breakthroughs and supporting the global research community with its state-of-the-art technologies.<\/p>\n<p>&nbsp;<\/p>\n<p>&nbsp;<\/p>\n<p>For more information:<\/p>\n<p>NenoVision<\/p>\n<p><a href=\"https:\/\/www.nenovision.com\">https:\/\/www.nenovision.com<\/a><\/p>\n","protected":false},"excerpt":{"rendered":"<p>NenoVision, Czech Republic, a leading innovator in advanced microscopy solutions, has been honored with the esteemed R&amp;D 100 Award in the Analytical\/Test category for its AFM-in-SEM LiteScope technology.<\/p>\n","protected":false},"author":1,"featured_media":8468,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[509,441,517,435,436,454,576,587,470,512],"tags":[],"class_list":["post-8467","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-inspection","category-materials-properties-and-performance","category-microelectronic-failure-analysis","category-news","category-news-articles","category-physical-properties","category-processes-and-procedures","category-scanning-electron-microscopy","category-testing-and-characterization","category-testing-and-monitoring"],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.9 - 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