{"id":8473,"date":"2024-11-14T20:26:13","date_gmt":"2024-11-15T01:26:13","guid":{"rendered":"https:\/\/staging.asminternational.org\/edfas\/acquisition-of-bae-systems-imaging-solutions-inc-strengthening-the-opto-semiconductor-segment-and-accelerating-value-added-growth\/"},"modified":"2024-12-06T22:31:11","modified_gmt":"2024-12-06T22:31:11","slug":"acquisition-of-bae-systems-imaging-solutions-inc-strengthening-the-opto-semiconductor-segment-and-accelerating-value-added-growth","status":"publish","type":"post","link":"https:\/\/www.asminternational.org\/edfas\/acquisition-of-bae-systems-imaging-solutions-inc-strengthening-the-opto-semiconductor-segment-and-accelerating-value-added-growth\/","title":{"rendered":"Acquisition of BAE Systems Imaging Solutions, Inc. strengthening the opto-semiconductor segment and accelerating value-added growth"},"content":{"rendered":"

Photonics Management Corp., Bridgewater, N. J., a subsidiary of Hamamatsu Photonics K.K., Japan, has purchased the stock of BAE Systems Imaging Solutions, Inc. a subsidiary of BAE Systems, Inc., Falls Church, Va. In recognition of the company\u2019s deep roots starting in 1920 as the Fairchild Aerial Camera Corporation, the company will return to the name first used in 2001, Fairchild Imaging.<\/p>\n

Fairchild Imaging is a semiconductor manufacturer specializing in high-performance CMOS image sensors in the visible to near-infrared and X-ray regions, and it has the world\u2019s best low-noise CMOS image sensor design technology. Fairchild Imaging\u2019s core products include scientific CMOS image sensors for scientific measurement applications that simultaneously realize high sensitivity, high-speed readout, and low noise, as well as X-ray CMOS image sensors for dental and medical diagnostic applications.<\/p>\n

Fairchild Imaging\u2019s core products are two-dimensional CMOS image sensors that take pictures in dark conditions where low noise is essential. These products complement Hamamatsu Photonics\u2019 one-dimensional CMOS image sensors, which are used for analytical instruments and factory automation applications such as displacement meters and encoders. Therefore, Fairchild Imaging\u2019s technologies will enhance Hamamatsu\u2019s CMOS image sensor product line.<\/p>\n

Through the acquisition of shares, we expect the following:<\/p>\n

    \n
  1. Promote sales activities of Fairchild Imaging\u2019s products by utilizing the global sales network currently established by Hamamatsu Photonics Group.<\/li>\n
  2. While Hamamatsu Photonics\u2019 dental business serves the European and the Asian regions including Japan, Fairchild Imaging serves North America. This will lead to the expansion and strengthening of our worldwide dental market share.<\/li>\n
  3. Fairchild Imaging will become Hamamatsu\u2019s North American design center for 2D, low-noise image sensors. This will strengthen CMOS image sensor design resources and utilize our North American and Japanese locations to provide worldwide marketing and technical support.<\/li>\n
  4. Create new opportunities and products by combining Fairchild Imaging\u2019s CMOS image sensor design technology with Hamamatsu Photonics\u2019 MEMS technology to support a wider range of custom CMOS image sensors and provide higher value-added products.<\/li>\n<\/ol>\n

    BAE Systems is retaining the aerospace and defense segment of the BAE Systems Imaging Solution\u2019s portfolio, which was transferred to the BAE Systems, Inc. Electronic Systems sector, prior to the closing of this stock purchase transaction.<\/p>\n

    Fairchild Imaging will continue their operating structure and focus on developing and providing superior products and solutions to their customers.<\/p>\n

     <\/p>\n

    For more information:<\/p>\n

    Fairchild Imaging, Inc.
    \nhttps:\/\/fairchildimaging.com\/<\/a><\/p>\n

    Hamamatsu Photonics K.K.
    \n    https:\/\/www.hamamatsu.com<\/a><\/p>\n

     <\/p>\n","protected":false},"excerpt":{"rendered":"

    Photonics Management Corp., Bridgewater, N. J., a subsidiary of Hamamatsu Photonics K.K., Japan, has purchased the stock of BAE Systems Imaging Solutions, Inc. a subsidiary of BAE Systems, Inc., Falls Church, Va. <\/p>\n","protected":false},"author":1,"featured_media":8474,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[460,435,436,470,512,455],"tags":[],"class_list":["post-8473","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-failure-analysis","category-news","category-news-articles","category-testing-and-characterization","category-testing-and-monitoring","category-tests-and-diagnostics"],"yoast_head":"\nAcquisition of BAE Systems Imaging Solutions, Inc. strengthening the opto-semiconductor segment and accelerating value-added growth - Electronic Device Failure Analysis Society<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.asminternational.org\/edfas\/acquisition-of-bae-systems-imaging-solutions-inc-strengthening-the-opto-semiconductor-segment-and-accelerating-value-added-growth\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Acquisition of BAE Systems Imaging Solutions, Inc. strengthening the opto-semiconductor segment and accelerating value-added growth - Electronic Device Failure Analysis Society\" \/>\n<meta property=\"og:description\" content=\"Photonics Management Corp., Bridgewater, N. J., a subsidiary of Hamamatsu Photonics K.K., Japan, has purchased the stock of BAE Systems Imaging Solutions, Inc. a subsidiary of BAE Systems, Inc., Falls Church, Va.\" \/>\n<meta property=\"og:url\" content=\"https:\/\/www.asminternational.org\/edfas\/acquisition-of-bae-systems-imaging-solutions-inc-strengthening-the-opto-semiconductor-segment-and-accelerating-value-added-growth\/\" \/>\n<meta property=\"og:site_name\" content=\"Electronic Device Failure Analysis Society\" \/>\n<meta property=\"article:published_time\" content=\"2024-11-15T01:26:13+00:00\" \/>\n<meta property=\"article:modified_time\" content=\"2024-12-06T22:31:11+00:00\" \/>\n<meta property=\"og:image\" content=\"https:\/\/www.asminternational.org\/app\/uploads\/sites\/41\/2024\/12\/EFAS__112124__Hamamatsu__250.jpg\" \/>\n\t<meta property=\"og:image:width\" content=\"250\" \/>\n\t<meta property=\"og:image:height\" content=\"36\" \/>\n\t<meta property=\"og:image:type\" content=\"image\/jpeg\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"Written by\" \/>\n\t<meta name=\"twitter:data1\" content=\"\" \/>\n\t<meta name=\"twitter:label2\" content=\"Est. reading time\" \/>\n\t<meta name=\"twitter:data2\" content=\"2 minutes\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\\\/\\\/schema.org\",\"@graph\":[{\"@type\":\"Article\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/acquisition-of-bae-systems-imaging-solutions-inc-strengthening-the-opto-semiconductor-segment-and-accelerating-value-added-growth\\\/#article\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/acquisition-of-bae-systems-imaging-solutions-inc-strengthening-the-opto-semiconductor-segment-and-accelerating-value-added-growth\\\/\"},\"author\":{\"name\":\"\",\"@id\":\"\"},\"headline\":\"Acquisition of BAE Systems Imaging Solutions, Inc. strengthening the opto-semiconductor segment and accelerating value-added growth\",\"datePublished\":\"2024-11-15T01:26:13+00:00\",\"dateModified\":\"2024-12-06T22:31:11+00:00\",\"mainEntityOfPage\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/acquisition-of-bae-systems-imaging-solutions-inc-strengthening-the-opto-semiconductor-segment-and-accelerating-value-added-growth\\\/\"},\"wordCount\":417,\"publisher\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#organization\"},\"image\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/acquisition-of-bae-systems-imaging-solutions-inc-strengthening-the-opto-semiconductor-segment-and-accelerating-value-added-growth\\\/#primaryimage\"},\"thumbnailUrl\":\"https:\\\/\\\/cdn-prd-main.asm-media.cloud\\\/uploads\\\/sites\\\/41\\\/2024\\\/12\\\/EFAS__112124__Hamamatsu__250.jpg\",\"articleSection\":[\"Failure Analysis\",\"news\",\"News Articles\",\"Testing and Characterization\",\"Testing and Monitoring\",\"Tests and Diagnostics\"],\"inLanguage\":\"en-US\"},{\"@type\":\"WebPage\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/acquisition-of-bae-systems-imaging-solutions-inc-strengthening-the-opto-semiconductor-segment-and-accelerating-value-added-growth\\\/\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/acquisition-of-bae-systems-imaging-solutions-inc-strengthening-the-opto-semiconductor-segment-and-accelerating-value-added-growth\\\/\",\"name\":\"Acquisition of BAE Systems Imaging Solutions, Inc. strengthening the opto-semiconductor segment and accelerating value-added growth - Electronic Device Failure Analysis Society\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#website\"},\"primaryImageOfPage\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/acquisition-of-bae-systems-imaging-solutions-inc-strengthening-the-opto-semiconductor-segment-and-accelerating-value-added-growth\\\/#primaryimage\"},\"image\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/acquisition-of-bae-systems-imaging-solutions-inc-strengthening-the-opto-semiconductor-segment-and-accelerating-value-added-growth\\\/#primaryimage\"},\"thumbnailUrl\":\"https:\\\/\\\/cdn-prd-main.asm-media.cloud\\\/uploads\\\/sites\\\/41\\\/2024\\\/12\\\/EFAS__112124__Hamamatsu__250.jpg\",\"datePublished\":\"2024-11-15T01:26:13+00:00\",\"dateModified\":\"2024-12-06T22:31:11+00:00\",\"breadcrumb\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/acquisition-of-bae-systems-imaging-solutions-inc-strengthening-the-opto-semiconductor-segment-and-accelerating-value-added-growth\\\/#breadcrumb\"},\"inLanguage\":\"en-US\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/acquisition-of-bae-systems-imaging-solutions-inc-strengthening-the-opto-semiconductor-segment-and-accelerating-value-added-growth\\\/\"]}]},{\"@type\":\"ImageObject\",\"inLanguage\":\"en-US\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/acquisition-of-bae-systems-imaging-solutions-inc-strengthening-the-opto-semiconductor-segment-and-accelerating-value-added-growth\\\/#primaryimage\",\"url\":\"https:\\\/\\\/cdn-prd-main.asm-media.cloud\\\/uploads\\\/sites\\\/41\\\/2024\\\/12\\\/EFAS__112124__Hamamatsu__250.jpg\",\"contentUrl\":\"https:\\\/\\\/cdn-prd-main.asm-media.cloud\\\/uploads\\\/sites\\\/41\\\/2024\\\/12\\\/EFAS__112124__Hamamatsu__250.jpg\",\"width\":250,\"height\":36},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/acquisition-of-bae-systems-imaging-solutions-inc-strengthening-the-opto-semiconductor-segment-and-accelerating-value-added-growth\\\/#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Home\",\"item\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"Acquisition of BAE Systems Imaging Solutions, Inc. strengthening the opto-semiconductor segment and accelerating value-added growth\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#website\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/\",\"name\":\"Electronic Device Failure Analysis Society\",\"description\":\"Electronic Device Failure Analysis Society\",\"publisher\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#organization\"},\"potentialAction\":[{\"@type\":\"SearchAction\",\"target\":{\"@type\":\"EntryPoint\",\"urlTemplate\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/?s={search_term_string}\"},\"query-input\":{\"@type\":\"PropertyValueSpecification\",\"valueRequired\":true,\"valueName\":\"search_term_string\"}}],\"inLanguage\":\"en-US\"},{\"@type\":\"Organization\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#organization\",\"name\":\"Electronic Device Failure Analysis Society\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/\",\"logo\":{\"@type\":\"ImageObject\",\"inLanguage\":\"en-US\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#\\\/schema\\\/logo\\\/image\\\/\",\"url\":\"https:\\\/\\\/cdn-prd-main.asm-media.cloud\\\/uploads\\\/sites\\\/41\\\/2022\\\/10\\\/layout_set_logo.png\",\"contentUrl\":\"https:\\\/\\\/cdn-prd-main.asm-media.cloud\\\/uploads\\\/sites\\\/41\\\/2022\\\/10\\\/layout_set_logo.png\",\"width\":360,\"height\":95,\"caption\":\"Electronic Device Failure Analysis Society\"},\"image\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#\\\/schema\\\/logo\\\/image\\\/\"}},{\"@type\":\"Person\",\"@id\":\"\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/author\\\/\"}]}<\/script>\n<!-- \/ Yoast SEO plugin. -->","yoast_head_json":{"title":"Acquisition of BAE Systems Imaging Solutions, Inc. strengthening the opto-semiconductor segment and accelerating value-added growth - Electronic Device Failure Analysis Society","robots":{"index":"index","follow":"follow","max-snippet":"max-snippet:-1","max-image-preview":"max-image-preview:large","max-video-preview":"max-video-preview:-1"},"canonical":"https:\/\/www.asminternational.org\/edfas\/acquisition-of-bae-systems-imaging-solutions-inc-strengthening-the-opto-semiconductor-segment-and-accelerating-value-added-growth\/","og_locale":"en_US","og_type":"article","og_title":"Acquisition of BAE Systems Imaging Solutions, Inc. strengthening the opto-semiconductor segment and accelerating value-added growth - Electronic Device Failure Analysis Society","og_description":"Photonics Management Corp., Bridgewater, N. J., a subsidiary of Hamamatsu Photonics K.K., Japan, has purchased the stock of BAE Systems Imaging Solutions, Inc. a subsidiary of BAE Systems, Inc., Falls Church, Va.","og_url":"https:\/\/www.asminternational.org\/edfas\/acquisition-of-bae-systems-imaging-solutions-inc-strengthening-the-opto-semiconductor-segment-and-accelerating-value-added-growth\/","og_site_name":"Electronic Device Failure Analysis Society","article_published_time":"2024-11-15T01:26:13+00:00","article_modified_time":"2024-12-06T22:31:11+00:00","og_image":[{"width":250,"height":36,"url":"https:\/\/www.asminternational.org\/app\/uploads\/sites\/41\/2024\/12\/EFAS__112124__Hamamatsu__250.jpg","type":"image\/jpeg"}],"twitter_card":"summary_large_image","twitter_misc":{"Written by":"","Est. reading time":"2 minutes"},"schema":{"@context":"https:\/\/schema.org","@graph":[{"@type":"Article","@id":"https:\/\/www.asminternational.org\/edfas\/acquisition-of-bae-systems-imaging-solutions-inc-strengthening-the-opto-semiconductor-segment-and-accelerating-value-added-growth\/#article","isPartOf":{"@id":"https:\/\/www.asminternational.org\/edfas\/acquisition-of-bae-systems-imaging-solutions-inc-strengthening-the-opto-semiconductor-segment-and-accelerating-value-added-growth\/"},"author":{"name":"","@id":""},"headline":"Acquisition of BAE Systems Imaging Solutions, Inc. strengthening the opto-semiconductor segment and accelerating value-added growth","datePublished":"2024-11-15T01:26:13+00:00","dateModified":"2024-12-06T22:31:11+00:00","mainEntityOfPage":{"@id":"https:\/\/www.asminternational.org\/edfas\/acquisition-of-bae-systems-imaging-solutions-inc-strengthening-the-opto-semiconductor-segment-and-accelerating-value-added-growth\/"},"wordCount":417,"publisher":{"@id":"https:\/\/www.asminternational.org\/edfas\/#organization"},"image":{"@id":"https:\/\/www.asminternational.org\/edfas\/acquisition-of-bae-systems-imaging-solutions-inc-strengthening-the-opto-semiconductor-segment-and-accelerating-value-added-growth\/#primaryimage"},"thumbnailUrl":"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2024\/12\/EFAS__112124__Hamamatsu__250.jpg","articleSection":["Failure Analysis","news","News Articles","Testing and Characterization","Testing and Monitoring","Tests and Diagnostics"],"inLanguage":"en-US"},{"@type":"WebPage","@id":"https:\/\/www.asminternational.org\/edfas\/acquisition-of-bae-systems-imaging-solutions-inc-strengthening-the-opto-semiconductor-segment-and-accelerating-value-added-growth\/","url":"https:\/\/www.asminternational.org\/edfas\/acquisition-of-bae-systems-imaging-solutions-inc-strengthening-the-opto-semiconductor-segment-and-accelerating-value-added-growth\/","name":"Acquisition of BAE Systems Imaging Solutions, Inc. strengthening the opto-semiconductor segment and accelerating value-added growth - Electronic Device Failure Analysis Society","isPartOf":{"@id":"https:\/\/www.asminternational.org\/edfas\/#website"},"primaryImageOfPage":{"@id":"https:\/\/www.asminternational.org\/edfas\/acquisition-of-bae-systems-imaging-solutions-inc-strengthening-the-opto-semiconductor-segment-and-accelerating-value-added-growth\/#primaryimage"},"image":{"@id":"https:\/\/www.asminternational.org\/edfas\/acquisition-of-bae-systems-imaging-solutions-inc-strengthening-the-opto-semiconductor-segment-and-accelerating-value-added-growth\/#primaryimage"},"thumbnailUrl":"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2024\/12\/EFAS__112124__Hamamatsu__250.jpg","datePublished":"2024-11-15T01:26:13+00:00","dateModified":"2024-12-06T22:31:11+00:00","breadcrumb":{"@id":"https:\/\/www.asminternational.org\/edfas\/acquisition-of-bae-systems-imaging-solutions-inc-strengthening-the-opto-semiconductor-segment-and-accelerating-value-added-growth\/#breadcrumb"},"inLanguage":"en-US","potentialAction":[{"@type":"ReadAction","target":["https:\/\/www.asminternational.org\/edfas\/acquisition-of-bae-systems-imaging-solutions-inc-strengthening-the-opto-semiconductor-segment-and-accelerating-value-added-growth\/"]}]},{"@type":"ImageObject","inLanguage":"en-US","@id":"https:\/\/www.asminternational.org\/edfas\/acquisition-of-bae-systems-imaging-solutions-inc-strengthening-the-opto-semiconductor-segment-and-accelerating-value-added-growth\/#primaryimage","url":"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2024\/12\/EFAS__112124__Hamamatsu__250.jpg","contentUrl":"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2024\/12\/EFAS__112124__Hamamatsu__250.jpg","width":250,"height":36},{"@type":"BreadcrumbList","@id":"https:\/\/www.asminternational.org\/edfas\/acquisition-of-bae-systems-imaging-solutions-inc-strengthening-the-opto-semiconductor-segment-and-accelerating-value-added-growth\/#breadcrumb","itemListElement":[{"@type":"ListItem","position":1,"name":"Home","item":"https:\/\/www.asminternational.org\/edfas\/"},{"@type":"ListItem","position":2,"name":"Acquisition of BAE Systems Imaging Solutions, Inc. strengthening the opto-semiconductor segment and accelerating value-added growth"}]},{"@type":"WebSite","@id":"https:\/\/www.asminternational.org\/edfas\/#website","url":"https:\/\/www.asminternational.org\/edfas\/","name":"Electronic Device Failure Analysis Society","description":"Electronic Device Failure Analysis Society","publisher":{"@id":"https:\/\/www.asminternational.org\/edfas\/#organization"},"potentialAction":[{"@type":"SearchAction","target":{"@type":"EntryPoint","urlTemplate":"https:\/\/www.asminternational.org\/edfas\/?s={search_term_string}"},"query-input":{"@type":"PropertyValueSpecification","valueRequired":true,"valueName":"search_term_string"}}],"inLanguage":"en-US"},{"@type":"Organization","@id":"https:\/\/www.asminternational.org\/edfas\/#organization","name":"Electronic Device Failure Analysis Society","url":"https:\/\/www.asminternational.org\/edfas\/","logo":{"@type":"ImageObject","inLanguage":"en-US","@id":"https:\/\/www.asminternational.org\/edfas\/#\/schema\/logo\/image\/","url":"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2022\/10\/layout_set_logo.png","contentUrl":"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2022\/10\/layout_set_logo.png","width":360,"height":95,"caption":"Electronic Device Failure Analysis Society"},"image":{"@id":"https:\/\/www.asminternational.org\/edfas\/#\/schema\/logo\/image\/"}},{"@type":"Person","@id":"","url":"https:\/\/www.asminternational.org\/edfas\/author\/"}]}},"acf":[],"_links":{"self":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/posts\/8473","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/comments?post=8473"}],"version-history":[{"count":0,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/posts\/8473\/revisions"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/media\/8474"}],"wp:attachment":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/media?parent=8473"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/categories?post=8473"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/tags?post=8473"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}