{"id":9039,"date":"2025-11-27T16:01:03","date_gmt":"2025-11-27T21:01:03","guid":{"rendered":"https:\/\/staging.asminternational.org\/edfas\/engineering-defects-could-transform-the-future-of-nanomaterials\/"},"modified":"2025-11-27T21:01:05","modified_gmt":"2025-11-27T21:01:05","slug":"engineering-defects-could-transform-the-future-of-nanomaterials","status":"publish","type":"post","link":"https:\/\/www.asminternational.org\/edfas\/engineering-defects-could-transform-the-future-of-nanomaterials\/","title":{"rendered":"Engineering defects could transform the future of nanomaterials"},"content":{"rendered":"

Materials scientists at the University of Minnesota Twin Cities have found a way to create and control tiny \u201cflaws\u201d inside ultra-thin materials. These internal features, known as extended defects, could give next-generation nanomaterials entirely new properties, opening the door to advances in nanotechnology.<\/p>\n

The study, published in Nature Communications<\/em>, demonstrated that patterned regions of the material could achieve a density of extended defects\u2014atomic-scale disruptions in the crystal lattice\u2014up to 1,000 times higher than in unpatterned areas.<\/p>\n

\u201cThese extended defects are exciting because they span the entire material but occupy a very small volume,\u201d said Andre Mkhoyan, a professor in the University of Minnesota Department of Chemical Engineering and Materials Science and senior author of the study. \u201cBy carefully controlling these tiny features, we can leverage the properties of both the defect and the surrounding material.\u201d<\/p>\n

This level of control means researchers can now design materials where different sections have dramatically different defect densities and types, potentially leading to new functionalities. By putting a very high concentration of defects along the material’s thickness, they can create new films where nanometer-sized patterns are completely dominated by the defects, leading to revolutionary material properties.<\/p>\n

\u201cWe figured out a new way to design materials by making tiny, defect inducing patterns on the substrate surface before growing thin film on it,\u201d said Supriya Ghosh, a graduate student in the Mkhoyan Lab and first author on the paper.<\/p>\n

This breakthrough provides a way to control tiny internal features in materials. Although the study focused on perovskite oxides, the researchers say the method could work with different types of thin materials. The hope is that someday electronic devices could take advantage of these defects.<\/p>\n

 <\/p>\n

 <\/p>\n

Image \u2013 Researchers can now design materials where different sections have dramatically different defect densities and types, potentially leading to new functionalities. Courtesy of: The Mkhoyan Lab.<\/em><\/p>\n

 <\/p>\n

For more information:<\/p>\n

University of Minnesota
\nhttps:\/\/cse.umn.edu\/<\/a><\/p>\n

 <\/p>\n","protected":false},"excerpt":{"rendered":"

Materials scientists at the University of Minnesota Twin Cities have found a way to create and control tiny internal \u201cflaws\u201d inside ultra-thin materials known as extended defects, that could give next-generation nanomaterials entirely new properties, opening the door to advances in nanotechnology.<\/p>\n","protected":false},"author":63245,"featured_media":9040,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[460,510,458,438,435,436,464],"tags":[],"class_list":["post-9039","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-failure-analysis","category-materials-characterization","category-metallography-and-microstructures","category-nanotechnology","category-news","category-news-articles","category-research-and-development"],"yoast_head":"\nEngineering defects could transform the future of nanomaterials - Electronic Device Failure Analysis Society<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.asminternational.org\/edfas\/engineering-defects-could-transform-the-future-of-nanomaterials\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Engineering defects could transform the future of nanomaterials - Electronic Device Failure Analysis Society\" \/>\n<meta property=\"og:description\" content=\"Materials scientists at the University of Minnesota Twin Cities have found a way to create and control tiny internal \u201cflaws\u201d inside ultra-thin materials known as extended defects, that could give next-generation nanomaterials entirely new properties, opening the door to advances in nanotechnology.\" \/>\n<meta property=\"og:url\" content=\"https:\/\/www.asminternational.org\/edfas\/engineering-defects-could-transform-the-future-of-nanomaterials\/\" \/>\n<meta property=\"og:site_name\" content=\"Electronic Device Failure Analysis Society\" \/>\n<meta property=\"article:published_time\" content=\"2025-11-27T21:01:03+00:00\" \/>\n<meta property=\"article:modified_time\" content=\"2025-11-27T21:01:05+00:00\" \/>\n<meta property=\"og:image\" content=\"https:\/\/www.asminternational.org\/app\/uploads\/sites\/41\/2025\/11\/EDFAS__120425__UMinn__400.webp\" \/>\n\t<meta property=\"og:image:width\" content=\"400\" \/>\n\t<meta property=\"og:image:height\" content=\"294\" \/>\n\t<meta property=\"og:image:type\" content=\"image\/jpeg\" \/>\n<meta name=\"author\" content=\"Debbie Sniderman\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"Written by\" \/>\n\t<meta name=\"twitter:data1\" content=\"Debbie Sniderman\" \/>\n\t<meta name=\"twitter:label2\" content=\"Est. reading time\" \/>\n\t<meta name=\"twitter:data2\" content=\"2 minutes\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\\\/\\\/schema.org\",\"@graph\":[{\"@type\":\"Article\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/engineering-defects-could-transform-the-future-of-nanomaterials\\\/#article\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/engineering-defects-could-transform-the-future-of-nanomaterials\\\/\"},\"author\":{\"name\":\"Debbie Sniderman\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#\\\/schema\\\/person\\\/135b2d8ac98a363d0bd9ec033a2904ad\"},\"headline\":\"Engineering defects could transform the future of nanomaterials\",\"datePublished\":\"2025-11-27T21:01:03+00:00\",\"dateModified\":\"2025-11-27T21:01:05+00:00\",\"mainEntityOfPage\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/engineering-defects-could-transform-the-future-of-nanomaterials\\\/\"},\"wordCount\":327,\"publisher\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#organization\"},\"image\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/engineering-defects-could-transform-the-future-of-nanomaterials\\\/#primaryimage\"},\"thumbnailUrl\":\"https:\\\/\\\/cdn-prd-main.asm-media.cloud\\\/uploads\\\/sites\\\/41\\\/2025\\\/11\\\/EDFAS__120425__UMinn__400.webp\",\"articleSection\":[\"Failure Analysis\",\"materials characterization\",\"Metallography and Microstructures\",\"Nanotechnology\",\"news\",\"News Articles\",\"Research and Development\"],\"inLanguage\":\"en-US\"},{\"@type\":\"WebPage\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/engineering-defects-could-transform-the-future-of-nanomaterials\\\/\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/engineering-defects-could-transform-the-future-of-nanomaterials\\\/\",\"name\":\"Engineering defects could transform the future of nanomaterials - Electronic Device Failure Analysis Society\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#website\"},\"primaryImageOfPage\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/engineering-defects-could-transform-the-future-of-nanomaterials\\\/#primaryimage\"},\"image\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/engineering-defects-could-transform-the-future-of-nanomaterials\\\/#primaryimage\"},\"thumbnailUrl\":\"https:\\\/\\\/cdn-prd-main.asm-media.cloud\\\/uploads\\\/sites\\\/41\\\/2025\\\/11\\\/EDFAS__120425__UMinn__400.webp\",\"datePublished\":\"2025-11-27T21:01:03+00:00\",\"dateModified\":\"2025-11-27T21:01:05+00:00\",\"breadcrumb\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/engineering-defects-could-transform-the-future-of-nanomaterials\\\/#breadcrumb\"},\"inLanguage\":\"en-US\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/engineering-defects-could-transform-the-future-of-nanomaterials\\\/\"]}]},{\"@type\":\"ImageObject\",\"inLanguage\":\"en-US\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/engineering-defects-could-transform-the-future-of-nanomaterials\\\/#primaryimage\",\"url\":\"https:\\\/\\\/cdn-prd-main.asm-media.cloud\\\/uploads\\\/sites\\\/41\\\/2025\\\/11\\\/EDFAS__120425__UMinn__400.webp\",\"contentUrl\":\"https:\\\/\\\/cdn-prd-main.asm-media.cloud\\\/uploads\\\/sites\\\/41\\\/2025\\\/11\\\/EDFAS__120425__UMinn__400.webp\",\"width\":400,\"height\":294},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/engineering-defects-could-transform-the-future-of-nanomaterials\\\/#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Home\",\"item\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"Engineering defects could transform the future of nanomaterials\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#website\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/\",\"name\":\"Electronic Device Failure Analysis Society\",\"description\":\"Electronic Device Failure Analysis Society\",\"publisher\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#organization\"},\"potentialAction\":[{\"@type\":\"SearchAction\",\"target\":{\"@type\":\"EntryPoint\",\"urlTemplate\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/?s={search_term_string}\"},\"query-input\":{\"@type\":\"PropertyValueSpecification\",\"valueRequired\":true,\"valueName\":\"search_term_string\"}}],\"inLanguage\":\"en-US\"},{\"@type\":\"Organization\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#organization\",\"name\":\"Electronic Device Failure Analysis Society\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/\",\"logo\":{\"@type\":\"ImageObject\",\"inLanguage\":\"en-US\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#\\\/schema\\\/logo\\\/image\\\/\",\"url\":\"https:\\\/\\\/cdn-prd-main.asm-media.cloud\\\/uploads\\\/sites\\\/41\\\/2022\\\/10\\\/layout_set_logo.png\",\"contentUrl\":\"https:\\\/\\\/cdn-prd-main.asm-media.cloud\\\/uploads\\\/sites\\\/41\\\/2022\\\/10\\\/layout_set_logo.png\",\"width\":360,\"height\":95,\"caption\":\"Electronic Device Failure Analysis Society\"},\"image\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#\\\/schema\\\/logo\\\/image\\\/\"}},{\"@type\":\"Person\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#\\\/schema\\\/person\\\/135b2d8ac98a363d0bd9ec033a2904ad\",\"name\":\"Debbie Sniderman\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/author\\\/dsniderman\\\/\"}]}<\/script>\n<!-- \/ Yoast SEO plugin. -->","yoast_head_json":{"title":"Engineering defects could transform the future of nanomaterials - Electronic Device Failure Analysis Society","robots":{"index":"index","follow":"follow","max-snippet":"max-snippet:-1","max-image-preview":"max-image-preview:large","max-video-preview":"max-video-preview:-1"},"canonical":"https:\/\/www.asminternational.org\/edfas\/engineering-defects-could-transform-the-future-of-nanomaterials\/","og_locale":"en_US","og_type":"article","og_title":"Engineering defects could transform the future of nanomaterials - Electronic Device Failure Analysis Society","og_description":"Materials scientists at the University of Minnesota Twin Cities have found a way to create and control tiny internal \u201cflaws\u201d inside ultra-thin materials known as extended defects, that could give next-generation nanomaterials entirely new properties, opening the door to advances in nanotechnology.","og_url":"https:\/\/www.asminternational.org\/edfas\/engineering-defects-could-transform-the-future-of-nanomaterials\/","og_site_name":"Electronic Device Failure Analysis Society","article_published_time":"2025-11-27T21:01:03+00:00","article_modified_time":"2025-11-27T21:01:05+00:00","og_image":[{"width":400,"height":294,"url":"https:\/\/www.asminternational.org\/app\/uploads\/sites\/41\/2025\/11\/EDFAS__120425__UMinn__400.webp","type":"image\/jpeg"}],"author":"Debbie Sniderman","twitter_card":"summary_large_image","twitter_misc":{"Written by":"Debbie Sniderman","Est. reading time":"2 minutes"},"schema":{"@context":"https:\/\/schema.org","@graph":[{"@type":"Article","@id":"https:\/\/www.asminternational.org\/edfas\/engineering-defects-could-transform-the-future-of-nanomaterials\/#article","isPartOf":{"@id":"https:\/\/www.asminternational.org\/edfas\/engineering-defects-could-transform-the-future-of-nanomaterials\/"},"author":{"name":"Debbie Sniderman","@id":"https:\/\/www.asminternational.org\/edfas\/#\/schema\/person\/135b2d8ac98a363d0bd9ec033a2904ad"},"headline":"Engineering defects could transform the future of nanomaterials","datePublished":"2025-11-27T21:01:03+00:00","dateModified":"2025-11-27T21:01:05+00:00","mainEntityOfPage":{"@id":"https:\/\/www.asminternational.org\/edfas\/engineering-defects-could-transform-the-future-of-nanomaterials\/"},"wordCount":327,"publisher":{"@id":"https:\/\/www.asminternational.org\/edfas\/#organization"},"image":{"@id":"https:\/\/www.asminternational.org\/edfas\/engineering-defects-could-transform-the-future-of-nanomaterials\/#primaryimage"},"thumbnailUrl":"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2025\/11\/EDFAS__120425__UMinn__400.webp","articleSection":["Failure Analysis","materials characterization","Metallography and Microstructures","Nanotechnology","news","News Articles","Research and Development"],"inLanguage":"en-US"},{"@type":"WebPage","@id":"https:\/\/www.asminternational.org\/edfas\/engineering-defects-could-transform-the-future-of-nanomaterials\/","url":"https:\/\/www.asminternational.org\/edfas\/engineering-defects-could-transform-the-future-of-nanomaterials\/","name":"Engineering defects could transform the future of nanomaterials - Electronic Device Failure Analysis Society","isPartOf":{"@id":"https:\/\/www.asminternational.org\/edfas\/#website"},"primaryImageOfPage":{"@id":"https:\/\/www.asminternational.org\/edfas\/engineering-defects-could-transform-the-future-of-nanomaterials\/#primaryimage"},"image":{"@id":"https:\/\/www.asminternational.org\/edfas\/engineering-defects-could-transform-the-future-of-nanomaterials\/#primaryimage"},"thumbnailUrl":"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2025\/11\/EDFAS__120425__UMinn__400.webp","datePublished":"2025-11-27T21:01:03+00:00","dateModified":"2025-11-27T21:01:05+00:00","breadcrumb":{"@id":"https:\/\/www.asminternational.org\/edfas\/engineering-defects-could-transform-the-future-of-nanomaterials\/#breadcrumb"},"inLanguage":"en-US","potentialAction":[{"@type":"ReadAction","target":["https:\/\/www.asminternational.org\/edfas\/engineering-defects-could-transform-the-future-of-nanomaterials\/"]}]},{"@type":"ImageObject","inLanguage":"en-US","@id":"https:\/\/www.asminternational.org\/edfas\/engineering-defects-could-transform-the-future-of-nanomaterials\/#primaryimage","url":"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2025\/11\/EDFAS__120425__UMinn__400.webp","contentUrl":"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2025\/11\/EDFAS__120425__UMinn__400.webp","width":400,"height":294},{"@type":"BreadcrumbList","@id":"https:\/\/www.asminternational.org\/edfas\/engineering-defects-could-transform-the-future-of-nanomaterials\/#breadcrumb","itemListElement":[{"@type":"ListItem","position":1,"name":"Home","item":"https:\/\/www.asminternational.org\/edfas\/"},{"@type":"ListItem","position":2,"name":"Engineering defects could transform the future of nanomaterials"}]},{"@type":"WebSite","@id":"https:\/\/www.asminternational.org\/edfas\/#website","url":"https:\/\/www.asminternational.org\/edfas\/","name":"Electronic Device Failure Analysis Society","description":"Electronic Device Failure Analysis Society","publisher":{"@id":"https:\/\/www.asminternational.org\/edfas\/#organization"},"potentialAction":[{"@type":"SearchAction","target":{"@type":"EntryPoint","urlTemplate":"https:\/\/www.asminternational.org\/edfas\/?s={search_term_string}"},"query-input":{"@type":"PropertyValueSpecification","valueRequired":true,"valueName":"search_term_string"}}],"inLanguage":"en-US"},{"@type":"Organization","@id":"https:\/\/www.asminternational.org\/edfas\/#organization","name":"Electronic Device Failure Analysis Society","url":"https:\/\/www.asminternational.org\/edfas\/","logo":{"@type":"ImageObject","inLanguage":"en-US","@id":"https:\/\/www.asminternational.org\/edfas\/#\/schema\/logo\/image\/","url":"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2022\/10\/layout_set_logo.png","contentUrl":"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2022\/10\/layout_set_logo.png","width":360,"height":95,"caption":"Electronic Device Failure Analysis Society"},"image":{"@id":"https:\/\/www.asminternational.org\/edfas\/#\/schema\/logo\/image\/"}},{"@type":"Person","@id":"https:\/\/www.asminternational.org\/edfas\/#\/schema\/person\/135b2d8ac98a363d0bd9ec033a2904ad","name":"Debbie Sniderman","url":"https:\/\/www.asminternational.org\/edfas\/author\/dsniderman\/"}]}},"acf":[],"_links":{"self":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/posts\/9039","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/users\/63245"}],"replies":[{"embeddable":true,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/comments?post=9039"}],"version-history":[{"count":0,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/posts\/9039\/revisions"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/media\/9040"}],"wp:attachment":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/media?parent=9039"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/categories?post=9039"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/tags?post=9039"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}