{"id":9315,"date":"2026-04-17T01:02:01","date_gmt":"2026-04-17T05:02:01","guid":{"rendered":"https:\/\/staging.asminternational.org\/edfas\/cosmic-is-born-a-new-global-player-for-semiconductor-test-solutions-built-on-decades-of-experience\/"},"modified":"2026-04-17T05:02:02","modified_gmt":"2026-04-17T05:02:02","slug":"cosmic-is-born-a-new-global-player-for-semiconductor-test-solutions-built-on-decades-of-experience","status":"publish","type":"post","link":"https:\/\/www.asminternational.org\/edfas\/cosmic-is-born-a-new-global-player-for-semiconductor-test-solutions-built-on-decades-of-experience\/","title":{"rendered":"Cosmic is born: A new global player for semiconductor test solutions \u2013 built on decades of experience"},"content":{"rendered":"<p>The international growth journey launched in 2022 following Xenon Private Equity\u2019s investment in Microtest reaches a significant new milestone with the creation of Cosmic, the new name of the Group. This unites the different industrial companies integrated over the last few years under a single brand identity. Two complementary divisions will operate independently: Cosmic Equipment and Cosmic Services.<\/p>\n<p>Following the acquisitions of Test Inspire in the Netherlands, Gedec in Italy, and RoodMicrotec \u2013 a company listed on the Amsterdam Stock Exchange with a strong presence in the German market \u2013 the expansion continued in 2024 with the addition of ipTEST in the United Kingdom and Focused Test in the United States. Today, these combined capabilities converge into a single global brand, designed to enhance the technological heritage and distinctive expertise of each organization.<\/p>\n<p>With more than 400 professionals and 15 direct locations across Europe, the United States, and Asia, Cosmic combines the strength of an international structure with close proximity to local markets. Cosmic offers customers a solid, integrated, and highly specialized global presence.<\/p>\n<p>Cosmic operates through two distinct and complementary divisions, enabling the Group to address a comprehensive portfolio of semiconductor test solutions.<\/p>\n<p>The Cosmic Equipment division is dedicated to the design and manufacturing of advanced test solutions, including Automatic Test Equipment (ATE) systems for mixed-signal and high-power applications, as well as handlers and burn-in systems. This division represents the technological core of the Group and focuses on developing high-performance platforms capable of meeting the growing demands of the automotive, industrial, power, and high-reliability markets.<\/p>\n<p>The Cosmic Services division provides a comprehensive portfolio of test services, supporting customers throughout the entire device lifecycle. Cosmic Services offers everything from customized test solution development, ASIC design with design-for-testability (DFT) support, to wafer sort and final production testing. The division specializes in characterization and qualification testing in addition to burn-in and reliability testing. Cosmic ensures high-quality standards and fast execution for device troubleshooting projects ensured by advanced Failure &amp; Technology Analysis capabilities which enable precise identification of device failures through sophisticated failure analysis techniques, thereby supporting continuous improvement and product optimization processes.<\/p>\n<p>&nbsp;<\/p>\n<p>For more information:<\/p>\n<p>Cosmic Group<br \/>\n<a href=\"https:\/\/cosmic-group.com\">https:\/\/cosmic-group.com<\/a><\/p>\n","protected":false},"excerpt":{"rendered":"<p>Following an international expansion strategy initiated in 2022, a new global semiconductor test solutions group named Cosmic has been formed by uniting specialized industrial companies from Italy, the Netherlands, Germany, the United Kingdom, and the United States into two independent divisions: Cosmic Equipment and Cosmic Services.<\/p>\n","protected":false},"author":63245,"featured_media":9316,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[460,510,517,435,436,470],"tags":[],"class_list":["post-9315","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-failure-analysis","category-materials-characterization","category-microelectronic-failure-analysis","category-news","category-news-articles","category-testing-and-characterization"],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.9 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>Cosmic is born: A new global player for semiconductor test solutions \u2013 built on decades of experience - Electronic Device Failure Analysis Society<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.asminternational.org\/edfas\/cosmic-is-born-a-new-global-player-for-semiconductor-test-solutions-built-on-decades-of-experience\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Cosmic is born: A new global player for semiconductor test solutions \u2013 built on decades of experience - Electronic Device Failure Analysis Society\" \/>\n<meta property=\"og:description\" content=\"Following an international expansion strategy initiated in 2022, a new global semiconductor test solutions group named Cosmic has been formed by uniting specialized industrial companies from Italy, the Netherlands, Germany, the United Kingdom, and the United States into two independent divisions: Cosmic Equipment and Cosmic Services.\" \/>\n<meta property=\"og:url\" content=\"https:\/\/www.asminternational.org\/edfas\/cosmic-is-born-a-new-global-player-for-semiconductor-test-solutions-built-on-decades-of-experience\/\" \/>\n<meta property=\"og:site_name\" content=\"Electronic Device Failure Analysis Society\" \/>\n<meta property=\"article:published_time\" content=\"2026-04-17T05:02:01+00:00\" \/>\n<meta property=\"article:modified_time\" content=\"2026-04-17T05:02:02+00:00\" \/>\n<meta property=\"og:image\" content=\"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2026\/04\/EDFAS__042326__Cosmic__400.webp\" \/>\n\t<meta property=\"og:image:width\" content=\"400\" \/>\n\t<meta property=\"og:image:height\" content=\"107\" \/>\n\t<meta property=\"og:image:type\" content=\"image\/jpeg\" \/>\n<meta name=\"author\" content=\"Debbie Sniderman\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"Written by\" \/>\n\t<meta name=\"twitter:data1\" content=\"Debbie Sniderman\" \/>\n\t<meta name=\"twitter:label2\" content=\"Est. reading time\" \/>\n\t<meta name=\"twitter:data2\" content=\"2 minutes\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\\\/\\\/schema.org\",\"@graph\":[{\"@type\":\"Article\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/cosmic-is-born-a-new-global-player-for-semiconductor-test-solutions-built-on-decades-of-experience\\\/#article\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/cosmic-is-born-a-new-global-player-for-semiconductor-test-solutions-built-on-decades-of-experience\\\/\"},\"author\":{\"name\":\"Debbie Sniderman\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#\\\/schema\\\/person\\\/135b2d8ac98a363d0bd9ec033a2904ad\"},\"headline\":\"Cosmic is born: A new global player for semiconductor test solutions \u2013 built on decades of experience\",\"datePublished\":\"2026-04-17T05:02:01+00:00\",\"dateModified\":\"2026-04-17T05:02:02+00:00\",\"mainEntityOfPage\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/cosmic-is-born-a-new-global-player-for-semiconductor-test-solutions-built-on-decades-of-experience\\\/\"},\"wordCount\":370,\"publisher\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#organization\"},\"image\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/cosmic-is-born-a-new-global-player-for-semiconductor-test-solutions-built-on-decades-of-experience\\\/#primaryimage\"},\"thumbnailUrl\":\"https:\\\/\\\/cdn-prd-main.asm-media.cloud\\\/uploads\\\/sites\\\/41\\\/2026\\\/04\\\/EDFAS__042326__Cosmic__400.webp\",\"articleSection\":[\"Failure Analysis\",\"materials characterization\",\"Microelectronic Failure Analysis\",\"news\",\"News Articles\",\"Testing and Characterization\"],\"inLanguage\":\"en-US\"},{\"@type\":\"WebPage\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/cosmic-is-born-a-new-global-player-for-semiconductor-test-solutions-built-on-decades-of-experience\\\/\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/cosmic-is-born-a-new-global-player-for-semiconductor-test-solutions-built-on-decades-of-experience\\\/\",\"name\":\"Cosmic is born: A new global player for semiconductor test solutions \u2013 built on decades of experience - Electronic Device Failure Analysis Society\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#website\"},\"primaryImageOfPage\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/cosmic-is-born-a-new-global-player-for-semiconductor-test-solutions-built-on-decades-of-experience\\\/#primaryimage\"},\"image\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/cosmic-is-born-a-new-global-player-for-semiconductor-test-solutions-built-on-decades-of-experience\\\/#primaryimage\"},\"thumbnailUrl\":\"https:\\\/\\\/cdn-prd-main.asm-media.cloud\\\/uploads\\\/sites\\\/41\\\/2026\\\/04\\\/EDFAS__042326__Cosmic__400.webp\",\"datePublished\":\"2026-04-17T05:02:01+00:00\",\"dateModified\":\"2026-04-17T05:02:02+00:00\",\"breadcrumb\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/cosmic-is-born-a-new-global-player-for-semiconductor-test-solutions-built-on-decades-of-experience\\\/#breadcrumb\"},\"inLanguage\":\"en-US\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/cosmic-is-born-a-new-global-player-for-semiconductor-test-solutions-built-on-decades-of-experience\\\/\"]}]},{\"@type\":\"ImageObject\",\"inLanguage\":\"en-US\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/cosmic-is-born-a-new-global-player-for-semiconductor-test-solutions-built-on-decades-of-experience\\\/#primaryimage\",\"url\":\"https:\\\/\\\/cdn-prd-main.asm-media.cloud\\\/uploads\\\/sites\\\/41\\\/2026\\\/04\\\/EDFAS__042326__Cosmic__400.webp\",\"contentUrl\":\"https:\\\/\\\/cdn-prd-main.asm-media.cloud\\\/uploads\\\/sites\\\/41\\\/2026\\\/04\\\/EDFAS__042326__Cosmic__400.webp\",\"width\":400,\"height\":107},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/cosmic-is-born-a-new-global-player-for-semiconductor-test-solutions-built-on-decades-of-experience\\\/#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Home\",\"item\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"Cosmic is born: A new global player for semiconductor test solutions \u2013 built on decades of experience\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#website\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/\",\"name\":\"Electronic Device Failure Analysis Society\",\"description\":\"Electronic Device Failure Analysis Society\",\"publisher\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#organization\"},\"potentialAction\":[{\"@type\":\"SearchAction\",\"target\":{\"@type\":\"EntryPoint\",\"urlTemplate\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/?s={search_term_string}\"},\"query-input\":{\"@type\":\"PropertyValueSpecification\",\"valueRequired\":true,\"valueName\":\"search_term_string\"}}],\"inLanguage\":\"en-US\"},{\"@type\":\"Organization\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#organization\",\"name\":\"Electronic Device Failure Analysis Society\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/\",\"logo\":{\"@type\":\"ImageObject\",\"inLanguage\":\"en-US\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#\\\/schema\\\/logo\\\/image\\\/\",\"url\":\"https:\\\/\\\/cdn-prd-main.asm-media.cloud\\\/uploads\\\/sites\\\/41\\\/2022\\\/10\\\/layout_set_logo.png\",\"contentUrl\":\"https:\\\/\\\/cdn-prd-main.asm-media.cloud\\\/uploads\\\/sites\\\/41\\\/2022\\\/10\\\/layout_set_logo.png\",\"width\":360,\"height\":95,\"caption\":\"Electronic Device Failure Analysis Society\"},\"image\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#\\\/schema\\\/logo\\\/image\\\/\"}},{\"@type\":\"Person\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#\\\/schema\\\/person\\\/135b2d8ac98a363d0bd9ec033a2904ad\",\"name\":\"Debbie Sniderman\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/author\\\/dsniderman\\\/\"}]}<\/script>\n<!-- \/ Yoast SEO plugin. -->","yoast_head_json":{"title":"Cosmic is born: A new global player for semiconductor test solutions \u2013 built on decades of experience - Electronic Device Failure Analysis Society","robots":{"index":"index","follow":"follow","max-snippet":"max-snippet:-1","max-image-preview":"max-image-preview:large","max-video-preview":"max-video-preview:-1"},"canonical":"https:\/\/www.asminternational.org\/edfas\/cosmic-is-born-a-new-global-player-for-semiconductor-test-solutions-built-on-decades-of-experience\/","og_locale":"en_US","og_type":"article","og_title":"Cosmic is born: A new global player for semiconductor test solutions \u2013 built on decades of experience - Electronic Device Failure Analysis Society","og_description":"Following an international expansion strategy initiated in 2022, a new global semiconductor test solutions group named Cosmic has been formed by uniting specialized industrial companies from Italy, the Netherlands, Germany, the United Kingdom, and the United States into two independent divisions: Cosmic Equipment and Cosmic Services.","og_url":"https:\/\/www.asminternational.org\/edfas\/cosmic-is-born-a-new-global-player-for-semiconductor-test-solutions-built-on-decades-of-experience\/","og_site_name":"Electronic Device Failure Analysis Society","article_published_time":"2026-04-17T05:02:01+00:00","article_modified_time":"2026-04-17T05:02:02+00:00","og_image":[{"width":400,"height":107,"url":"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2026\/04\/EDFAS__042326__Cosmic__400.webp","type":"image\/jpeg"}],"author":"Debbie Sniderman","twitter_card":"summary_large_image","twitter_misc":{"Written by":"Debbie Sniderman","Est. reading time":"2 minutes"},"schema":{"@context":"https:\/\/schema.org","@graph":[{"@type":"Article","@id":"https:\/\/www.asminternational.org\/edfas\/cosmic-is-born-a-new-global-player-for-semiconductor-test-solutions-built-on-decades-of-experience\/#article","isPartOf":{"@id":"https:\/\/www.asminternational.org\/edfas\/cosmic-is-born-a-new-global-player-for-semiconductor-test-solutions-built-on-decades-of-experience\/"},"author":{"name":"Debbie Sniderman","@id":"https:\/\/www.asminternational.org\/edfas\/#\/schema\/person\/135b2d8ac98a363d0bd9ec033a2904ad"},"headline":"Cosmic is born: A new global player for semiconductor test solutions \u2013 built on decades of experience","datePublished":"2026-04-17T05:02:01+00:00","dateModified":"2026-04-17T05:02:02+00:00","mainEntityOfPage":{"@id":"https:\/\/www.asminternational.org\/edfas\/cosmic-is-born-a-new-global-player-for-semiconductor-test-solutions-built-on-decades-of-experience\/"},"wordCount":370,"publisher":{"@id":"https:\/\/www.asminternational.org\/edfas\/#organization"},"image":{"@id":"https:\/\/www.asminternational.org\/edfas\/cosmic-is-born-a-new-global-player-for-semiconductor-test-solutions-built-on-decades-of-experience\/#primaryimage"},"thumbnailUrl":"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2026\/04\/EDFAS__042326__Cosmic__400.webp","articleSection":["Failure Analysis","materials characterization","Microelectronic Failure Analysis","news","News Articles","Testing and Characterization"],"inLanguage":"en-US"},{"@type":"WebPage","@id":"https:\/\/www.asminternational.org\/edfas\/cosmic-is-born-a-new-global-player-for-semiconductor-test-solutions-built-on-decades-of-experience\/","url":"https:\/\/www.asminternational.org\/edfas\/cosmic-is-born-a-new-global-player-for-semiconductor-test-solutions-built-on-decades-of-experience\/","name":"Cosmic is born: A new global player for semiconductor test solutions \u2013 built on decades of experience - Electronic Device Failure Analysis Society","isPartOf":{"@id":"https:\/\/www.asminternational.org\/edfas\/#website"},"primaryImageOfPage":{"@id":"https:\/\/www.asminternational.org\/edfas\/cosmic-is-born-a-new-global-player-for-semiconductor-test-solutions-built-on-decades-of-experience\/#primaryimage"},"image":{"@id":"https:\/\/www.asminternational.org\/edfas\/cosmic-is-born-a-new-global-player-for-semiconductor-test-solutions-built-on-decades-of-experience\/#primaryimage"},"thumbnailUrl":"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2026\/04\/EDFAS__042326__Cosmic__400.webp","datePublished":"2026-04-17T05:02:01+00:00","dateModified":"2026-04-17T05:02:02+00:00","breadcrumb":{"@id":"https:\/\/www.asminternational.org\/edfas\/cosmic-is-born-a-new-global-player-for-semiconductor-test-solutions-built-on-decades-of-experience\/#breadcrumb"},"inLanguage":"en-US","potentialAction":[{"@type":"ReadAction","target":["https:\/\/www.asminternational.org\/edfas\/cosmic-is-born-a-new-global-player-for-semiconductor-test-solutions-built-on-decades-of-experience\/"]}]},{"@type":"ImageObject","inLanguage":"en-US","@id":"https:\/\/www.asminternational.org\/edfas\/cosmic-is-born-a-new-global-player-for-semiconductor-test-solutions-built-on-decades-of-experience\/#primaryimage","url":"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2026\/04\/EDFAS__042326__Cosmic__400.webp","contentUrl":"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2026\/04\/EDFAS__042326__Cosmic__400.webp","width":400,"height":107},{"@type":"BreadcrumbList","@id":"https:\/\/www.asminternational.org\/edfas\/cosmic-is-born-a-new-global-player-for-semiconductor-test-solutions-built-on-decades-of-experience\/#breadcrumb","itemListElement":[{"@type":"ListItem","position":1,"name":"Home","item":"https:\/\/www.asminternational.org\/edfas\/"},{"@type":"ListItem","position":2,"name":"Cosmic is born: A new global player for semiconductor test solutions \u2013 built on decades of experience"}]},{"@type":"WebSite","@id":"https:\/\/www.asminternational.org\/edfas\/#website","url":"https:\/\/www.asminternational.org\/edfas\/","name":"Electronic Device Failure Analysis Society","description":"Electronic Device Failure Analysis Society","publisher":{"@id":"https:\/\/www.asminternational.org\/edfas\/#organization"},"potentialAction":[{"@type":"SearchAction","target":{"@type":"EntryPoint","urlTemplate":"https:\/\/www.asminternational.org\/edfas\/?s={search_term_string}"},"query-input":{"@type":"PropertyValueSpecification","valueRequired":true,"valueName":"search_term_string"}}],"inLanguage":"en-US"},{"@type":"Organization","@id":"https:\/\/www.asminternational.org\/edfas\/#organization","name":"Electronic Device Failure Analysis Society","url":"https:\/\/www.asminternational.org\/edfas\/","logo":{"@type":"ImageObject","inLanguage":"en-US","@id":"https:\/\/www.asminternational.org\/edfas\/#\/schema\/logo\/image\/","url":"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2022\/10\/layout_set_logo.png","contentUrl":"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2022\/10\/layout_set_logo.png","width":360,"height":95,"caption":"Electronic Device Failure Analysis Society"},"image":{"@id":"https:\/\/www.asminternational.org\/edfas\/#\/schema\/logo\/image\/"}},{"@type":"Person","@id":"https:\/\/www.asminternational.org\/edfas\/#\/schema\/person\/135b2d8ac98a363d0bd9ec033a2904ad","name":"Debbie Sniderman","url":"https:\/\/www.asminternational.org\/edfas\/author\/dsniderman\/"}]}},"acf":[],"_links":{"self":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/posts\/9315","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/users\/63245"}],"replies":[{"embeddable":true,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/comments?post=9315"}],"version-history":[{"count":0,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/posts\/9315\/revisions"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/media\/9316"}],"wp:attachment":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/media?parent=9315"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/categories?post=9315"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/tags?post=9315"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}