{"id":1632,"date":"2015-09-10T16:42:04","date_gmt":"2015-09-10T16:42:04","guid":{"rendered":"https:\/\/staging.asminternational.org\/edfas\/video\/the-history-of-the-united-states-capitol\/"},"modified":"2015-09-10T16:42:04","modified_gmt":"2015-09-10T16:42:04","slug":"the-history-of-the-united-states-capitol","status":"publish","type":"video","link":"https:\/\/www.asminternational.org\/edfas\/videos\/-\/journal_content\/56\/10192\/25769167\/VIDEO\/","title":{"rendered":"The History of the United States Capitol"},"content":{"rendered":"<p>\n\tThe United States Capitol in Washington, D.C., is among the most architecturally impressive and symbolically important buildings in the world. It has housed the meeting chambers of the Senate and the House of Representatives for almost two centuries. Since the laying of the cornerstone in 1793, the Capitol has been built, burnt, rebuilt, extended, and restored; today, it stands as a monument not only to its builders but also to the American people and their government<\/p>\n","protected":false},"featured_media":58804,"template":"","class_list":["post-1632","video","type-video","status-publish","has-post-thumbnail","hentry"],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.9 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>The History of the United States Capitol - Electronic Device Failure Analysis Society<\/title>\n<meta name=\"robots\" content=\"noindex, follow\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"The History of the United States Capitol - Electronic Device Failure Analysis Society\" \/>\n<meta property=\"og:description\" content=\"Video history of the Capitol building.\" \/>\n<meta property=\"og:url\" content=\"https:\/\/www.asminternational.org\/edfas\/videos\/-\/journal_content\/56\/10192\/25769167\/VIDEO\/\" \/>\n<meta property=\"og:site_name\" content=\"Electronic Device Failure Analysis Society\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\\\/\\\/schema.org\",\"@graph\":[{\"@type\":\"WebPage\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/videos\\\/-\\\/journal_content\\\/56\\\/10192\\\/25769167\\\/VIDEO\\\/\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/videos\\\/-\\\/journal_content\\\/56\\\/10192\\\/25769167\\\/VIDEO\\\/\",\"name\":\"The History of the United States Capitol - Electronic Device Failure Analysis Society\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#website\"},\"primaryImageOfPage\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/videos\\\/-\\\/journal_content\\\/56\\\/10192\\\/25769167\\\/VIDEO\\\/#primaryimage\"},\"image\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/videos\\\/-\\\/journal_content\\\/56\\\/10192\\\/25769167\\\/VIDEO\\\/#primaryimage\"},\"thumbnailUrl\":\"\",\"datePublished\":\"2015-09-10T16:42:04+00:00\",\"breadcrumb\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/videos\\\/-\\\/journal_content\\\/56\\\/10192\\\/25769167\\\/VIDEO\\\/#breadcrumb\"},\"inLanguage\":\"en-US\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/videos\\\/-\\\/journal_content\\\/56\\\/10192\\\/25769167\\\/VIDEO\\\/\"]}]},{\"@type\":\"ImageObject\",\"inLanguage\":\"en-US\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/videos\\\/-\\\/journal_content\\\/56\\\/10192\\\/25769167\\\/VIDEO\\\/#primaryimage\",\"url\":\"\",\"contentUrl\":\"\"},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/videos\\\/-\\\/journal_content\\\/56\\\/10192\\\/25769167\\\/VIDEO\\\/#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Home\",\"item\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"The History of the United States Capitol\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#website\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/\",\"name\":\"Electronic Device Failure Analysis Society\",\"description\":\"Electronic Device Failure Analysis Society\",\"publisher\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#organization\"},\"potentialAction\":[{\"@type\":\"SearchAction\",\"target\":{\"@type\":\"EntryPoint\",\"urlTemplate\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/?s={search_term_string}\"},\"query-input\":{\"@type\":\"PropertyValueSpecification\",\"valueRequired\":true,\"valueName\":\"search_term_string\"}}],\"inLanguage\":\"en-US\"},{\"@type\":\"Organization\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#organization\",\"name\":\"Electronic Device Failure Analysis Society\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/\",\"logo\":{\"@type\":\"ImageObject\",\"inLanguage\":\"en-US\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#\\\/schema\\\/logo\\\/image\\\/\",\"url\":\"https:\\\/\\\/cdn-prd-main.asm-media.cloud\\\/uploads\\\/sites\\\/41\\\/2022\\\/10\\\/layout_set_logo.png\",\"contentUrl\":\"https:\\\/\\\/cdn-prd-main.asm-media.cloud\\\/uploads\\\/sites\\\/41\\\/2022\\\/10\\\/layout_set_logo.png\",\"width\":360,\"height\":95,\"caption\":\"Electronic Device Failure Analysis Society\"},\"image\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#\\\/schema\\\/logo\\\/image\\\/\"}}]}<\/script>\n<!-- \/ Yoast SEO plugin. -->","yoast_head_json":{"title":"The History of the United States Capitol - Electronic Device Failure Analysis Society","robots":{"index":"noindex","follow":"follow"},"og_locale":"en_US","og_type":"article","og_title":"The History of the United States Capitol - Electronic Device Failure Analysis Society","og_description":"Video history of the Capitol building.","og_url":"https:\/\/www.asminternational.org\/edfas\/videos\/-\/journal_content\/56\/10192\/25769167\/VIDEO\/","og_site_name":"Electronic Device Failure Analysis Society","twitter_card":"summary_large_image","schema":{"@context":"https:\/\/schema.org","@graph":[{"@type":"WebPage","@id":"https:\/\/www.asminternational.org\/edfas\/videos\/-\/journal_content\/56\/10192\/25769167\/VIDEO\/","url":"https:\/\/www.asminternational.org\/edfas\/videos\/-\/journal_content\/56\/10192\/25769167\/VIDEO\/","name":"The History of the United States Capitol - Electronic Device Failure Analysis Society","isPartOf":{"@id":"https:\/\/www.asminternational.org\/edfas\/#website"},"primaryImageOfPage":{"@id":"https:\/\/www.asminternational.org\/edfas\/videos\/-\/journal_content\/56\/10192\/25769167\/VIDEO\/#primaryimage"},"image":{"@id":"https:\/\/www.asminternational.org\/edfas\/videos\/-\/journal_content\/56\/10192\/25769167\/VIDEO\/#primaryimage"},"thumbnailUrl":"","datePublished":"2015-09-10T16:42:04+00:00","breadcrumb":{"@id":"https:\/\/www.asminternational.org\/edfas\/videos\/-\/journal_content\/56\/10192\/25769167\/VIDEO\/#breadcrumb"},"inLanguage":"en-US","potentialAction":[{"@type":"ReadAction","target":["https:\/\/www.asminternational.org\/edfas\/videos\/-\/journal_content\/56\/10192\/25769167\/VIDEO\/"]}]},{"@type":"ImageObject","inLanguage":"en-US","@id":"https:\/\/www.asminternational.org\/edfas\/videos\/-\/journal_content\/56\/10192\/25769167\/VIDEO\/#primaryimage","url":"","contentUrl":""},{"@type":"BreadcrumbList","@id":"https:\/\/www.asminternational.org\/edfas\/videos\/-\/journal_content\/56\/10192\/25769167\/VIDEO\/#breadcrumb","itemListElement":[{"@type":"ListItem","position":1,"name":"Home","item":"https:\/\/www.asminternational.org\/edfas\/"},{"@type":"ListItem","position":2,"name":"The History of the United States Capitol"}]},{"@type":"WebSite","@id":"https:\/\/www.asminternational.org\/edfas\/#website","url":"https:\/\/www.asminternational.org\/edfas\/","name":"Electronic Device Failure Analysis Society","description":"Electronic Device Failure Analysis Society","publisher":{"@id":"https:\/\/www.asminternational.org\/edfas\/#organization"},"potentialAction":[{"@type":"SearchAction","target":{"@type":"EntryPoint","urlTemplate":"https:\/\/www.asminternational.org\/edfas\/?s={search_term_string}"},"query-input":{"@type":"PropertyValueSpecification","valueRequired":true,"valueName":"search_term_string"}}],"inLanguage":"en-US"},{"@type":"Organization","@id":"https:\/\/www.asminternational.org\/edfas\/#organization","name":"Electronic Device Failure Analysis Society","url":"https:\/\/www.asminternational.org\/edfas\/","logo":{"@type":"ImageObject","inLanguage":"en-US","@id":"https:\/\/www.asminternational.org\/edfas\/#\/schema\/logo\/image\/","url":"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2022\/10\/layout_set_logo.png","contentUrl":"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2022\/10\/layout_set_logo.png","width":360,"height":95,"caption":"Electronic Device Failure Analysis Society"},"image":{"@id":"https:\/\/www.asminternational.org\/edfas\/#\/schema\/logo\/image\/"}}]}},"acf":[],"_links":{"self":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/video\/1632","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/video"}],"about":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/types\/video"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/"}],"wp:attachment":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/media?parent=1632"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}