{"id":1657,"date":"2016-01-06T14:18:52","date_gmt":"2016-01-06T14:18:52","guid":{"rendered":"https:\/\/staging.asminternational.org\/edfas\/video\/head-health-challenge-iii-semifinalists-selected\/"},"modified":"2016-01-06T14:18:52","modified_gmt":"2016-01-06T14:18:52","slug":"head-health-challenge-iii-semifinalists-selected","status":"publish","type":"video","link":"https:\/\/www.asminternational.org\/edfas\/videos\/-\/journal_content\/56\/10192\/26093456\/VIDEO\/","title":{"rendered":"Head Health Challenge III: Semifinalists Selected"},"content":{"rendered":"

\n\tThe National Football League (NFL), Under Armour, General Electric , and the U.S. Department of Commerce’s National Institute of Standards and Technology (NIST), recently announced the five winners of Head Health Challenge III, an open innovation competition to support the discovery, design, and development of advanced materials that better absorb or dissipate impact.<\/p>\n","protected":false},"featured_media":58829,"template":"","class_list":["post-1657","video","type-video","status-publish","has-post-thumbnail","hentry"],"yoast_head":"\nHead Health Challenge III: Semifinalists Selected - Electronic Device Failure Analysis Society<\/title>\n<meta name=\"robots\" content=\"noindex, follow\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Head Health Challenge III: Semifinalists Selected - Electronic Device Failure Analysis Society\" \/>\n<meta property=\"og:description\" content=\"The National Football League (NFL), Under Armour, General Electric , and the U.S. Department of Commerce's National Institute of Standards and Technology (NIST), recently announced the five winners of Head Health Challenge III, an open innovation competition to support the discovery, design, and development of advanced materials that better absorb or dissipate impact.\" \/>\n<meta property=\"og:url\" content=\"https:\/\/www.asminternational.org\/edfas\/videos\/-\/journal_content\/56\/10192\/26093456\/VIDEO\/\" \/>\n<meta property=\"og:site_name\" content=\"Electronic Device Failure Analysis Society\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\\\/\\\/schema.org\",\"@graph\":[{\"@type\":\"WebPage\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/videos\\\/-\\\/journal_content\\\/56\\\/10192\\\/26093456\\\/VIDEO\\\/\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/videos\\\/-\\\/journal_content\\\/56\\\/10192\\\/26093456\\\/VIDEO\\\/\",\"name\":\"Head Health Challenge III: Semifinalists Selected - Electronic Device Failure Analysis Society\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#website\"},\"primaryImageOfPage\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/videos\\\/-\\\/journal_content\\\/56\\\/10192\\\/26093456\\\/VIDEO\\\/#primaryimage\"},\"image\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/videos\\\/-\\\/journal_content\\\/56\\\/10192\\\/26093456\\\/VIDEO\\\/#primaryimage\"},\"thumbnailUrl\":\"\",\"datePublished\":\"2016-01-06T14:18:52+00:00\",\"breadcrumb\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/videos\\\/-\\\/journal_content\\\/56\\\/10192\\\/26093456\\\/VIDEO\\\/#breadcrumb\"},\"inLanguage\":\"en-US\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/videos\\\/-\\\/journal_content\\\/56\\\/10192\\\/26093456\\\/VIDEO\\\/\"]}]},{\"@type\":\"ImageObject\",\"inLanguage\":\"en-US\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/videos\\\/-\\\/journal_content\\\/56\\\/10192\\\/26093456\\\/VIDEO\\\/#primaryimage\",\"url\":\"\",\"contentUrl\":\"\"},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/videos\\\/-\\\/journal_content\\\/56\\\/10192\\\/26093456\\\/VIDEO\\\/#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Home\",\"item\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"Head Health Challenge III: Semifinalists Selected\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#website\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/\",\"name\":\"Electronic Device Failure Analysis Society\",\"description\":\"Electronic Device Failure Analysis Society\",\"publisher\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#organization\"},\"potentialAction\":[{\"@type\":\"SearchAction\",\"target\":{\"@type\":\"EntryPoint\",\"urlTemplate\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/?s={search_term_string}\"},\"query-input\":{\"@type\":\"PropertyValueSpecification\",\"valueRequired\":true,\"valueName\":\"search_term_string\"}}],\"inLanguage\":\"en-US\"},{\"@type\":\"Organization\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#organization\",\"name\":\"Electronic Device Failure Analysis Society\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/\",\"logo\":{\"@type\":\"ImageObject\",\"inLanguage\":\"en-US\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#\\\/schema\\\/logo\\\/image\\\/\",\"url\":\"https:\\\/\\\/cdn-prd-main.asm-media.cloud\\\/uploads\\\/sites\\\/41\\\/2022\\\/10\\\/layout_set_logo.png\",\"contentUrl\":\"https:\\\/\\\/cdn-prd-main.asm-media.cloud\\\/uploads\\\/sites\\\/41\\\/2022\\\/10\\\/layout_set_logo.png\",\"width\":360,\"height\":95,\"caption\":\"Electronic Device Failure Analysis Society\"},\"image\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#\\\/schema\\\/logo\\\/image\\\/\"}}]}<\/script>\n<!-- \/ Yoast SEO plugin. -->","yoast_head_json":{"title":"Head Health Challenge III: Semifinalists Selected - Electronic Device Failure Analysis Society","robots":{"index":"noindex","follow":"follow"},"og_locale":"en_US","og_type":"article","og_title":"Head Health Challenge III: Semifinalists Selected - Electronic Device Failure Analysis Society","og_description":"The National Football League (NFL), Under Armour, General Electric , and the U.S. Department of Commerce's National Institute of Standards and Technology (NIST), recently announced the five winners of Head Health Challenge III, an open innovation competition to support the discovery, design, and development of advanced materials that better absorb or dissipate impact.","og_url":"https:\/\/www.asminternational.org\/edfas\/videos\/-\/journal_content\/56\/10192\/26093456\/VIDEO\/","og_site_name":"Electronic Device Failure Analysis Society","twitter_card":"summary_large_image","schema":{"@context":"https:\/\/schema.org","@graph":[{"@type":"WebPage","@id":"https:\/\/www.asminternational.org\/edfas\/videos\/-\/journal_content\/56\/10192\/26093456\/VIDEO\/","url":"https:\/\/www.asminternational.org\/edfas\/videos\/-\/journal_content\/56\/10192\/26093456\/VIDEO\/","name":"Head Health Challenge III: Semifinalists Selected - Electronic Device Failure Analysis Society","isPartOf":{"@id":"https:\/\/www.asminternational.org\/edfas\/#website"},"primaryImageOfPage":{"@id":"https:\/\/www.asminternational.org\/edfas\/videos\/-\/journal_content\/56\/10192\/26093456\/VIDEO\/#primaryimage"},"image":{"@id":"https:\/\/www.asminternational.org\/edfas\/videos\/-\/journal_content\/56\/10192\/26093456\/VIDEO\/#primaryimage"},"thumbnailUrl":"","datePublished":"2016-01-06T14:18:52+00:00","breadcrumb":{"@id":"https:\/\/www.asminternational.org\/edfas\/videos\/-\/journal_content\/56\/10192\/26093456\/VIDEO\/#breadcrumb"},"inLanguage":"en-US","potentialAction":[{"@type":"ReadAction","target":["https:\/\/www.asminternational.org\/edfas\/videos\/-\/journal_content\/56\/10192\/26093456\/VIDEO\/"]}]},{"@type":"ImageObject","inLanguage":"en-US","@id":"https:\/\/www.asminternational.org\/edfas\/videos\/-\/journal_content\/56\/10192\/26093456\/VIDEO\/#primaryimage","url":"","contentUrl":""},{"@type":"BreadcrumbList","@id":"https:\/\/www.asminternational.org\/edfas\/videos\/-\/journal_content\/56\/10192\/26093456\/VIDEO\/#breadcrumb","itemListElement":[{"@type":"ListItem","position":1,"name":"Home","item":"https:\/\/www.asminternational.org\/edfas\/"},{"@type":"ListItem","position":2,"name":"Head Health Challenge III: Semifinalists Selected"}]},{"@type":"WebSite","@id":"https:\/\/www.asminternational.org\/edfas\/#website","url":"https:\/\/www.asminternational.org\/edfas\/","name":"Electronic Device Failure Analysis Society","description":"Electronic Device Failure Analysis Society","publisher":{"@id":"https:\/\/www.asminternational.org\/edfas\/#organization"},"potentialAction":[{"@type":"SearchAction","target":{"@type":"EntryPoint","urlTemplate":"https:\/\/www.asminternational.org\/edfas\/?s={search_term_string}"},"query-input":{"@type":"PropertyValueSpecification","valueRequired":true,"valueName":"search_term_string"}}],"inLanguage":"en-US"},{"@type":"Organization","@id":"https:\/\/www.asminternational.org\/edfas\/#organization","name":"Electronic Device Failure Analysis Society","url":"https:\/\/www.asminternational.org\/edfas\/","logo":{"@type":"ImageObject","inLanguage":"en-US","@id":"https:\/\/www.asminternational.org\/edfas\/#\/schema\/logo\/image\/","url":"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2022\/10\/layout_set_logo.png","contentUrl":"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2022\/10\/layout_set_logo.png","width":360,"height":95,"caption":"Electronic Device Failure Analysis Society"},"image":{"@id":"https:\/\/www.asminternational.org\/edfas\/#\/schema\/logo\/image\/"}}]}},"acf":[],"_links":{"self":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/video\/1657","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/video"}],"about":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/types\/video"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/"}],"wp:attachment":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/media?parent=1657"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}