Bruker stylus profiler enables 300-mm wafer analysis

Published: January 21, 2014

Bruker Nanosurfaces Division, Billerica, Mass., introduces the Dektak XTL Stylus Profiler, extending its stylus profilometry capabilities to 200 and 300 mm semiconductor wafer fabs and next-generation touch panel manufacturers.

News, Magazine & Media / Industry News

Industry consortium to develop secure semiconductors and systems

Published: January 21, 2014

Semiconductor Research Corporation (SRC), Research Triangle Park, N.C., has launched a new initiative on Trustworthy and Secure Semiconductors and Systems (T3S).

News, Magazine & Media / Industry News

Cadence Incisive 13.2 verification platform enables faster performance

Published: January 21, 2014

Cadence Design Systems, Inc., San Jose, Calif., introduces a faster version of the Incisive functional verification platform.

News, Magazine & Media / Industry News

Imec celebrates 30 years of nanoelectronics industry innovation

Published: January 21, 2014

Imec, Belgium, celebrates its 30th anniversary. Founded in 1984 as a non-profit organization, it has enabled notable advancements in global semiconductor chip manufacturing in the three decades since its founding.

News, Magazine & Media / Industry News

Soliciting EDFAS Board Nominations

Published: January 21, 2014

EDFAS is soliciting nominations for candidates for the EDFAS Board of Directors (BOD). Terms are for four years, beginning September 1, 2014 and ending August 31, 2018. All potential candidates for the BOD must be members in good standing of EDFAS at the time of their candidacy.

News, Magazine & Media / Industry News

Micromeritics 3Flex surface characterization analyzer enables multiple analyses

Published: January 21, 2014

Micromeritics Instrument Corp., Norcross, Ga., introduces the 3Flex Surface Characterization Analyzer.

News, Magazine & Media / Industry News

Park XE15 atomic force microscope enables automatic imaging of up to nine samples

Published: January 20, 2014

Park Systems, Santa Clara, Calif., announces the debut of Park XE15, a powerfully versatile atomic force microscope featuring a unique MultiSample scan.

News, Magazine & Media / Industry News

Asylum Research announces the fourth Euro AFM Forum

Published: January 20, 2014

Asylum Research, Santa Barbara, Calif., an Oxford Instruments company, in conjunction with Georg-August Universität Göttingen, Germany, announces the fourth Euro AFM Forum to be held March 17-19, 2014.

News, Magazine & Media / Industry News

Time-dependent spectroscopy enables monitoring microscopic samples

Published: January 20, 2014

Craic Technologies, San Dimas, Calif., introduces Craic TimePro kinetic spectroscopy software. It is designed to be used with Craic Technology's microspectrophotometers and their controlling Lambdafire software.

News, Magazine & Media / Industry News

Multiple memory chips connected in shingle-stack configuration with ultra-short wirebonds

Published: January 20, 2014

Invensas Corp., San Jose, Calif., announces its latest xFD products solutions. The xFD technology connects multiple memory chips in a face-down shingle-stack configuration using ultra-short wirebonds.

News, Magazine & Media / Industry News