Shimadzu Corporation, Japan, launched the inspeXio 7000 microfocus X-ray CT system, a high-end industrial model that builds on the high-resolution, high-contrast imaging capabilities of its predecessor, inspeXio SMX-225CT FPD HR Plus, while offering improved image quality through new scanning modes and a larger maximum sample capacity.<\/p>\n
Microfocus X-ray CT systems use X-rays to capture images of the interior of objects and generate three-dimensional images non-destructively. The system rotates a metal or plastic sample while acquiring X-ray transmission images and then digitally processes them to reveal the object\u2019s internal structure. This non-destructive capability makes these systems ideal for research, development, and quality control in fields such as lithium-ion batteries, electronic devices, and automotive components\u2014supporting advanced manufacturing processes.<\/p>\n
The inspeXio 7000 combines Shimadzu\u2019s proprietary microfocus X-ray generator and a large flat panel detector with a Shimadzu-developed ultra-fast computing system. This allows users to quickly and easily acquire cross-sectional images with a large field of view, high resolution, and high contrast. Furthermore, the system features a scanning mode that enables high-quality, low-noise CT data to be acquired even for samples that are difficult for X-rays to penetrate, allowing observation of high-quality images. The system also offers improved sample handling capacity and incorporates an internal monitoring system with a wide-angle camera, further enhancing ease-of-use.<\/p>\n
Features
\n1. Large Field of View, High Resolution, High Contrast
\nEquipped with Shimadzu\u2019s proprietary microfocus X-ray generator and a large, high-resolution flat panel detector, the system acquires images with a large field of view, high resolution, and high contrast. Combined with Shimadzu\u2019s high-speed computing technology, users can quickly and easily observe internal structures.<\/p>\n
2. High-Quality Cross-Sectional Images with Reduced Noise
\nThe system is equipped with a standard scanning mode that enables acquisition of low-noise CT data even for samples that are difficult for X-ray to penetrate, such as large lithium-ion batteries. When used in combination with image processing filters in the dedicated image viewer, the system can provide users with high-quality cross-sectional images tailored to their specific needs.<\/p>\n
3. Support for a Wide Range of Samples
\nThe system accommodates samples 1.6 times heavier than the previous model, enabling inspection of larger components. An internal monitoring system further simplifies positioning for objects of all sizes.<\/p>\n
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