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Oxford Instruments NanoAnalysis division wins Queen’s award for x-ray detection system

May 13, 2019
Source: ASM International

Oxford Instruments, England, announces that its NanoAnalysis division has won the Enterprise 2019 Queen’s Award for the Ultim Extreme detector system which, when used in an electron microscope, enables very low-energy x-rays to be detected in semiconductor samples. Such a capability has multiple applications, including measurement of lithium used in battery research and high-resolution measurements of semiconductor samples.

 

This is the sixth Queen’s Award won by the NanoAnalysis division, and the fourteenth for the Oxford Instruments Group overall.

 

The unique design of the Ultim Extreme enables very low energy x-rays to be detected in samples in an electron microscope, something previously considered to be very difficult to achieve. Users include some of the most prestigious institutions and businesses from around the world, who are able to dramatically improve their productivity and explore ever more sensitively and expanding their capabilities at the nanoscale.

 

Dr. Ian Wilcock, Managing Director NanoAnalysis, commented “I am delighted for the Oxford Instruments team that conceived and developed our unique Extreme detector that their innovation has been recognized by the Queen’s Award. The system has been a great success and is now used in laboratories throughout the world in key areas of research including novel semiconductor applications."

 

www.oxinst.com

Subject Classifications

Industries and Applications | Electronics

Materials Testing and Evaluation | Failure Analysis

Materials Testing and Evaluation | Materials Characterization

Materials Testing and Evaluation | Metallography and Microstructures

Materials Testing and Evaluation | Microelectronic Failure Analysis


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