Zeiss adds ToF SIMS detection capability to Crossbeam 350/550 FIB-SEM microscopes
Zeiss, Germany, introduces advancements in analytics, tomography, sample preparation, and data integrity for its new Crossbeam 350 and 550 focused ion beam SEM microscopes, as well as new time-of-flight secondary ion mass spectrometry (ToF-SIMS) detection.
