{"id":8464,"date":"2018-12-15T15:22:22","date_gmt":"2018-12-15T15:22:22","guid":{"rendered":"https:\/\/staging.asminternational.org\/hts-new\/results\/-\/journal_content\/56\/10192\/36046021\/NEWS\/"},"modified":"2023-02-07T04:48:52","modified_gmt":"2023-02-07T04:48:52","slug":"advantest-develops-test-capabilities-for-5g-medical-devices-mobile-electronics","status":"publish","type":"post","link":"https:\/\/www.asminternational.org\/hts\/advantest-develops-test-capabilities-for-5g-medical-devices-mobile-electronics\/","title":{"rendered":"Advantest develops test capabilities for 5G medical devices, mobile electronics"},"content":{"rendered":"<p style=\"margin-bottom:.0001pt\"><span style=\"background:white\"><span style=\"font-family:&quot;Calibri&quot;,sans-serif\"><span style=\"color:black\">Advantest Corp., Tokyo, has developed advanced test solutions that enable 5G connectivity for such diverse applications as mobile electronics, medical devices, automotive systems, retail business, and big data. &nbsp;<\/span><\/span><\/span><\/p>\n<p style=\"margin-bottom:.0001pt\">&nbsp;<\/p>\n<p style=\"margin:0in; margin-bottom:.0001pt\"><span style=\"background:white\"><span style=\"font-family:&quot;Calibri&quot;,sans-serif\"><span style=\"color:black\">\u201cThe product portfolio that we have \u2013 and are continuing to develop \u2013 is designed to meet the global market\u2019s requirements for 5G in applications from next-gen smart phones to connected cars,\u201d says Judy Davies, Advantest\u2019s vice president of global marketing communications.<\/span><\/span><\/span><\/p>\n<p style=\"margin:0in; margin-bottom:.0001pt\">&nbsp;<\/p>\n<p style=\"margin:0in; margin-bottom:.0001pt\"><span style=\"background:white\"><span style=\"font-family:&quot;Calibri&quot;,sans-serif\"><span style=\"color:black\">Wave Scale RF and Wave Scale MX cards help to create paths for testing 5G devices by delivering high-efficiency test solutions for the ICs used in both today\u2019s and emerging LTE, LTE-Advanced, and LTE-A Pro smart phones, as well as LTE-M, WLAN, GPS, ZigBee, Bluetooth and IoT applications. The cards\u2019 advanced architectures allow for highly parallel testing of multiple communication standards or multiple paths within each device, resulting in high multi-site efficiency and a much lower cost of test.<\/span><\/span><\/span><\/p>\n<p style=\"margin:0in; margin-bottom:.0001pt\">&nbsp;<\/p>\n<p style=\"margin-bottom:.0001pt\"><span style=\"line-height:normal\"><span style=\"font-size:12.0pt\">The company has announced eight new systems and enhancements the past year. These include three new members of the B6700 product family of burn-in memory testers: models B6700D, -S and \u2013L, which are designed to boost parallel testing capacity and lower the cost of test for NAND flash devices.<\/span><\/span><\/p>\n<p style=\"margin-bottom:.0001pt\">&nbsp;<\/p>\n<p style=\"margin-bottom:.0001pt\"><span style=\"line-height:normal\"><span style=\"font-size:12.0pt\"><a href=\"http:\/\/www.advantest.com\">www.advantest.com<\/a><\/span> <\/span><\/p>\n","protected":false},"excerpt":{"rendered":"<p>Advantest Corp., Tokyo, has developed advanced test solutions that enable 5G connectivity for such diverse applications as mobile electronics, medical devices, automotive systems, retail business, and big data.<\/p>\n","protected":false},"author":63082,"featured_media":0,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[453,440,441,1],"tags":[],"class_list":["post-8464","post","type-post","status-publish","format-standard","hentry","category-electronics","category-news","category-news-articles","category-uncategorized"],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.9 - 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