{"id":11265,"date":"2019-11-21T15:12:58","date_gmt":"2019-11-21T15:12:58","guid":{"rendered":"https:\/\/staging.asminternational.org\/hts3-new\/bruker-quantax-eds-software-suite-can-integrate-all-four-microanalysis-techniques\/"},"modified":"2023-02-23T22:45:08","modified_gmt":"2023-02-23T22:45:08","slug":"bruker-quantax-eds-software-suite-can-integrate-all-four-microanalysis-techniques","status":"publish","type":"post","link":"https:\/\/www.asminternational.org\/ims-new\/results\/-\/journal_content\/56\/10192\/38917066\/NEWS\/","title":{"rendered":"Bruker Quantax EDS software suite can integrate all four microanalysis techniques"},"content":{"rendered":"<p style=\"margin-bottom:.0001pt\"><span style=\"line-height:normal\"><span style=\"font-size:14px\"><span style=\",sans-serif\"><span style=\"color:black\">Bruker Corp., Oak Park, Ill., introduces its <\/span><\/span><\/span>Quantax Compact EDS system, which consists of an XFlash 600 Mini silicon drift detector (SDD), a small electronics unit, and Eprit Compact intuitive software.<\/span><\/p>\n<p style=\"margin-bottom:.0001pt\">&nbsp;<\/p>\n<p style=\"margin-bottom:.0001pt\"><span style=\"line-height:normal\">The system performs qualitative and quantitative analyses of all materials having an element range from boron (5) to californium (98). Besides composition analysis at individual spots on the sample surface, Quanax Compact provides powerful line scan and spectral element mapping functions.<\/span><\/p>\n<p style=\"margin-bottom:.0001pt\">&nbsp;<\/p>\n<p style=\"margin-bottom:.0001pt\"><span style=\"line-height:normal\">The system is fully upgradeable to the complete Quantax EDS software suite. It is the only system that can integrate all four Bruker microanalysis techniques: EDS (for S\/TEM, too), Electron Backscatter Diffraction (EBSD), Micro X-ray Fluorescence (\u00b5-XRF), and Wavelength Dispersive Spectroscopy (WDS).<\/span><\/p>\n<p style=\"margin-bottom:.0001pt\">&nbsp;<\/p>\n<p style=\"margin-bottom:.0001pt\"><span style=\"line-height:normal\">Researchers who need EDS on nano-structures and extremely beam-sensitive materials (semiconductor, polymer) may be interested in the FlatQuad annular EDS detector. This large-area detector provides the ultimate x-ray sensitivity for spectrum and x-ray map acquisition. With a take-off angle of up to 70 degrees, the FlatQuad can eliminate topography-induced EDS shadows.<\/span><\/p>\n<p style=\"margin-bottom:.0001pt\">&nbsp;<\/p>\n<p><a href=\"http:\/\/www.bruker.com\">www.bruker.com<\/a><\/p>\n","protected":false},"excerpt":{"rendered":"<p>Bruker Corp., Oak Park, Ill., introduces its Quantax Compact EDS system, which consists of an XFlash 600 Mini silicon drift detector (SDD), a small electronics unit, and Eprit Compact intuitive software.<\/p>\n","protected":false},"author":63103,"featured_media":0,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[456,440,441,1],"tags":[],"class_list":["post-11265","post","type-post","status-publish","format-standard","hentry","category-nanotechnology","category-news","category-news-articles","category-uncategorized"],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.9 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>Bruker Quantax EDS software suite can integrate all four microanalysis techniques - 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