{"id":14438,"date":"2024-10-17T19:02:16","date_gmt":"2024-10-17T23:02:16","guid":{"rendered":"https:\/\/staging.asminternational.org\/ims\/quantumdiamonds-launches-qd-m-0-first-commercial-quantum-device-for-semiconductor-chip-failure-analysis\/"},"modified":"2024-10-17T23:04:23","modified_gmt":"2024-10-17T23:04:23","slug":"quantumdiamonds-launches-qd-m-0-first-commercial-quantum-device-for-semiconductor-chip-failure-analysis","status":"publish","type":"post","link":"https:\/\/www.asminternational.org\/ims\/quantumdiamonds-launches-qd-m-0-first-commercial-quantum-device-for-semiconductor-chip-failure-analysis\/","title":{"rendered":"QuantumDiamonds launches QD m.0: first commercial quantum device for semiconductor chip failure analysis"},"content":{"rendered":"<p>QuantumDiamonds GmbH, Germany, a pioneer in quantum sensing technology, released of the QD m.0, the first commercial quantum device designed for semiconductor chip failure analysis.<\/p>\n<p>This advanced system utilizes diamond-based quantum microscopy to deliver unprecedented precision in detecting and localizing faults in integrated circuits, meeting the increasing testing demands for heterogeneous integration in modern semiconductor fabrication. Its ability to extract electrical current information across multiple layers addresses challenges in today\u2019s 2.5D\/3D packaging and chiplet-based architectures.<\/p>\n<p>With the advent of heterogeneous integration which includes die-stacking, decreased pitch sizes, through-silicon vias and interposers, hybrid bonding, local interconnect bridges and advanced packaging, failures in manufacturing is becoming ever-hard to detect and analyze. The inability to understand such failures result in lower yields overall, which costs chip designers and manufacturers millions of dollars worth of resources.<\/p>\n<p>The QD m.0 is an invaluable tool for the semiconductor industry due to its ability to address the testing challenges that are currently faced for advanced chips. By localizing hard-to-detect failures in heterogenously integrated chips, QuantumDiamonds\u2019 technology can boost production yields and accelerate ramp up, allowing the continued growth of advanced semiconductors.<\/p>\n<p>\u201cOur focus is on empowering semiconductor manufacturers to meet the growing demands of advanced applications,\u201d said Kevin Berghoff, CEO and co-founder of QuantumDiamonds. \u201cThe QD m.0 offers the precision needed to overcome the increasing complexity of modern chip designs, particularly in the AI era.\u201d<\/p>\n<p>\u201cThe QD m.0 combines not only our extensive work in developing the highest quality synthetic diamonds for quantum sensing, optimizing complex optics and electronics, but also progress in advanced software development.\u201d says Fleming Bruckmaier, CTO and co-founder of QuantumDiamonds. \u201cTo make this technology commercially viable, we had to significantly reduce the measurement time through optimizing the sampling process and enabling immediate analysis with custom ML models, as well as ensuring robust operation through an accessible, easy-to-use interface.\u201d<\/p>\n<p>With strong partnerships established with key industry players like Fraunhofer and imec, QuantumDiamonds is bringing quantum technologies to market with a real advantage. Since its founding in 2022 as a spin-off from the Technical University of Munich, the company has emerged as a pivotal force in Europe\u2019s quantum ecosystem.<\/p>\n<p>The initial batch of QD m.0 units is scheduled to ship by Q4 2024, with the first production run already fully allocated.<\/p>\n<p>&nbsp;<\/p>\n<p>For more information:<\/p>\n<p>QuantumDiamonds<\/p>\n<p><a href=\"https:\/\/www.quantumdiamonds.de\/\">https:\/\/www.quantumdiamonds.de\/<\/a><\/p>\n<p>&nbsp;<\/p>\n","protected":false},"excerpt":{"rendered":"<p>QuantumDiamonds GmbH, Germany, a pioneer in quantum sensing technology, released the QD m.0, the first commercial quantum device designed specifically for semiconductor chip failure analysis, using diamond-based quantum microscopy to detect and localize faults in integrated circuits with high precision.<\/p>\n","protected":false},"author":63245,"featured_media":14441,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[631,515,578,447,448,481,622],"tags":[],"class_list":["post-14438","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-equipment-and-instrumentation","category-failure-analysis","category-microelectronic-failure-analysis","category-news","category-news-articles","category-testing-and-characterization","category-testing-and-monitoring"],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.9 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>QuantumDiamonds launches QD m.0: first commercial quantum device for semiconductor chip failure analysis - International Metallographic Society<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.asminternational.org\/ims\/quantumdiamonds-launches-qd-m-0-first-commercial-quantum-device-for-semiconductor-chip-failure-analysis\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"QuantumDiamonds launches QD m.0: first commercial quantum device for semiconductor chip failure analysis - International Metallographic Society\" \/>\n<meta property=\"og:description\" content=\"QuantumDiamonds GmbH, Germany, a pioneer in quantum sensing technology, released the QD m.0, the first commercial quantum device designed specifically for semiconductor chip failure analysis, using diamond-based quantum microscopy to detect and localize faults in integrated circuits with high precision.\" \/>\n<meta property=\"og:url\" content=\"https:\/\/www.asminternational.org\/ims\/quantumdiamonds-launches-qd-m-0-first-commercial-quantum-device-for-semiconductor-chip-failure-analysis\/\" \/>\n<meta property=\"og:site_name\" content=\"International Metallographic Society\" \/>\n<meta property=\"article:published_time\" content=\"2024-10-17T23:02:16+00:00\" \/>\n<meta property=\"article:modified_time\" content=\"2024-10-17T23:04:23+00:00\" \/>\n<meta property=\"og:image\" content=\"https:\/\/www.asminternational.org\/app\/uploads\/sites\/40\/2024\/10\/EDFAS__102424__QuantumDiamonds__250-1.jpg\" \/>\n\t<meta property=\"og:image:width\" content=\"250\" \/>\n\t<meta property=\"og:image:height\" content=\"88\" \/>\n\t<meta property=\"og:image:type\" content=\"image\/jpeg\" \/>\n<meta name=\"author\" content=\"Debbie Sniderman\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"Written by\" \/>\n\t<meta name=\"twitter:data1\" content=\"Debbie Sniderman\" \/>\n\t<meta name=\"twitter:label2\" content=\"Est. reading time\" \/>\n\t<meta name=\"twitter:data2\" content=\"2 minutes\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\\\/\\\/schema.org\",\"@graph\":[{\"@type\":\"Article\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/ims\\\/quantumdiamonds-launches-qd-m-0-first-commercial-quantum-device-for-semiconductor-chip-failure-analysis\\\/#article\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/ims\\\/quantumdiamonds-launches-qd-m-0-first-commercial-quantum-device-for-semiconductor-chip-failure-analysis\\\/\"},\"author\":{\"name\":\"Debbie Sniderman\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/ims\\\/#\\\/schema\\\/person\\\/135b2d8ac98a363d0bd9ec033a2904ad\"},\"headline\":\"QuantumDiamonds launches QD m.0: first commercial quantum device for semiconductor chip failure analysis\",\"datePublished\":\"2024-10-17T23:02:16+00:00\",\"dateModified\":\"2024-10-17T23:04:23+00:00\",\"mainEntityOfPage\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/ims\\\/quantumdiamonds-launches-qd-m-0-first-commercial-quantum-device-for-semiconductor-chip-failure-analysis\\\/\"},\"wordCount\":400,\"publisher\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/ims\\\/#organization\"},\"image\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/ims\\\/quantumdiamonds-launches-qd-m-0-first-commercial-quantum-device-for-semiconductor-chip-failure-analysis\\\/#primaryimage\"},\"thumbnailUrl\":\"https:\\\/\\\/cdn-prd-main.asm-media.cloud\\\/uploads\\\/sites\\\/40\\\/2024\\\/10\\\/EDFAS__102424__QuantumDiamonds__250-1.jpg\",\"articleSection\":[\"Equipment and instrumentation\",\"Failure Analysis\",\"microelectronic-failure-analysis\",\"news\",\"News Articles\",\"Testing and Characterization\",\"Testing and monitoring\"],\"inLanguage\":\"en-US\"},{\"@type\":\"WebPage\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/ims\\\/quantumdiamonds-launches-qd-m-0-first-commercial-quantum-device-for-semiconductor-chip-failure-analysis\\\/\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/ims\\\/quantumdiamonds-launches-qd-m-0-first-commercial-quantum-device-for-semiconductor-chip-failure-analysis\\\/\",\"name\":\"QuantumDiamonds launches QD m.0: first commercial quantum device for semiconductor chip failure analysis - International Metallographic Society\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/ims\\\/#website\"},\"primaryImageOfPage\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/ims\\\/quantumdiamonds-launches-qd-m-0-first-commercial-quantum-device-for-semiconductor-chip-failure-analysis\\\/#primaryimage\"},\"image\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/ims\\\/quantumdiamonds-launches-qd-m-0-first-commercial-quantum-device-for-semiconductor-chip-failure-analysis\\\/#primaryimage\"},\"thumbnailUrl\":\"https:\\\/\\\/cdn-prd-main.asm-media.cloud\\\/uploads\\\/sites\\\/40\\\/2024\\\/10\\\/EDFAS__102424__QuantumDiamonds__250-1.jpg\",\"datePublished\":\"2024-10-17T23:02:16+00:00\",\"dateModified\":\"2024-10-17T23:04:23+00:00\",\"breadcrumb\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/ims\\\/quantumdiamonds-launches-qd-m-0-first-commercial-quantum-device-for-semiconductor-chip-failure-analysis\\\/#breadcrumb\"},\"inLanguage\":\"en-US\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\\\/\\\/www.asminternational.org\\\/ims\\\/quantumdiamonds-launches-qd-m-0-first-commercial-quantum-device-for-semiconductor-chip-failure-analysis\\\/\"]}]},{\"@type\":\"ImageObject\",\"inLanguage\":\"en-US\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/ims\\\/quantumdiamonds-launches-qd-m-0-first-commercial-quantum-device-for-semiconductor-chip-failure-analysis\\\/#primaryimage\",\"url\":\"https:\\\/\\\/cdn-prd-main.asm-media.cloud\\\/uploads\\\/sites\\\/40\\\/2024\\\/10\\\/EDFAS__102424__QuantumDiamonds__250-1.jpg\",\"contentUrl\":\"https:\\\/\\\/cdn-prd-main.asm-media.cloud\\\/uploads\\\/sites\\\/40\\\/2024\\\/10\\\/EDFAS__102424__QuantumDiamonds__250-1.jpg\",\"width\":250,\"height\":88},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/ims\\\/quantumdiamonds-launches-qd-m-0-first-commercial-quantum-device-for-semiconductor-chip-failure-analysis\\\/#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Home\",\"item\":\"https:\\\/\\\/www.asminternational.org\\\/ims\\\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"QuantumDiamonds launches QD m.0: first commercial quantum device for semiconductor chip failure analysis\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/ims\\\/#website\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/ims\\\/\",\"name\":\"International Metallographic Society\",\"description\":\"International Metallographic Society ASM International\",\"publisher\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/ims\\\/#organization\"},\"potentialAction\":[{\"@type\":\"SearchAction\",\"target\":{\"@type\":\"EntryPoint\",\"urlTemplate\":\"https:\\\/\\\/www.asminternational.org\\\/ims\\\/?s={search_term_string}\"},\"query-input\":{\"@type\":\"PropertyValueSpecification\",\"valueRequired\":true,\"valueName\":\"search_term_string\"}}],\"inLanguage\":\"en-US\"},{\"@type\":\"Organization\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/ims\\\/#organization\",\"name\":\"International Metallographic Society\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/ims\\\/\",\"logo\":{\"@type\":\"ImageObject\",\"inLanguage\":\"en-US\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/ims\\\/#\\\/schema\\\/logo\\\/image\\\/\",\"url\":\"https:\\\/\\\/cdn-prd-main.asm-media.cloud\\\/uploads\\\/sites\\\/40\\\/2024\\\/09\\\/IMS24_Logo_Color-002.png\",\"contentUrl\":\"https:\\\/\\\/cdn-prd-main.asm-media.cloud\\\/uploads\\\/sites\\\/40\\\/2024\\\/09\\\/IMS24_Logo_Color-002.png\",\"width\":1386,\"height\":304,\"caption\":\"International Metallographic Society\"},\"image\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/ims\\\/#\\\/schema\\\/logo\\\/image\\\/\"}},{\"@type\":\"Person\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/ims\\\/#\\\/schema\\\/person\\\/135b2d8ac98a363d0bd9ec033a2904ad\",\"name\":\"Debbie Sniderman\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/ims\\\/author\\\/dsniderman\\\/\"}]}<\/script>\n<!-- \/ Yoast SEO plugin. -->","yoast_head_json":{"title":"QuantumDiamonds launches QD m.0: first commercial quantum device for semiconductor chip failure analysis - International Metallographic Society","robots":{"index":"index","follow":"follow","max-snippet":"max-snippet:-1","max-image-preview":"max-image-preview:large","max-video-preview":"max-video-preview:-1"},"canonical":"https:\/\/www.asminternational.org\/ims\/quantumdiamonds-launches-qd-m-0-first-commercial-quantum-device-for-semiconductor-chip-failure-analysis\/","og_locale":"en_US","og_type":"article","og_title":"QuantumDiamonds launches QD m.0: first commercial quantum device for semiconductor chip failure analysis - International Metallographic Society","og_description":"QuantumDiamonds GmbH, Germany, a pioneer in quantum sensing technology, released the QD m.0, the first commercial quantum device designed specifically for semiconductor chip failure analysis, using diamond-based quantum microscopy to detect and localize faults in integrated circuits with high precision.","og_url":"https:\/\/www.asminternational.org\/ims\/quantumdiamonds-launches-qd-m-0-first-commercial-quantum-device-for-semiconductor-chip-failure-analysis\/","og_site_name":"International Metallographic Society","article_published_time":"2024-10-17T23:02:16+00:00","article_modified_time":"2024-10-17T23:04:23+00:00","og_image":[{"width":250,"height":88,"url":"https:\/\/www.asminternational.org\/app\/uploads\/sites\/40\/2024\/10\/EDFAS__102424__QuantumDiamonds__250-1.jpg","type":"image\/jpeg"}],"author":"Debbie Sniderman","twitter_card":"summary_large_image","twitter_misc":{"Written by":"Debbie Sniderman","Est. reading time":"2 minutes"},"schema":{"@context":"https:\/\/schema.org","@graph":[{"@type":"Article","@id":"https:\/\/www.asminternational.org\/ims\/quantumdiamonds-launches-qd-m-0-first-commercial-quantum-device-for-semiconductor-chip-failure-analysis\/#article","isPartOf":{"@id":"https:\/\/www.asminternational.org\/ims\/quantumdiamonds-launches-qd-m-0-first-commercial-quantum-device-for-semiconductor-chip-failure-analysis\/"},"author":{"name":"Debbie Sniderman","@id":"https:\/\/www.asminternational.org\/ims\/#\/schema\/person\/135b2d8ac98a363d0bd9ec033a2904ad"},"headline":"QuantumDiamonds launches QD m.0: first commercial quantum device for semiconductor chip failure analysis","datePublished":"2024-10-17T23:02:16+00:00","dateModified":"2024-10-17T23:04:23+00:00","mainEntityOfPage":{"@id":"https:\/\/www.asminternational.org\/ims\/quantumdiamonds-launches-qd-m-0-first-commercial-quantum-device-for-semiconductor-chip-failure-analysis\/"},"wordCount":400,"publisher":{"@id":"https:\/\/www.asminternational.org\/ims\/#organization"},"image":{"@id":"https:\/\/www.asminternational.org\/ims\/quantumdiamonds-launches-qd-m-0-first-commercial-quantum-device-for-semiconductor-chip-failure-analysis\/#primaryimage"},"thumbnailUrl":"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/40\/2024\/10\/EDFAS__102424__QuantumDiamonds__250-1.jpg","articleSection":["Equipment and instrumentation","Failure Analysis","microelectronic-failure-analysis","news","News Articles","Testing and Characterization","Testing and monitoring"],"inLanguage":"en-US"},{"@type":"WebPage","@id":"https:\/\/www.asminternational.org\/ims\/quantumdiamonds-launches-qd-m-0-first-commercial-quantum-device-for-semiconductor-chip-failure-analysis\/","url":"https:\/\/www.asminternational.org\/ims\/quantumdiamonds-launches-qd-m-0-first-commercial-quantum-device-for-semiconductor-chip-failure-analysis\/","name":"QuantumDiamonds launches QD m.0: first commercial quantum device for semiconductor chip failure analysis - International Metallographic Society","isPartOf":{"@id":"https:\/\/www.asminternational.org\/ims\/#website"},"primaryImageOfPage":{"@id":"https:\/\/www.asminternational.org\/ims\/quantumdiamonds-launches-qd-m-0-first-commercial-quantum-device-for-semiconductor-chip-failure-analysis\/#primaryimage"},"image":{"@id":"https:\/\/www.asminternational.org\/ims\/quantumdiamonds-launches-qd-m-0-first-commercial-quantum-device-for-semiconductor-chip-failure-analysis\/#primaryimage"},"thumbnailUrl":"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/40\/2024\/10\/EDFAS__102424__QuantumDiamonds__250-1.jpg","datePublished":"2024-10-17T23:02:16+00:00","dateModified":"2024-10-17T23:04:23+00:00","breadcrumb":{"@id":"https:\/\/www.asminternational.org\/ims\/quantumdiamonds-launches-qd-m-0-first-commercial-quantum-device-for-semiconductor-chip-failure-analysis\/#breadcrumb"},"inLanguage":"en-US","potentialAction":[{"@type":"ReadAction","target":["https:\/\/www.asminternational.org\/ims\/quantumdiamonds-launches-qd-m-0-first-commercial-quantum-device-for-semiconductor-chip-failure-analysis\/"]}]},{"@type":"ImageObject","inLanguage":"en-US","@id":"https:\/\/www.asminternational.org\/ims\/quantumdiamonds-launches-qd-m-0-first-commercial-quantum-device-for-semiconductor-chip-failure-analysis\/#primaryimage","url":"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/40\/2024\/10\/EDFAS__102424__QuantumDiamonds__250-1.jpg","contentUrl":"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/40\/2024\/10\/EDFAS__102424__QuantumDiamonds__250-1.jpg","width":250,"height":88},{"@type":"BreadcrumbList","@id":"https:\/\/www.asminternational.org\/ims\/quantumdiamonds-launches-qd-m-0-first-commercial-quantum-device-for-semiconductor-chip-failure-analysis\/#breadcrumb","itemListElement":[{"@type":"ListItem","position":1,"name":"Home","item":"https:\/\/www.asminternational.org\/ims\/"},{"@type":"ListItem","position":2,"name":"QuantumDiamonds launches QD m.0: first commercial quantum device for semiconductor chip failure analysis"}]},{"@type":"WebSite","@id":"https:\/\/www.asminternational.org\/ims\/#website","url":"https:\/\/www.asminternational.org\/ims\/","name":"International Metallographic Society","description":"International Metallographic Society ASM International","publisher":{"@id":"https:\/\/www.asminternational.org\/ims\/#organization"},"potentialAction":[{"@type":"SearchAction","target":{"@type":"EntryPoint","urlTemplate":"https:\/\/www.asminternational.org\/ims\/?s={search_term_string}"},"query-input":{"@type":"PropertyValueSpecification","valueRequired":true,"valueName":"search_term_string"}}],"inLanguage":"en-US"},{"@type":"Organization","@id":"https:\/\/www.asminternational.org\/ims\/#organization","name":"International Metallographic Society","url":"https:\/\/www.asminternational.org\/ims\/","logo":{"@type":"ImageObject","inLanguage":"en-US","@id":"https:\/\/www.asminternational.org\/ims\/#\/schema\/logo\/image\/","url":"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/40\/2024\/09\/IMS24_Logo_Color-002.png","contentUrl":"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/40\/2024\/09\/IMS24_Logo_Color-002.png","width":1386,"height":304,"caption":"International Metallographic Society"},"image":{"@id":"https:\/\/www.asminternational.org\/ims\/#\/schema\/logo\/image\/"}},{"@type":"Person","@id":"https:\/\/www.asminternational.org\/ims\/#\/schema\/person\/135b2d8ac98a363d0bd9ec033a2904ad","name":"Debbie Sniderman","url":"https:\/\/www.asminternational.org\/ims\/author\/dsniderman\/"}]}},"acf":[],"_links":{"self":[{"href":"https:\/\/www.asminternational.org\/ims\/wp-json\/wp\/v2\/posts\/14438","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.asminternational.org\/ims\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.asminternational.org\/ims\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.asminternational.org\/ims\/wp-json\/wp\/v2\/users\/63245"}],"replies":[{"embeddable":true,"href":"https:\/\/www.asminternational.org\/ims\/wp-json\/wp\/v2\/comments?post=14438"}],"version-history":[{"count":0,"href":"https:\/\/www.asminternational.org\/ims\/wp-json\/wp\/v2\/posts\/14438\/revisions"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.asminternational.org\/ims\/wp-json\/wp\/v2\/media\/14441"}],"wp:attachment":[{"href":"https:\/\/www.asminternational.org\/ims\/wp-json\/wp\/v2\/media?parent=14438"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.asminternational.org\/ims\/wp-json\/wp\/v2\/categories?post=14438"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.asminternational.org\/ims\/wp-json\/wp\/v2\/tags?post=14438"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}