Share your work. Be recognized. Inspire the failure analysis community through imagery at ISTFA 2026. Open to the Global Failure Analysis Community.<\/strong><\/p> The ISTFA 2026 Photo Contest<\/strong> invites members of the failure analysis community to share their most compelling and visually striking images. This competition celebrates the intersection of science, discovery, and visual storytelling\u2014recognizing images that highlight both the technical depth and the artistic beauty of failure analysis.<\/p> Selected entries will be displayed on-site at the 2026 International Symposium for Testing and Failure Analysis (ISTFA)<\/strong> in San Antonio<\/span><\/span><\/strong>, where attendees can view and vote on outstanding submissions.<\/p> Participants may submit no more than one image per category<\/strong>. Final category details will be confirmed closer to the submission opening but are expected to include:<\/p> I. Color Images Only<\/strong> II. Black & White Images Only<\/strong> III. False Color Images Only<\/strong> Entries will be evaluated using a balanced scoring approach based on:<\/p> Failure analysis relevance<\/strong><\/p><\/li> Aesthetics and visual impact<\/strong><\/p><\/li> Novelty of technique or failure mechanism<\/strong><\/p><\/li><\/ul> Prize details for the ISTFA 2026 Photo Contest are as follows:<\/p> 1st place<\/strong> in each category receives a wall plaque and complimentary registration to ISTFA 2027.<\/p><\/li> 2nd place<\/strong> in each category receive award certificates and a $25 gift certificate.<\/p><\/li> 3rd places<\/strong> in each category receive award certificates.<\/p><\/li><\/ul> Entries: Submit by e-mail to photocontest@asminternational.org<\/strong> (subject line: EDFAS Photo Contest):<\/p> Submissions will be accepted digitally<\/p><\/li> One image per category per participant<\/p><\/li> Standard image formats (PNG, JPG\/JPEG, TIFF, BMP, etc.)<\/p><\/li> High-resolution images strongly encouraged<\/p><\/li> Each submission must include:<\/p> Name of submitter<\/p><\/li> Title of image<\/p><\/li> Category<\/p><\/li> Contact information<\/p><\/li> Brief description of the micrograph (typically 50 words or fewer)<\/p><\/li><\/ul><\/li><\/ul> Images must not<\/strong> contain embedded contact information.<\/p> All submitted images must be original work<\/strong> and may include only properly authorized content. Entrants are responsible for securing all necessary permissions prior to submission.<\/p> By submitting an entry, participants grant EDFAS and ASM International the right to exhibit, reproduce, and distribute submitted images for conference-related and promotional use. Entries will not be returned. Submissions created or altered using artificial intelligence (AI) will not be accepted. Share your work. Be recognized. Inspire the failure analysis community through imagery at ISTFA 2026. Open to the Global Failure Analysis Community.<\/strong><\/p> The ISTFA 2026 Photo Contest<\/strong> invites members of the failure analysis community to share their most compelling and visually striking images. This competition celebrates the intersection of science, discovery, and visual storytelling\u2014recognizing images that highlight both the technical depth and the artistic beauty of failure analysis.<\/p> Selected entries will be displayed on-site at the 2026 International Symposium for Testing and Failure Analysis (ISTFA)<\/strong> in San Antonio<\/span><\/span><\/strong>, where attendees can view and vote on outstanding submissions.<\/p> Participants may submit no more than one image per category<\/strong>. Final category details will be confirmed closer to the submission opening but are expected to include:<\/p> I. Color Images Only<\/strong> II. Black & White Images Only<\/strong> III. False Color Images Only<\/strong> Entries will be evaluated using a balanced scoring approach based on:<\/p> Failure analysis relevance<\/strong><\/p><\/li> Aesthetics and visual impact<\/strong><\/p><\/li> Novelty of technique or failure mechanism<\/strong><\/p><\/li><\/ul> Prize details for the ISTFA 2026 Photo Contest are as follows:<\/p> 1st place<\/strong> in each category receives a wall plaque and complimentary registration to ISTFA 2027.<\/p><\/li> 2nd place<\/strong> in each category receive award certificates and a $25 gift certificate.<\/p><\/li> 3rd places<\/strong> in each category receive award certificates.<\/p><\/li><\/ul> Entries: Submit by e-mail to photocontest@asminternational.org<\/strong> (subject line: EDFAS Photo Contest):<\/p> Submissions will be accepted digitally<\/p><\/li> One image per category per participant<\/p><\/li> Standard image formats (PNG, JPG\/JPEG, TIFF, BMP, etc.)<\/p><\/li> High-resolution images strongly encouraged<\/p><\/li> Each submission must include:<\/p> Name of submitter<\/p><\/li> Title of image<\/p><\/li> Category<\/p><\/li> Contact information<\/p><\/li> Brief description of the micrograph (typically 50 words or fewer)<\/p><\/li><\/ul><\/li><\/ul> Images must not<\/strong> contain embedded contact information.<\/p> All submitted images must be original work<\/strong> and may include only properly authorized content. Entrants are responsible for securing all necessary permissions prior to submission.<\/p> By submitting an entry, participants grant EDFAS and ASM International the right to exhibit, reproduce, and distribute submitted images for conference-related and promotional use. Entries will not be returned. Submissions created or altered using artificial intelligence (AI) will not be accepted.Deadline: NOW CLOSED<\/h4>
Contest Categories<\/h2>
(Optical Microscopy)<\/p>
(Optical Microscopy, SEM, TEM, X-Ray, UV Micrographs, and other advanced imaging methods)<\/p>
(SPM, SAM, Photon Emission, and related techniques)<\/p>Judging Criteria<\/h2>
Awards & Recognition\u00a0<\/h2>
Submission Details\u00a0<\/h2>
Original Work, Copyright & Permissions<\/h2>
<\/strong><\/p>","protected":false},"excerpt":{"rendered":"","protected":false},"author":63081,"featured_media":0,"parent":432,"menu_order":6,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_acf_changed":false,"footnotes":""},"class_list":["post-2314","page","type-page","status-publish","hentry"],"bricks_content":"ISTFA 2026 Photo Contest<\/h1>\n\n
Deadline: NOW CLOSED<\/h4>
Contest Categories<\/h2>
(Optical Microscopy)<\/p>
(Optical Microscopy, SEM, TEM, X-Ray, UV Micrographs, and other advanced imaging methods)<\/p>
(SPM, SAM, Photon Emission, and related techniques)<\/p>Judging Criteria<\/h2>
Awards & Recognition\u00a0<\/h2>
Submission Details\u00a0<\/h2>
Original Work, Copyright & Permissions<\/h2>
<\/strong><\/p>","yoast_head":"\n