{"id":441,"date":"2025-06-27T18:54:43","date_gmt":"2025-06-27T18:54:43","guid":{"rendered":"https:\/\/staging.asminternational.org\/istfa\/keynote-sessions\/"},"modified":"2026-09-21T12:10:17","modified_gmt":"2026-09-21T16:10:17","slug":"keynote-sessions","status":"publish","type":"page","link":"https:\/\/www.asminternational.org\/istfa-event\/learn\/keynote-sessions\/","title":{"rendered":"Keynote Session"},"content":{"rendered":"<h1>Keynote Session<\/h1>\n\n<p>\u00a0\u00a0<\/p>\n\n<h6>Tuesday, October 6, 2026 | 8:30 - 9:30 AM | Exhibit Hall - Industry Forum<\/h6>\n\n<p><img class=\"size-medium wp-image-2751 alignleft\" src=\"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/99\/2026\/05\/jeff_rearick_2024-264x300.webp\" alt=\"\" width=\"264\" height=\"300\" \/><\/p><h4>Unifying Two Opposing Perspectives on Design for Failure Analysis<\/h4><h4>\u00a0<\/h4><h4>Jeff Rearick, AMD<\/h4><p><strong>\u00a0<br \/><\/strong><strong>Biography<\/strong>: Jeff Rearick is a Senior Fellow at AMD. He has been with AMD for 19 years and leads the DFX Strategy team, whose mission is to look just far enough into the future of test and debug and validation to keep a steady stream of innovations coming down the pipeline to intercept ever-advancing AMD products. Jeff is a member of the International Test Conference Steering Committee, served as ITC Program Chair in 2023, has served on Program Committee for the European Test Symposium, is a longstanding member of the IEEE Test Technology Standards Committee, and is currently the Editor for three IEEE working groups (IEEE 1687, P1687.1, and P1687.2). Prior to joining AMD, he did test engineering and DFT design at Hewlett-Packard and Agilent Technologies for 22 years. He holds BSEE and MSEE degrees from Purdue University and the University of Illinois, respectively.<\/p><p><strong>Sponsored by:<\/strong><br \/><a href=\"https:\/\/www.jeolusa.com\/APPLICATIONS\/Application-List\/Semiconductor?utm_source=ISTFA_Webpage&amp;utm_medium=webpage&amp;utm_term=ISFTA+Sponsor+list&amp;utm_content=ISFTA+Sponsor+list&amp;utm_campaign=ISTFA+2026\"><img class=\"alignnone wp-image-3083\" src=\"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/99\/2026\/08\/Screenshot-2026-08-14-at-6.13.29-PM-300x126.avif\" alt=\"\" width=\"238\" height=\"100\" \/><\/a><\/p>","protected":false},"excerpt":{"rendered":"","protected":false},"author":63081,"featured_media":0,"parent":443,"menu_order":3,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_acf_changed":false,"footnotes":""},"class_list":["post-441","page","type-page","status-publish","hentry"],"bricks_content":"<h1>Keynote Session<\/h1>\n\n<p>\u00a0\u00a0<\/p>\n\n<h6>Tuesday, October 6, 2026 | 8:30 - 9:30 AM | Exhibit Hall - Industry Forum<\/h6>\n\n<p><img class=\"size-medium wp-image-2751 alignleft\" src=\"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/99\/2026\/05\/jeff_rearick_2024-264x300.webp\" alt=\"\" width=\"264\" height=\"300\" \/><\/p><h4>Unifying Two Opposing Perspectives on Design for Failure Analysis<\/h4><h4>\u00a0<\/h4><h4>Jeff Rearick, AMD<\/h4><p><strong>\u00a0<br \/><\/strong><strong>Biography<\/strong>: Jeff Rearick is a Senior Fellow at AMD. He has been with AMD for 19 years and leads the DFX Strategy team, whose mission is to look just far enough into the future of test and debug and validation to keep a steady stream of innovations coming down the pipeline to intercept ever-advancing AMD products. Jeff is a member of the International Test Conference Steering Committee, served as ITC Program Chair in 2023, has served on Program Committee for the European Test Symposium, is a longstanding member of the IEEE Test Technology Standards Committee, and is currently the Editor for three IEEE working groups (IEEE 1687, P1687.1, and P1687.2). Prior to joining AMD, he did test engineering and DFT design at Hewlett-Packard and Agilent Technologies for 22 years. He holds BSEE and MSEE degrees from Purdue University and the University of Illinois, respectively.<\/p><p><strong>Sponsored by:<\/strong><br \/><a href=\"https:\/\/www.jeolusa.com\/APPLICATIONS\/Application-List\/Semiconductor?utm_source=ISTFA_Webpage&amp;utm_medium=webpage&amp;utm_term=ISFTA+Sponsor+list&amp;utm_content=ISFTA+Sponsor+list&amp;utm_campaign=ISTFA+2026\"><img class=\"alignnone wp-image-3083\" src=\"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/99\/2026\/08\/Screenshot-2026-08-14-at-6.13.29-PM-300x126.avif\" alt=\"\" width=\"238\" height=\"100\" \/><\/a><\/p>","yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.9 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>Keynote Session - ISTFA | ASM International<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.asminternational.org\/istfa-event\/learn\/keynote-sessions\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Keynote Session - ISTFA | ASM International\" \/>\n<meta property=\"og:url\" content=\"https:\/\/www.asminternational.org\/istfa-event\/learn\/keynote-sessions\/\" \/>\n<meta property=\"og:site_name\" content=\"ISTFA | ASM International\" \/>\n<meta property=\"article:modified_time\" content=\"2026-09-21T16:10:17+00:00\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"Est. reading time\" \/>\n\t<meta name=\"twitter:data1\" content=\"1 minute\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\\\/\\\/schema.org\",\"@graph\":[{\"@type\":\"WebPage\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/istfa-event\\\/learn\\\/keynote-sessions\\\/\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/istfa-event\\\/learn\\\/keynote-sessions\\\/\",\"name\":\"Keynote Session - ISTFA | ASM International\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/istfa-event\\\/#website\"},\"datePublished\":\"2025-06-27T18:54:43+00:00\",\"dateModified\":\"2026-09-21T16:10:17+00:00\",\"breadcrumb\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/istfa-event\\\/learn\\\/keynote-sessions\\\/#breadcrumb\"},\"inLanguage\":\"en-US\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\\\/\\\/www.asminternational.org\\\/istfa-event\\\/learn\\\/keynote-sessions\\\/\"]}]},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/istfa-event\\\/learn\\\/keynote-sessions\\\/#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Home\",\"item\":\"https:\\\/\\\/www.asminternational.org\\\/istfa-event\\\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"Learn\",\"item\":\"https:\\\/\\\/www.asminternational.org\\\/istfa-event\\\/learn\\\/\"},{\"@type\":\"ListItem\",\"position\":3,\"name\":\"Keynote Session\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/istfa-event\\\/#website\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/istfa-event\\\/\",\"name\":\"ISTFA | ASM International\",\"description\":\"International Materials, Applications &amp; 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