JEOL USA, Peabody, Mass., released its new broad ion beam milling instruments, Cross Section Polisher (CP) and Cooling Cross Section Polisher (CCP). These instruments are widely used for preparing high quality, artifact-free cross sections for imaging and microanalysis by SEM, EPMA or Auger.
These new configurations have an improved high speed milling source for ultra-fast milling rates, up to 1.2mm/h. A new flow-chart style control panel guides the user for quick easy setup. They are now remote enabled for access and control through a web browser, monitoring and adjusting the milling process is possible from anywhere when connected to a LAN.
Upgraded configurations include air-isolated transfer workflows for reactive specimens, wide area milling (up to 8mm or more), surface milling and sputter coating.
JEOL has been a leader in the field of ion beam specimen preparation with over 2000 units sold since its launch in 2003. JEOL’s Cross Section Polishers are widely used in the fields of electronics/semiconductor, ceramics, metallurgy, battery, polymer and life science. The CPs produce pristine cross sections of the most challenging specimens: brittle materials, multilayer coatings, fragile-porous materials, polymers and composites etc.
For more information:
JEOL USA, Inc.
