Microelectronics Failure Analysis

Clearance Sale: Microelectronics Failure Analysis

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Lead-Free Solder Interconnect Reliability

Published: 2005

Provides the most up-to-date knowledge and data available on the reliability of lead-free solder interconnects. The content has been written by leading experts working in this important technology area. Both fundamental research and practical considerations are addressed.

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ISTFA 2012: Proceedings from the 38th International Symposium for Testing and Failure Analysis

Published: 2012

This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures.

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ISTFA 2011: Proceedings of the 37th International Symposium for Testing and Failure Analysis

Published: 2011

This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures.

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ASM Affiliate Societies