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Zeiss GeminiSEM 450 field-emission SEM combines ultrahigh resolution, advanced analytics
January 03, 2018
Source: ASM International
Zeiss, Pleasanton, Calif., introduces its new field emission scanning electron microscope, the GeminiSEM 450, which combines ultrahigh resolution imaging with advanced analytics, while maintaining flexibility and ease of use.
With the GeminiSEM 450, users benefit from high resolution, surface-sensitive imaging, and an optical system that ideally supports them in obtaining the best analytical results – especially when working with low voltages. High-throughput electron backscatter diffraction (EBSD) analysis and low voltage X-ray spectroscopy (EDS) deliver excellent results due to its ability to precisely and independently control spot size and beam current. With the Gemini 2 design, it is possible to always work under optimized conditions, as the user can switch seamlessly between imaging and analytical modes at the touch of a button. This makes it the ideal platform for the highest demands in imaging and analytical performance.
In addition, the GeminiSEM 450 has been designed for a broad variety of sample types, from classical conductive metals to beam sensitive polymers. In particular, variable pressure technology reduces charging on nonconductive samples without compromising Inlens detection capabilities. At the same time, it enables high-resolution EDS analysis by minimizing the skirt effect.
“With the GeminiSEM 450, we have introduced a new FE-SEM flagship for highest-performance analytics and ultrahigh resolution,” says Dr. Michael Albiez, head of electron microscopy at Zeiss. “In addition to this product launch, we are rolling out significant enhancements to both the GeminiSEM and Sigma families. As an example, the Sigma family now benefits from the introduction of the high-resolution gun mode that has previously only been available on the Gemini series.”
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