Anton Paar USA, Ashland, Va., presents the third generation of the Revetest scratch tester, the RST3, the only scratch tester on the market that features automatic detection of critical loads. The critical load data is the basis for quantifying the adhesive properties of different film-substrate combinations by using different sensors (acoustic emission, penetration depth, friction force) and video microscope observations.
New easy-to-use software enables all critical loads to be detected automatically. The operator only needs to set up some threshold values and start the automatic analysis of critical loads.
Indenter tips in the indenter holder can be changed easily and quickly. Tips of different diameters and angles are available. The same indenter holder can be used for different kinds of tips, such as spherical tips, Berkovich tips, or Vickers tips.
With an even more compact footprint than earlier models, the RST3 is designed for evaluating hard coatings with a typical coating thickness of several microns, applying forces in the range 0.5 to 200 newtons. It is possible to carry out scratch tests in a wide variety of testing modes, including simple scratch testing, advanced scratch testing (with pre-scan and post-scan), scratch map, scratch map by stage, user-defined scratch, etc. In addition, the instrument automatically synchronizes the recording of all sensor signals with the whole scratch image in perfect focus. In this way, the measurement curve can be analyzed exactly parallel to the scratch picture on one page. Anton Paar holds the patents US 12/324, 237, and EP 2065695 for the synchronized panorama mode.
Due to its unique force sensor control, the Revetest scratch system detects every surface deviation, and the active force feedback corrects this deviation. By following the shape of the sample with total control of the desired load, RST3 is also capable of perfectly reliable measurements on uneven and curved surfaces.
http://www.anton-paar.com/us-en/products/details/revetestr-scratch-tester/
