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Hitachi launches transmission electron microscope with improved electro-optics.

March 20, 2017
Source: ASM International

Hitachi High-Technologies Corp., Tokyo, introduces the HT7800 Series Transmission Electron Microscope, which features digital operation under normal room light conditions (like the HT7700 model) and also incorporates improved electro-optics with many new functions.

The observation of nanostructures enabled by TEM is used in a wide range of fields, including polymer development, nanomaterials, and more. Recently, with the miniaturization of materials for observation, using TEM to perform structural analysis has become commonplace in an increasing number of situations. This has led to a broadening of the user base that calls not only for performance improvements, such as high-resolution and high-contrast imaging, but also an enhanced operating environment that does not require high skill level or knowledge for effective use.

The HT7800 Series has inherited many advantages that stem from the current HT7700 model, which revolutionized traditional observation methods when first introduced by removing the antiquated traditional viewing chamber and integrating a digital camera system. The HT7800 once again reflects modern technology, resulting in a more precise, ergonomic, and easy-to-use system that can be utilized under normal room light conditions.

This new model features the unique Hitachi Dual-Mode Objective Lens with the addition of advanced electro-optics to enable higher-performance imaging under low magnification, high contrast, wide field of view, and high resolution.

Specifically, the HT7830 model has a special ultra-resolution lens configuration that enables it to achieve class-leading high-resolution performance.

www.hitachi-hta.com

 

Subject Classifications

Industries and Applications | Electronics

Industries and Applications | Nanotechnology

Materials Testing and Evaluation | Microelectronic Failure Analysis


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