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Shimadzu metal artifact reduction software enables clearer images for X-ray CT system

December 07, 2017
Source: ASM International

Shimadzu, Japan, has released its Metal Artifact Reduction software, which significantly reduces artifacts in CT images, enabling the acquisition of clear images for the Shimadzu inspeXio SMX-225CT FPD HR Microfocus X-ray CT system.

A microfocus X-ray CT system is used to observe the internal structure of an object targeted for observation in 3D. It excels at failure analysis and inspections of aluminum die cast parts. However, in scans of composite parts composed of metals and resins, for example, materials with different X-ray absorption ratios, so-called artifacts or false images that do not actually exist, can occur, which interferes with the process of observation.
This newly developed software substantially reduces artifacts by using proprietary image processing matched to the materials in the object targeted for measurement. In tests conducted by Shimadzu, artifacts were reduced by approximately 90% in images of evaluative samples composed of aluminum, steel, and resin. (Left in the photo: Original Image; Right: After Artifact Reduction)

The inspeXio SMX-225CT FPD HR, which is an industry leader in terms of large field-of-view and high resolution, is Shimadzu's premier microfocus X-ray CT system. Utilizing the extended range of samples that can be observed with the Metal Artifact Reduction software, this system should be especially useful to companies in the automotive and electronics industries.

The software performs image processing matched to the materials in the sample selected, without sacrificing the advantages of the inspeXio SMX-225CT FPD HR. As a result, even artifacts in samples composed of composite materials can be substantially reduced. This makes it suitable for the observation of parts such as cable connectors, photo sensors, and lithium ion batteries. In addition, it displays the images during processing. This processing can be stopped and the images output at the level of artifact reduction the user wishes, which minimizes processing time.

www.shimadzu.com

 

Subject Classifications

Industries and Applications | Automobiles and Ground Transportation

Industries and Applications | Electronics

Materials Testing and Evaluation | Failure Analysis

Materials Testing and Evaluation | Material Selection

Materials Testing and Evaluation | Materials Characterization

Materials Testing and Evaluation | Microelectronic Failure Analysis

Nonmetallic Engineering Materials


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