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Oxford’s CMOS-based EBSD detector cuts acquisition time to two hours in Tata Steel lab

November 09, 2018
Source: ASM International

Oxford Instruments, England, announces that Tata Steel, India, recently upgraded its EBSD facility at its Advanced Material Characterization Laboratory by replacing the existing Oxford Instruments Nordlys detector and Aztec HKL EBSD, with the latest CMOS sensor-based Symmetry EBSD detector system. Symmetry is the first CMOS sensor-based EBSD detector released by Oxford Instruments.

Dr. Subrato Mukharjee, Head of the Material Characterization Group at Tata Steel, says that the lab used the Nordlys HKL EBSD system for more than 11 years. During the laboratory upgrade, they learned about the latest CMOS sensor based Symmetry EBSD detector and decided to purchase one.

 

The new Symmetry EBSD detector has increased the throughput of their analyses. In fact, its scientists were able to bring down the acquisition time from the previous 8 to 10 hours, down to 2 to 3 hours, without compromising data quality. The new system also allows them to see improvements in the latest indexing algorithms used in the AZtec system software, also supplied by Oxford Instruments.

The unique property of CMOS that enables parallel data readout, also allows detectors to acquire the EBSD data with higher speed and high resolution, with no compromise of the data.

 

www.oxinst.com

 

Subject Classifications

Materials Testing and Evaluation | Failure Analysis

Materials Testing and Evaluation | Material Selection

Materials Testing and Evaluation | Materials Characterization

Materials Testing and Evaluation | Microelectronic Failure Analysis


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