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Hitachi High-Tech micro-spot XRF analyzer now offered by Eastern Applied Research

March 22, 2019
Source: ASM International

Eastern Applied Research, Buffalo, N.Y., recently named as an Authorized Distributor of Hitachi High-Tech Science Corp., now offers an XRF analyzer developed for ultrathin film measurements and micro-spot analysis needs: the Hitachi FT-150 series. Among other applications, this analyzer is relied upon in printed circuit board quality control and process control in semiconductor wafer fabrication.


Advancements in electronics devices have resulted in the miniaturization of semiconductors, passive components, and electronic components. Highly accurate and efficient measurement of plating thickness and composition at micro-spots of less than 100 micrometers in diameter is required in order to maintain consistent performance and quality, as well as to reduce costs of these components.


The Hitachi FT-150 provides industry leading performance by combining high quality components and optimized geometry. A primary component of the Hitachi FT-150 is its newly developed poly-capillary optics, which work like a convex lens to focus x-rays onto a micro-spot through several thousand glass capillary tubes. The Vortex silicon drift detector offers improved detector technology over previous configurations, and results in greater resolution capabilities with increased measurement speeds.


Additional advances that separate the Hitachi FT-150 from other ED-XRF systems include its redesigned software package, which improves operator efficiencies through an app-based interface and automatic data recording functions.


In addition to sales/support of the Hitachi High-Tech line of ED-XRF analyzers, Eastern Applied provides support services for most XRF models including certified reference materials (CRM's) from an Accredited in-house XRF standards laboratory.


Subject Classifications

Industries and Applications | Electronics

Materials Properties and Performance | Electrical Properties

Materials Testing and Evaluation | Failure Analysis

Materials Testing and Evaluation | Materials Characterization

Materials Testing and Evaluation | Microelectronic Failure Analysis

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