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DualBeam FIB-SEM microscope for semiconductors includes new feedback systems

March 22, 2019

Thermo Fisher Scientific, Waltham, Mass., introduces its latest and most advanced focused ion beam scanning electron microscope (FIB-SEM) for nanometer-scale materials characterization and analysis: the Thermo Scientific Helios 5 DualBeam microscope.

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Applied Materials receives Intel’s Preferred Quality Supplier Award

March 22, 2019

Applied Materials Inc., Santa Clara, Calif., has been recognized by Intel as a recipient of a 2018 Preferred Quality Supplier (PQS) award.

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Bruker wins IF Design awards for three different spectrometer products

March 22, 2019

Bruker, Munich, has been awarded the IF (International Forum) Design Award for three different products: the FT-IR spectrometers Invenio and Alpha II, as well as the FT-NIR spectrometer MPA II in the categories “Industry” and “Medicine/Health” of the discipline “Product Design.”

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Leica DM3 XL microscope features macro objective with 30% larger field, LED lighting

March 21, 2019

Leica Microsystems, Buffalo Grove, Ill., introduces the Leica DM3 XL microscope system that includes a macro objective enabling a 30% increase in field of view and a wide choice of different stage inserts: metal inserts, wafer holders, and mask holders.

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Keyence 3D Scanner CMM VL Series captures surface data and color information

March 21, 2019

Keyence, Itasca, Ill., has launched its new VL Series of 3D Scanner CMM, which provides a structured light scanner with full 360 degree measurement and claims fully traceable measurements of ±10 μm accuracy with 2 µm repeatability.

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DualBeam FIB-SEM microscope for semiconductors includes new feedback systems

March 21, 2019

Thermo Fisher Scientific, Waltham, Mass., introduces its latest and most advanced focused ion beam scanning electron microscope (FIB-SEM) for nanometer scale materials characterization and analysis: the Thermo Scientific Helios 5 DualBeam microscope.

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Rigaku EDXRF instrument analyzes elements from Na through U in almost any matrix

March 21, 2019

Rigaku, Japan, announces the newest addition to the NEX DE series, the Rigaku NEX DE VS direct excitation variable-spot EDXRF elemental analyzer, which is uniquely suited for small spot analysis applications.

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Witec analysis tool enables Raman microscopes to identify and classify particles

March 21, 2019

Witec GmbH, Germany, pioneer of Raman imaging and correlative microscopy, introduces ParticleScout, a particle analysis tool that enables researchers to find, classify, quantify, and identify particles quickly and easily with the Alpha300 Raman microscope series.

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Bruker wins IF Design awards for three different products

March 21, 2019

Bruker, Munich, has been awarded the IF (International Forum) Design Award for three different products: the FT-IR spectrometers Invenio and Alpha II, as well as the FT-NIR spectrometer MPA II in the categories “Industry” and “Medicine/Health” of the discipline “Product Design.”

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Wisconsin Oven builds 35-foot, two-zone gas-fired oven for curing composites

March 20, 2019

Wisconsin Oven Corp., East Troy, announces the shipment of a two-zone indirect gas-fired heavy duty walk-in oven to a global manufacturer in the composites industry.

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