Industry News Header
Keep up-to-date on the latest advances in the metals and materials industry with ASM Industry News.
INDUSTRY NEWS SEARCH
Web Content Listing
August 21, 2017Hitachi High-Technologies Corp., Tokyo, announces the development of an all-new high-performance Ethos FIB-SEM based on a newly developed magnetic/electrostatic compound lens that enables it to deliver advanced imaging performance resolving sub-nanometer features in high contrast for low-voltage SEM applications.
August 21, 2017Jeol USA, Peabody, Mass., introduces the newest addition to the Jeol InTouchScope series SEMs, the JSM-IT500HR, which features a high-brightness, long-life emitter with stable probe current.
August 21, 2017Coventor Inc., Cary, N.C., announces the availability of SEMulator3D 6.1, the latest version of its semiconductor virtual fabrication platform.
August 21, 2017Micron Technology Inc., Boise, Idaho, has opened a new facility that will nearly double the cleanroom space dedicated to research and development, and will support a significant expansion of the company's overall R&D capabilities.
August 18, 2017For nitrocarburizing or consecutive carburizing and nitriding, the typical stress profile is smoother than for nitriding only.
August 16, 2017Can-Eng Furnaces Int.l, Niagara Falls, Ontario, has received an order for a mesh belt furnace system for heat treating automotive thrust races, retainer/cages, and washers.
August 16, 2017Ipsen USA, Cherry Valley, Ill., reports that it shipped 15 atmosphere and vacuum furnaces last quarter, all in support of the aerospace, commercial heat treating, and MIM industries around the world.
August 16, 2017Seco Warwick, Meadville, Pa., announces that one of its controlled atmosphere aluminum brazing (CAB) systems has been installed by Mainstream Engineering for brazing a wide assortment of very large cold plates and heat exchangers made of a variety of aluminum alloys.
August 12, 2017Bruker Nano Analytics, Oak Park, Ill., introduces XMethod, the world's first software package for the analysis of composition and thickness of single or multiple layers, based on data obtained by sample excitation with the XTrace micro-focus X-ray source for scanning electron microscopes.
August 11, 2017Flir Systems, Wilsonville, Ore., introduces the ETS320, a thermal imaging and temperature measurement instrument for electronic components and printed circuit boards.