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Witec analysis tool enables Raman microscopes to identify and classify particles
March 21, 2019
Source: ASM International
Witec GmbH, Germany, pioneer of Raman imaging and correlative microscopy, introduces ParticleScout, a particle analysis tool that enables researchers to find, classify, quantify, and identify particles quickly and easily with the Alpha300 Raman microscope series.
ParticleScout delivers a greatly accelerated workflow to the researcher investigating particulate samples, while making full use of confocal Raman imaging’s abilities in fast, label-free, and nondestructive chemical characterization. It begins by surveying samples with bright and dark field illumination to view the particles they contain. Image Stitching combines many measured areas for a detailed overview of large areas, and Focus Stacking allows larger particles to be sharply rendered for accurate outline recognition.
The optical images lead to the creation of a mask that is used to physically categorize particles of interest and arrange them in a ranked list. A Raman spectrum is then automatically acquired from each particle.
The Raman spectra are evaluated and the corresponding particles can be identified manually or by using the seamlessly-integrated WITec TrueMatch Raman database software. This integration of a particle analysis tool with a Raman database is unique in the industry. It offers a streamlined experimental environment to boost productivity. Finally, ParticleScout generates a comprehensive report that features user-selectable combinations of filters and advanced algorithms to show the quantities of selected particles and their prevalence relative to other groups. These reports make ParticleScout the perfect tool for finding correlations between the physical and chemical attributes of particles.
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