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Rigaku EDXRF instrument analyzes elements from Na through U in almost any matrix

March 22, 2019
Source: ASM International

Rigaku, Japan, announces the newest addition to the NEX DE series, the Rigaku NEX DE VS direct excitation variable-spot EDXRF elemental analyzer, which is uniquely suited for small spot analysis applications. It features a high-resolution camera combined with automated collimators, allowing for precise positioning of a sample for the analysis of 1 mm, 3 mm, and 10 mm spot sizes.

 

As a premium high performance benchtop Energy Dispersive X-ray Fluorescence (EDXRF) elemental analyzer, the new Rigaku NEX DE delivers wide elemental coverage with a easy-to-learn Windows-based QuantEZ software. Non-destructively analyze from sodium (Na) through uranium (U) in almost any matrix, from solids and alloys to powders, liquids and slurries.
 

The 60kV X-ray tube and Peltier cooled FAST SDD Silicon Drift Detector deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability (60 kV), along with high emission current and multiple automated X-ray tube filters, provides a wide range of XRF applications versatility and low limits-of-detection (LOD).

 

Options include fundamental parameters, a variety of automatic sample changers, sample spinner, and helium purge or vacuum atmosphere for enhanced light element sensitivity.

 

https://www.rigaku.com/en/products/xrf/nexde

 

Subject Classifications

Industries and Applications | Electronics

Materials Testing and Evaluation


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