Craic Technologies, San Dimas, Calif., introduces the Flex UV-visible-NIR microspectrophotometer, which is designed to be flexible in configuration, capabilities, and pricing.
Semi, San Jose, Calif., reports that North America-based manufacturers of semiconductor equipment posted $1.31 billion in orders worldwide in January 2015.
Edax Inc., Mahwah, N.J., has launched the Atom Probe Assist, a new tool designed to help users of atom probe tomography systems prepare specimens for faster and more efficient analysis than previously possible.
A research team at Northwestern University’s McCormick School of Engineering, Evanston, Ill., has investigated the behavior of silver nanowires under cyclic loading to advance the understanding of how they might function in flexible electronics.
Oxford Instruments, England, announces that it has signed an agreement with one of the largest semiconductor companies in Europe to supply multiple failure analysis systems.