Shimadzu North America, Columbia, Md., announces that its EDX-7000/8000 energy-dispersive X-ray fluorescence spectrometers won the 2014 IBO Gold Award for Analytical Instrument Industrial Design.
Jeol USA, Peabody, Mass., introduces the JSX-1000S ElementEye, an easy-to-use, smart solution for high-sensitivity elemental analysis in a new benchtop EDXRF spectrometer.
Craic Technologies, San Dimas, Calif., introduces Craic FilmPro film thickness measurement software.
Nanotronics Imaging, Cuyahoga Falls, Ohio, introduces its latest computer-controlled microscope, the nSPEC 3D, which combines high quality and imaging purity of optical lenses with advanced computer pattern-recognition algorithms and custom 3D printed hardware.
DCG Systems Inc., Fremont, Calif., announces the first installation of the Meridian WS-DP (WaferScan Direct Probe) at Nvidia, a leading manufacturer of graphics processors for advanced visual computing.
