NIST’s Ravi Attota shows how Through-Focus Scanning Optical Microscopy (TSOM) able to detect tiny differences in the 3D shapes of computer chip components, revealing variations less than 1 nm.
Smallest possible diamonds form ultra-thin nanothreads
Plant-based building materials may boost energy savings
Insulation for homes of the future may be harvested from fields of kenaf, an alternative to fiberglass
Wearing a robot on your sleeve
3D printing wear materials
High-hardness ferrous metal matrix products now achievable through a one-step 3D-printing process



