Induction preheating system with process feedback enables shorter heating times, faster production

Ambrell, an AmeriTherm Company, Scottsville, N.Y., has sold an Ekoheat 35 kW/30 kHz induction heating system to a fastener manufacturer to preheat blanks prior to forging. The solution includes a custom-built coil, along with an optical pyrometer and controller for quality control. The client determined that a new modern system with process feedback from Ambrell’s Application Lab would allow shorter heating times and faster production rate.

Jean Duval Educational Fund with ASM Foundation

The Duval family established an educational fund with the ASM Materials Education Foundation in honor of Mr. Jean Duval’s accomplishments during his long, productive, and innovative career as chairman and CEO of Aubert & Duval (Paris, France). The Jean Duval Educational Fund is designated for educational activities to encourage young people to enroll in materials science or other STEM professions for their lifelong career.

Fluid-enhanced crystal engineering increases thin-film conductivity by a factor of ten

A team from the U.S. Department of Energy’s National Accelerator Laboratory and Stanford University, Calif., have developed a printing process they call FLUENCE-fluid-enhanced crystal engineering-that for some materials results in thin films capable of conducting electricity ten times more efficiently than those made by conventional methods. The printing method is fast and works with a variety of organic materials.

Strong thermal management composite made of graphite ligaments in titanium powder

Engineers at Oak Ridge National Laboratory, Oak Ridge, Tenn., have succeeded in consolidating ground graphite foam ligaments in titanium powder to make disks up to 7 inches in diameter with bulk thermal conductivity of 240 W/m-K, as well as high strength. The ground ligaments are about 500 microns thick and range in length from 100 to 200 microns.

Automated AFM system enables automatic defect and surface roughness review for semiconductors

Park Systems, Santa Clara, Calif., introduces Park NX-HDM, a fully automated atomic force microscopy (AFM) automatic defect review and sub-angstrom surface roughness measurement system for device substrates and disk media. The system increases throughput by up to 1000%, and offers a 30% higher success rate than prior systems. It analyzes, identifies, and scans media for all wafer sizes up to 150 mm.