Edax Inc., Mahwah, N.J., introduces a new series of Octane Elite silicon drift detectors, which offer up to 35% better light-element sensitivity and outstanding low-energy performance due to silicon nitride entry windows.
Jeol USA, Peabody, Mass., introduces the JSM-6000Plus, the third generation of the popular NeoScope benchtop SEM, which delivers fast, high magnification electron microscopy with more functionality than typical benchtop SEMs.
Hitachi High Technologies America Inc., Clarksburg, Md., announces that Hitachi, the University of Colorado at Boulder, and the TEM camera manufacturer Advanced Microscopy Techniques (AMT) of Woburn, Mass., have collaborated to develop a convenient software package for state-of-the-art, single or dual-axis tomography acquisition and extended image montaging for the Hitachi HT7700 TEM.
Rudolph Technologies Inc., Flanders, N.J., has purchased Stella Alliance LLC for its patented illumination, auto-focus, and image acquisition technology, which significantly enhances the ability to identify certain critical defects not visible with current techniques.
H.C. Starck, Newton, Mass., demonstrates its fabrication skills at Heat Treat 2015 with a unique product portfolio, including MoLa (molybdenum-lanthanum), TZM (titanium-zirconium-molybdenum), MHC (molybdenum hafnium carbide), and MoW (molybdenum-tungsten).
