Materials scientists at the University of Minnesota Twin Cities have found a way to create and control tiny internal “flaws” inside ultra-thin materials known as extended defects, that could give next-generation nanomaterials entirely new properties, opening the door to advances in nanotechnology.
Hitachi High-Tech announces the SU9600: Next-generation ultrahigh-resolution SEM with high throughput
GlobalFoundries and Navitas Semiconductor partner to accelerate U.S. GaN technology and manufacturing for AI datacenters and critical power applications
Photothermal Spectroscopy Corp. launches stRAMos — a breakthrough SRS, Stimulated Raman microscope based on photothermal detection
Photothermal Spectroscopy Corp., Santa Barbara, Calif., released stRAMos, a next-generation Raman microscope based on photothermal detection of Stimulated Raman scattering that delivers unmatched speed, sensitivity, spatial resolution, and multimodal imaging capabilities for life science and materials research.
Through the wires: FAMU-FSU College of Engineering technology mitigates flaws in superconducting wires
Researchers at the FAMU-FSU College of Engineering and Florida State University’s Center for Advanced Power Systems and the National High Magnetic Field Laboratory developed a cable design that uses multiple strands of superconducting tape, minimizing the chance of failure from defective spots within a wire.






