Tescan Orsay Holding a.s., Czech Republic, announces the installation of the Amber X focused ion beam-scanning electron microscope at the Institute for Factory Automation and Production Systems in Germany.
New metrological technique uses stress for nanotomography
Researchers from the Skolkovo Institute of Science and Technology (Skoltech) and their colleagues in Russia and Spain demonstrated proof-of-concept of a new radiation-safe method for mapping the internal structure and stress distribution in samples of materials at the nanoscale, with a resolution about 100 times higher than that of the x-ray and neutron tomography techniques currently available.
White iron rust material provides safe UV protection
A research team consisting of National Institute for Materials Science (NIMS), Hokkaido University, and Hiroshima University has developed an iron oxide-based ultraviolet (UV)-absorbing powder material by stabilizing normally unstable, colorless, UV-absorbing di-nuclear iron species in porous silica.
NSF award will help UAB researchers develop and understand high-temperature-resistant materials
Shane Aaron Catledge, Ph.D., associate professor in the University of Alabama at Birmingham Department of Physics, was awarded a three-year Division of Materials grant from the National Science Foundation for his project “New frontiers in synthesis of high-entropy transition metal borides enabled by microwave-induced plasma.”






