Quantum sensors, which detect the most minute variations in magnetic or electrical fields, have enabled precision measurements in materials science and fundamental physics. But these sensors have only been capable of detecting a few specific frequencies of these fields, limiting their usefulness. Now, researchers at MIT have developed a method to enable such sensors to detect any arbitrary frequency, with no loss of their ability to measure nanometer-scale features.
A Bergen County, N.J. man was arrested and charged with taking part in a multimillion-dollar conspiracy to sell counterfeit computer networking devices on Amazon and other online retail websites.
Bruker Corp., Germany, introduced the new XFlash 7 detector series for its QUANTAX energy dispersive x-ray spectrometer systems, enabling chemical analysis of material samples in electron microscopes with ultimate speed, sensitivity, and reliability.
Onsemi, Phoenix, announced the world’s first TO-leadless packaged silicon carbide MOSFET at PCIM Europe.
Hitachi High-Tech Analytical Science, England, a global company within Hitachi High-Tech Group, Japan, has expanded its plating and coatings analysis range with the launch of the breakaway FT230.
