Researchers at the National Institute of Standards and Technology, Gaithersburg, Md, have revived and improved a once-reliable technique to identify and count defects in transistors, the building blocks of modern electronic devices such as smartphones and computers.
Operations at two Japanese factories producing flash memory chips have been disrupted by the contamination of industrial materials, chipmaker Kioxia said, as analysts warned of potential price hikes for the key smartphone components.
Bruker BioSpin, Switzerland, introduced Connexus in Europe – a cloud-based collaboration platform that connects nuclear magnetic resonance scientists in need of analytical services and data evaluation expertise with NMR laboratories with available capabilities.
Researchers at the Catalan Institute of Nanoscience and Nanotechnology, Spain, and the Ecole Polytechnique Fédérale of Switzerland, fabricated high-quality zinc phosphide crystals free of interface defects with a nanoscale approach.
EDAX LLC, Mahwah, N.J., a leader in x-ray microanalysis and electron diffraction instrumentation, has added the Clarity Super to its electron backscatter diffraction product line.
