Cascade Microtech Inc., Beaverton, Ore., has developed the CM300 Probe System, which automates on-wafer device measurements and enhances device and process characterization and modeling by capturing the true electrical performance of devices, thus enabling hands-off productivity.
Bruker’s Vertex FTIR spectrometer covers complete mid and far infrared/THz ranges in one step
Coater/Developer system designed for fan-out wafer-level packaging
Aerospace research partnership formed
The Ronald E. McNair Center for Aerospace Innovation and Research, at the University of South Carolina, Columbia, partnered with Fokker Aerostructures, Holland, to support and inspire their development of next-generation aircraft technology.





