Cadence Design Systems Inc., San Jose, Calif., and Applied Materials Inc., Santa Clara, Calif., are collaborating on a development program to optimize the chemical-mechanical planarization (CMP) process through silicon characterization and modeling for advanced-node designs at 14 nm and below.
Oxford Instruments, U.K., has launched NordlysMax3, an EBSD detector that acquires indexes and displays results at 1580 points per second.
National Instruments, Austin, Texas, introduces its Semiconductor Test Systems (STS), which feature PXI modular instrumentation and open system design software for semiconductor test environments.
In 1962, an underground fire started in the coal-mining town of Centralia, Pa. Fifty-three years later, that fire still burns.
New material could make it possible to pack more transistors on a chip, research suggests.
