SEMI, San Jose, Calif., has updated its SEMI World Fab Forecast outlooks for 2015 and 2016.
SEMI forecasts strong fab equipment spending in 2015
Jeol’s fourth-gen AccuTOF-GCx offers higher resolution, accuracy, and sensitivity
Jeol USA, Peabody, Mass., introduces the AccuTOF-GCx, the fourth generation of Jeol’s successful gas chromatography/time-of-flight mass spectrometer systems.
Craic adds circular polarization spectroscopy capabilities to its microspectrophotometers
Craic Technologies, San Dimas, Calif., has added circular polarization spectroscopy capabilities to its microspectrophotometers.
ASM International Convenes Discussion to Advance the Goals of the Materials Genome Initiative
Professional Societies Come Together to Identify Opportunities for Building the Materials Data Infrastructure
Bruker M2 Blizzard XRF is designed for NDT of printed circuit boards
Bruker AXS Inc., Madison, Wis., introduces the M2 Blizzard, a small-spot X-ray fluorescence spectrometer specifically designed for the nondestructive analysis of printed circuit boards.