Sony Semiconductor Solutions, Japan, and imec, Belgium, have unveiled a high-density “local BDI” module for 3D chip stacking that allows through-silicon vias to connect through up to 500nm of bulk silicon, unlocking advanced logic and DRAM applications without needing to completely remove the silicon.
Defect detection automated in diamond and other advanced semiconductors
Tescan joins Shimadzu group to accelerate innovation and deliver greater value to customers
Northeast Ohio lands massive $160M federal award to transform the region’s manufacturing future
Northeast Ohio has been selected as one of 12 National Science Foundation Regional Innovation Engines, making the region eligible for up to $160 million in funding over the next decade to advance manufacturing through materials research, artificial intelligence and workforce development. Led by Case Western Reserve University, the NEO-SMART coalition includes more than 70 partners […]
New insights could help improve quality of 3D-printed aluminium components
Researchers at The University of Manchester found that small temperature variations during molten metal deposition, a metal 3D-printing process, can have a significant impact on the quality of aluminum components. The study showed that carefully controlling thermal conditions during printing can reduce microscopic defects and improve the material’s grain structure, helping produce stronger, higher-quality parts […]






