Bruker, Billerica, Mass., introduces the SkyScan 1275, a high-speed X-ray microtomography benchtop system specially designed for fast scanning using new advances in the technology of X-ray sources and efficient flat-panel detectors.
Materion acquires Heraeus target materials for its semiconductor and other markets
JEOL module enables mass spectrometer materials analysis by ambient ionization
Hitachi launches transmission electron microscope with improved electro-optics.
Cadence to collaborate with TSMC for design innovation with its 12FFC process
Cadence Design Systems Inc., San Jose, Calif., announces its collaboration with the Taiwan Semiconductor Manufacturing Co. (TSMC) to further advanced-node design innovation with TSMC’s new 12nm FinFET Compact (12FFC) process technology.





