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Home Search results for: -/journal_content/56/10192/06508G/PUBLICATION

Bruker SkyScan benchtop system features high-speed X-ray microtomography

Bruker, Billerica, Mass., introduces the SkyScan 1275, a high-speed X-ray microtomography benchtop system specially designed for fast scanning using new advances in the technology of X-ray sources and efficient flat-panel detectors.

Materion acquires Heraeus target materials for its semiconductor and other markets

Materion Corp., Mayfield Heights, Ohio, announces that it has acquired the target materials business of the Heraeus Group to strengthen its position in precious and non-precious target materials for the semiconductor, architectural and automotive glass, photovoltaic, and display markets.

JEOL module enables mass spectrometer materials analysis by ambient ionization

JEOL, Peabody, Mass., announces that a new FilterSpray module developed for the AccuTOF-DART mass spectrometer makes it possible to spot a sample on a disposable paper triangle for analysis by ambient ionization.

Hitachi launches transmission electron microscope with improved electro-optics.

Hitachi High-Technologies Corp., Tokyo, introduces the HT7800 Series Transmission Electron Microscope, which features digital operation under normal room light conditions (like the HT7700 model) and also incorporates improved electro-optics with many new functions.

Cadence to collaborate with TSMC for design innovation with its 12FFC process

Cadence Design Systems Inc., San Jose, Calif., announces its collaboration with the Taiwan Semiconductor Manufacturing Co. (TSMC) to further advanced-node design innovation with TSMC’s new 12nm FinFET Compact (12FFC) process technology.

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