Bruker, Billerica, Mass., introduces the SkyScan 1275, a high-speed X-ray microtomography benchtop system specially designed for fast scanning using new advances in the technology of X-ray sources and efficient flat-panel detectors.
Materion acquires Heraeus target materials for its semiconductor and other markets
January 2017 semiconductor sales up 14 percent over January 2016
Swiss researchers develop X-ray tomography for 3-D imaging of 34-nm transistor on a chip
Researchers of the Paul Scherrer Institute in Switzerland have reportedly made detailed 3-D images of a commercially available computer chip, marking the first time a nondestructive method has visualized the paths of a chip’s internal 45-nm-wide wiring and its 34-nm-high transistors clearly without distortions or deformations.






