The IMS Education Committee, chaired by Laura Moyer, recently sent out a survey to members to assess education/training needs.
IMS Education Survey Results
Microscope sets new standards for high performance imaging and analysis
FEI Co., Hillsboro, Ore., released the new Themis Z scanning/transmission electron microscope (S/TEM), an automated STEM that offers the industry leading specifications for image resolution, analytical speed and quality, and light element imaging sensitivity.
Women in Engineering Profile: Amber Black
This new profile series introduces leading materials scientists from around the world who happen to be females. Here we speak with Amber N. Black, an applications engineer for PTR – Precision Technologies Inc.
Electronic Device Failure Analysis, Volume 18, Issue 3, August 2016 (ASM International)
August 2016 Issue of Electronic Device Failure Analysis, a quarterly publication providing a technical condensation of information of interest to electronic device failure analysis technicians, engineers, and managers.
Boeing 737MAX Acrobatics
Boeing 737MAX Acrobatics