Media Kit PDF Downloads

Media Kit Downloads Complete ASM Media Kit (pdf) Mechanical Specifications (pdf) AM&P Editorial Calendar/Rate Card (pdf) AM&P Digitial Edition (pdf) AM&P eNews (pdf) EDFA Editorial Calendar/Rate Card (pdf) EDFA eNews (pdf) EDFAS Online Community (pdf) Heat Treater’s Guide Companion App (pdf) HTS HTPro – NOW IN PRINT! (pdf) HTS HTPro eNews (pdf) HTS Online Community […]

Advertise With Us Confirmation

Advertise With Us New Design, New Packages, New Business! Contact Your ASM Representatives Today! Erik Klingerman [email protected] National Account Manager 440.338.5151 ext. 5574   NEW! Redesigned AM&P Magazine Enhances Ad Visibility and Enriches Reader Experience In 2015, we launched the redesign of our print and digital editions of Advanced Materials and Processes with you and […]

New microscope captures movements of atoms and molecules

A new microscope invented at Michigan State University, Lansing, Mich., allows scientists to zoom in on the movements of atoms and molecules. Electron microscopes allow scientists to see the structure of microorganisms, cells, metals, crystals and other tiny structures that weren’t visible with light microscopes.

Next-generation atomic force microscope

Agilent Technologies Inc., Santa Clara, Ca., announced the availability of its 7500 atomic force microscope (AFM), a highly advanced instrument that establishes new performance, functionality and ease-of-use benchmarks for nanoscale measurement, characterization and manipulation.

Gatan and JEOL joint venture improves 3D imaging

JEOL Ltd., Peabody, Mass., announces a joint initiative between JEOL and Gatan that brings the power of Serial Block Face Imaging to the JEOL family of scanning electron microscopes. Researchers will be able to image 3D structures of materials samples at ultrahigh resolution using the JEOL JSM-7100F Field Emission Scanning Electron Microscope with an integrated Gatan 3View Serial Block Face Imaging System.