Asylum Research, Santa Barbara, Calif., an Oxford Instruments company, has developed Scanning Microwave Impedance Microscopy (sMIM).
Scanning Microwave Impedance Microscopy for nanoscale mapping of permittivity and conductivity
Cadence Incisive 13.2 verification platform enables faster performance
Cadence Design Systems Inc., San Jose, Calif., introduces a faster version of the Incisive functional verification platform.
Imec celebrates 30 years of nanoelectronics industry innovation
Imec, Belgium, celebrates its 30th anniversary. Founded in 1984 as a non-profit organization, it has enabled notable advancements in global semiconductor chip manufacturing in the three decades since its founding.
Scanning Microwave Impedance Microscopy for nanoscale mapping of permittivity and conductivity
Asylum Research, Santa Barbara, Calif., an Oxford Instruments company, has developed Scanning Microwave Impedance Microscopy (sMIM), an atomic force microscopy technique that enables nanoscale mapping of permittivity and conductivity.
Instrument measures silicon wafer thickness and TSV depths prior to grinding
Lasertec U.S.A., San Jose, Calif., introduces the WASAVI Series BGM300. This instrument measures silicon wafer thicknesses and TSV depths prior to back grinding 3D semiconductor devices.